US5474947A
Expired / Lapsed
US
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Nonvolatile memory process
Assignee: Motorola Solutions Inc
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Filing: 1993-12-27
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Granted: 1995-12-12
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Expires: 2013-12-27
Abstract
Abstract A process for fabricating an improved nonvolatile memory device includes the formation of a control gate electrode (70) which overlies a floating gate electrode (42) and is separated therefrom by an inter-level-dielectric layer (62). The control gate electrode (70) and the underlying floating gate electrode (42) form a stacked gate structure (72) located in the active region (44) of a semiconductor substrate (40). An electrically insulating sidewall spacer (54) is formed at the edges of the floating gate electrode (42) and electrically isolates the control gate (70) from the semiconductor substrate (40). During the fabrication process, implanted memory regions (56, 58) are formed in the active region (44) prior to the formation of control gate electrode (70). A word-line (68) and the control gate (70) are formed by anisotropic etching of a semiconductor layer (66), which is deposited to overlie inter-level-dielectric layer (62). During the etching process, inter-level-dielectric layer (62) prevents the removal of surface portions of semiconductor substrate (40).
Inventors
- 👤 Ko-Min Chang
- 👤 Bruce L. Morton
- 👤 Henry Y. Choe
- 👤 Clinton C. K. Kuo
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 07:56
CPC Classifications
H; H10; H10B; H10B41/00
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
174 words
A process for fabricating a nonvolatile memory device comprising the steps of: providing a substrate having a first gate electrode thereon; forming source and drain region in the substrate on either side of the first gate electrode; forming an electrically insulating sidewall spacer at the edges of the first gate electrode: forming an insulating layer overlying the gate electrode; implanting dopant atoms through the first gate electrode and into the substrate to form a doped channel region in the substrate directly beneath the first gate electrode, and to form zener diode regions in the substrate beneath the source and drain regions; depositing a layer of semiconductor material to overlie the sidewall spacer and the insulating layer; and etching the semiconductor layer to form a second gate electrode overlying the first gate electrode and separated therefrom by the insulating layer and by the sidewall spacer, wherein the second gate electrode is separated from the substrate by the sidewall spacer, and wherein the second gate electrode electrically controls the voltage potential of the first gate electrode.
Claim 2
Dependent Claim
174 words
A process for fabricating a nonvolatile memory device comprising the steps of: providing a substrate having a first gate electrode thereon; forming source and drain region in the substrate on either side of the first gate electrode; forming an electrically insulating sidewall spacer at the edges of the first gate electrode: forming an insulating layer overlying the gate electrode; implanting dopant atoms through the first gate electrode and into the substrate to form a doped channel region in the substrate directly beneath the first gate electrode, and to form zener diode regions in the substrate beneath the source and drain regions; depositing a layer of semiconductor material to overlie the sidewall spacer and the insulating layer; and etching the semiconductor layer to form a second gate electrode overlying the first gate electrode and separated therefrom by the insulating layer and by the sidewall spacer, wherein the second gate electrode is separated from the substrate by the sidewall spacer, and wherein the second gate electrode electrically controls the voltage potential of the first gate electrode.
Claim 3
Dependent Claim
38 words
The process of claim 1, wherein the insulating layer comprises a first silicon dioxide layer, a layer of silicon nitride overlying the first silicon dioxide layer, and a second layer of silicon dioxide overlying the silicon nitride layer.
Claim 4
Dependent Claim
20 words
The process of claim 1, wherein the insulating layer comprises a layer of silicon dioxide deposited by chemical vapor deposition.
Claim 5
Dependent Claim
138 words
A process for fabricating a nonvolatile memory device comprising the steps of: providing a substrate having a first gate electrode thereon; forming an insulating layer overlying the gate electrode; forming an electrically insulating sidewall spacer at the edges of the insulating layer and the first gate electrode; removing the insulating layer; forming a dielectric layer to overlie the first gate electrode and the sidewall spacer; depositing a layer of semiconductor material to overlie the sidewall spacer and the dielectric layer; and etching the semiconductor layer to form a second gate electrode overlying the first gate electrode and separated therefrom by the dielectric layer and by the sidewall spacer, wherein the second gate electrode is separated from the substrate by the sidewall spacer, and wherein the second gate electrode electrically controls the voltage potential of the first gate electrode.
Claim 6
Dependent Claim
138 words
A process for fabricating a nonvolatile memory device comprising the steps of: providing a substrate having a first gate electrode thereon; forming an insulating layer overlying the gate electrode; forming an electrically insulating sidewall spacer at the edges of the insulating layer and the first gate electrode; removing the insulating layer; forming a dielectric layer to overlie the first gate electrode and the sidewall spacer; depositing a layer of semiconductor material to overlie the sidewall spacer and the dielectric layer; and etching the semiconductor layer to form a second gate electrode overlying the first gate electrode and separated therefrom by the dielectric layer and by the sidewall spacer, wherein the second gate electrode is separated from the substrate by the sidewall spacer, and wherein the second gate electrode electrically controls the voltage potential of the first gate electrode.
Claim 7
Dependent Claim
44 words
The process of claim 4, wherein the step of forming a dielectric layer comprises sequentially forming a first silicon dioxide layer, a layer of silicon nitride overlying the first silicon dioxide layer, and a second layer of silicon dioxide overlying the silicon nitride layer.
Claim 8
Dependent Claim
69 words
The process of claim 4, further comprising the steps of: forming source and drain region in the substrate on either side of the first gate electrode; and implanting dopant atoms through the first gate electrode and into the substrate to form a doped channel region in the substrate directly beneath the first gate electrode, and to form zener diode regions in the substrate beneath the source and drain regions.
Claim 9
Dependent Claim
71 words
The process of claim 4, wherein the step of removing the insulating layer leaves a recessed region bounded by the sidewall spacer, and wherein the step of depositing a semiconductor layer fills the recessed region, and wherein the step of etching the semiconductor layer comprises anisotropic etching to remove semiconductor material from the substrate while leaving a portion of the semiconductor layer in the recess to form the second gate electrode.
Claim 10
Dependent Claim
25 words
The process of claim 7 further comprising the step of forming an etching mask on the semiconductor layer prior to anisotropically etching the semiconductor layer.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-12-11 | 1999-06-12 | 1999-12-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-12-11 | 2003-06-12 | 2003-12-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-12-11 | 2007-06-12 | 2007-12-12 | $7700.00 | Window Closed / Lapsed |