Patent US5386115A successfully refreshed from Google Patents.
US5386115A
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US
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Solid state micro-machined mass spectrograph universal gas detection sensor
Assignee: Northrop Grumman Systems Corp
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Filing: 1993-09-22
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Granted: 1995-01-31
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Expires: 2013-09-22
Abstract
Abstract A solid state mass spectrograph includes an inlet, a gas ionizer, a mass filter and a detector array all formed within a cavity in a semiconductor substrate. The gas ionizer can be a solid state electron emitter with ion optics provided by electrodes formed on apertured partitions in the cavity forming compartments through which the cavity is evacuated by differential pumping. The mass filter is preferably a Wien filter with the magnetic field provided by a permanent magnet outside the substrate or by magnetic film on the cavity walls. The electric field of the Wien filter is provided by electrodes formed on walls of the cavity. The detector array is a linear array oriented in the dispersion plane of the mass filter and includes converging electrodes at the end of the cavity serving as Faraday cages which pass charge to signal generators such as charge coupled devices formed in the substrate but removed from the cavity.
Inventors
- 👤 Carl B. Freidhoff
- 👤 Robert M. Young
- 👤 Saptharishi Sriram
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 21:22
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/26; H01J49/28; H01J49/284; H01J49/286; H01J49/288; H01J49/0013; H01J49/0018
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
125 words
A solid state mass spectrograph for analyzing a sample gas, said mass spectrograph comprising: a semiconductor substrate having a cavity therein with an inlet, a gas ionizing section adjacent said inlet, a mass filter section adjacent said gas ionizing section, and a detector section adjacent said mass filter section; vacuum means evacuating said cavity and drawing said sample gas into said cavity through said inlet; gas ionizing means in said gas ionization section of said cavity ionizing sample gas drawn into said cavity through said inlet to generate ionized sample gas; mass filter means generating an electromagnetic field in said mass filter section of said cavity filtering by mass/charge ratio said ionized sample gas; and detector means detecting said filtering of said ionized sample gas.
Claim 2
Dependent Claim
125 words
A solid state mass spectrograph for analyzing a sample gas, said mass spectrograph comprising: a semiconductor substrate having a cavity therein with an inlet, a gas ionizing section adjacent said inlet, a mass filter section adjacent said gas ionizing section, and a detector section adjacent said mass filter section; vacuum means evacuating said cavity and drawing said sample gas into said cavity through said inlet; gas ionizing means in said gas ionization section of said cavity ionizing sample gas drawn into said cavity through said inlet to generate ionized sample gas; mass filter means generating an electromagnetic field in said mass filter section of said cavity filtering by mass/charge ratio said ionized sample gas; and detector means detecting said filtering of said ionized sample gas.
Claim 3
Dependent Claim
30 words
The mass spectrograph of claim 1 wherein said sample gas has multiple gas constituents, and wherein said detector means comprises means simultaneously detecting a plurality of said multiple gas constituents.
Claim 4
Dependent Claim
16 words
The mass spectrograph of claim 1 wherein said detector means comprises an array of detector elements.
Claim 5
Dependent Claim
16 words
The mass spectrograph of claim 3 wherein said detector elements are arranged in a linear array.
Claim 6
Dependent Claim
20 words
The mass spectrograph of claim 4 wherein said detector means further comprises Faraday cage means connected with each detector element.
Claim 7
Dependent Claim
46 words
The mass spectrograph of claim 5 wherein said Faraday cage means comprise v-shaped conductors formed on said semiconductor substrate in said detector section of said cavity, and wherein said detector elements include signal generators located outside of said cavity and connected to said Faraday cage means.
Claim 8
Dependent Claim
48 words
The mass spectrograph of claim 6 wherein said semiconductor substrate is formed in two parts joined along parting surfaces extending through said cavity, and wherein said detector elements include signal generators located in recess means in said parting surface of one of said parts spaced from said cavity.
Claim 9
Dependent Claim
29 words
The mass spectrograph of claim 3 wherein said mass filter means comprises field generating means generating orthogonal magnetic and electric fields in said mass filter section of said cavity.
Claim 10
Dependent Claim
38 words
The mass spectrograph of claim 8 wherein said field generating means includes opposed electrodes formed on said substrate in said mass filter section of said cavity, and to which a voltage is applied to generate said electric field.
Claim 11
Dependent Claim
26 words
The mass spectrograph of claim 9 wherein said field generating means includes a magnet generating said magnetic field within said mass filter section of said cavity.
Claim 12
Dependent Claim
34 words
The mass spectrograph of claim 9 wherein said field generating means includes magnetic film formed on said substrate on opposed surfaces in said mass filter section of said cavity orthogonal to said opposed electrodes.
Claim 13
Dependent Claim
37 words
The mass spectrograph of claim 3 wherein said mass filter means comprises opposed primary electrodes on said substrate in said mass filter section of said cavity to which a voltage is applied to generate said electric field.
Claim 14
Dependent Claim
50 words
The mass spectrograph of claim 12 wherein said mass filter means further includes pairs of opposed trimming electrodes on said substrate in said mass filter section of said cavity between said opposed primary electrodes to which trimming voltages are applied to make said electric field substantially uniform within said cavity.
Claim 15
Dependent Claim
29 words
The mass spectrograph of claim 3 wherein said gas ionizing means comprises a solid state electron emitter formed in said substrate in said gas ionizing section of said cavity.
Claim 16
Dependent Claim
29 words
The mass spectrograph of claim 1 wherein said gas ionizing means comprises a solid state electron emitter formed in said substrate in said gas ionizing section of said cavity.
Claim 17
Dependent Claim
31 words
The mass spectrograph of claim 15 wherein said gas ionizing means further includes ion optic means comprising apertured partitions formed in said substrate in said gas ionizing section of said cavity.
Claim 18
Dependent Claim
40 words
The mass spectrograph of claim 1 wherein said semiconductor substrate has apertured partitions dividing said cavity into connected chambers extending from said inlet, and wherein said vacuum means is connected to said chambers to provide differential pumping of said cavity.
Claim 19
Dependent Claim
41 words
The mass spectrograph of claim 17 wherein said gas ionizing means comprises a solid state electron emitter formed on said substrate in said gas ionizing section of said cavity and ion optics comprising electrodes formed on selected of said apertured partitions.
Claim 20
Dependent Claim
201 words
A solid state mass spectrograph for analyzing a sample gas with multiple gas constituents, said mass spectrograph comprising: a semiconductor substrate having an elongated cavity therein with an inlet, a gas ionizing section adjacent said inlet, a mass filter section adjacent said gas ionizing section, and a detector section adjacent said mass filter section, said substrate including apertured partitions dividing said cavity into connected chambers; vacuum means differentially evacuating said connected chambers and drawing said sample gas into said cavity through said inlet; gas ionizer means formed in said substrate in said gas ionizing section of said cavity and including a solid state electron emitter to which sample gas is drawn by said vacuum means and which generates ionized sample gas, and ion optic means comprising electrodes formed on selected of said apertured partitions and which collimate and accelerate said ionized sample gas; a Wien filter generating orthogonal electric and magnetic fields in said mass filter section of said cavity which disperse said constituents of ionized sample gas by mass/charge ratio into a dispersion plane; and a linear detector array in said detector section of said cavity arranged in said dispersion plane simultaneously detecting a plurality of said multiple gas constituents.
Claim 21
Dependent Claim
201 words
A solid state mass spectrograph for analyzing a sample gas with multiple gas constituents, said mass spectrograph comprising: a semiconductor substrate having an elongated cavity therein with an inlet, a gas ionizing section adjacent said inlet, a mass filter section adjacent said gas ionizing section, and a detector section adjacent said mass filter section, said substrate including apertured partitions dividing said cavity into connected chambers; vacuum means differentially evacuating said connected chambers and drawing said sample gas into said cavity through said inlet; gas ionizer means formed in said substrate in said gas ionizing section of said cavity and including a solid state electron emitter to which sample gas is drawn by said vacuum means and which generates ionized sample gas, and ion optic means comprising electrodes formed on selected of said apertured partitions and which collimate and accelerate said ionized sample gas; a Wien filter generating orthogonal electric and magnetic fields in said mass filter section of said cavity which disperse said constituents of ionized sample gas by mass/charge ratio into a dispersion plane; and a linear detector array in said detector section of said cavity arranged in said dispersion plane simultaneously detecting a plurality of said multiple gas constituents.
Claim 22
Dependent Claim
50 words
The spectrograph of claim 19 wherein said linear detector array comprises a plurality of detector elements each comprising Faraday cage electrodes formed on said substrate and converging towards said dispersion plane, and detector cells formed in said semiconductor substrate removed from said cavity, and connected to said Faraday cage electrodes.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-01-30 | 1998-08-01 | 1999-01-31 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-01-30 | 2002-08-01 | 2003-01-31 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-01-30 | 2006-08-01 | 2007-01-31 | $7700.00 | Window Closed / Lapsed |