Mass spectrometer with in-line collision surface means

Claim 2

A mass spectrometer including: a mass analyzer for analyzing ions; means for directing a beam of ions to be analyzed toward said mass analyzer along the axis of said analyzer; surface collision means including a deflector and a collision surface positioned along said axis whereby said ions are deflected by said deflector and collide with said collision surface and undergo surface collision processes and generate surface collision products; means for focusing and directing said surface collision products along said axis to said mass analyzer; and means for detecting the output of said mass analyzer.

Claim 3

A mass spectrometer as in claim 1 in which said means for directing the ion beam to said analyzer comprises a second analyzer.

Claim 4

A mass spectrometer as in claim 2 in which said second analyzer is a quadrupole mass analyzer disposed along said axis.

Claim 5

A mass spectrometer as in claim 2 in which said second analyzer is a magnetic sector.

Claim 6

A mass spectrometer as in claim 2 in which said second analyzer comprises an electric sector.

Claim 7

A mass spectrometer as in claim 1 in which the collision means comprises input apertures, an ion collision surface and output apertures disposed on said axis.

Claim 8

A mass spectrometer as in claim 1 in which the collision surface is cylindrical.

Claim 9

A mass spectrometer as in claim 1 in which the means for directing ions to said collision means comprises an ion source.

Claim 10

A mass spectrometer including: a mass analyzer for analyzing ions; means for directing a beam of ions to be analyzed toward said mass analyzer along the axis of said analyzer; surface collision means including a conical collision surface positioned along said axis to intercept said ions, input apertures and output apertures disposed on said axis, whereby said ions collide with said surface collision means and undergo surface collision processes and generate surface collision products; means for focusing and directing said surface collision products along said axis to said mass analyzer; and means for detecting the output of said mass analyzer.

Claim 11

A mass spectrometer including: a mass analyzer for analyzing ions; means for directing a beam of ions to be analyzed toward said mass analyzer along the axis of said analyzer; surface collision means including a conical collision surface positioned along said axis to intercept said ions, input apertures and output apertures disposed on said axis, whereby said ions collide with said surface collision means and undergo surface collision processes and generate surface collision products; means for focusing and directing said surface collision products along said axis to said mass analyzer; and means for detecting the output of said mass analyzer.

Claim 12

A mass spectrometer including: a mass analyzer for analyzing ions; means for directing a beam of ions to be analyzed toward said mass analyzer along the axis of said analyzer; surface collision means including a planar collision surface positioned perpendicular to said beam and along said axis to intercept said ions, input apertures and output apertures disposed on said axis, whereby said ions collide with said surface collision means and undergo surface collision processes and generate surface collision products; means for focusing and directing said surface collision products along said axis to said mass analyzer; and means for detecting the output of said mass analyzer.

Claim 13

A mass spectrometer including: a mass analyzer for analyzing ions; means for directing a beam of ions to be analyzed toward said mass analyzer along the axis of said analyzer; surface collision means including a planar collision surface positioned perpendicular to said beam and along said axis to intercept said ions, input apertures and output apertures disposed on said axis, whereby said ions collide with said surface collision means and undergo surface collision processes and generate surface collision products; means for focusing and directing said surface collision products along said axis to said mass analyzer; and means for detecting the output of said mass analyzer.

Claim 14

A mass spectrometer for analysis of samples comprising: an ion source for providing sample ions; a first analyzer; means for directing sample ions into and along the axis of the first analyzer, said analyzer forming an ion beam; a second analyzer disposed in-line with said ion beam along said axis; collision means disposed on said axis between said first and second analyzers to receive the ion beam, said collision means including a deflector and a collision surface whereby sample ions leaving the first analyzer may impinge with selected kinetic energy on either said deflector or said collision surface to form collision products; means for directing and focusing said collision products to said second analyzer; and a detector responsive to the output of the second mass analyzer.

Claim 15

A mass spectrometer for analysis of samples comprising: an ion source for providing sample ions; a first analyzer; means for directing sample ions into and along the axis of the first analyzer, said analyzer forming an ion beam; a second analyzer disposed in-line with said ion beam along said axis; collision means disposed on said axis between said first and second analyzers to receive the ion beam, said collision means including a deflector and a collision surface whereby sample ions leaving the first analyzer may impinge with selected kinetic energy on either said deflector or said collision surface to form collision products; means for directing and focusing said collision products to said second analyzer; and a detector responsive to the output of the second mass analyzer.

Claim 16

A mass spectrometer as in claim 11 in which said collision means includes: input apertures on said axis for directing ions to said collision surface.