Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
111 words
A method of fabricating a heterojunction bipolar transistor comprising the steps of: (a) providing a substrate of a group III-V semiconductor material; (b) doping a first selected region of said substrate extending to a surface of said substrate a predetermined first conductivity type; (c) doping a portion of said first selected region to provide a second conductivity type in said portion of said first selected region having a bandgap lower than the bandgap of said first selected region; and (d) forming contacts to said portion of said first selected region doped to a second conductivity type and to said first selected region external of said portion of said first selected region.
Claim 2
Independent Claim
111 words
A method of fabricating a heterojunction bipolar transistor comprising the steps of: (a) providing a substrate of a group III-V semiconductor material; (b) doping a first selected region of said substrate extending to a surface of said substrate a predetermined first conductivity type; (c) doping a portion of said first selected region to provide a second conductivity type in said portion of said first selected region having a bandgap lower than the bandgap of said first selected region; and (d) forming contacts to said portion of said first selected region doped to a second conductivity type and to said first selected region external of said portion of said first selected region.
Claim 3
Dependent Claim
32 words
The method of claim 1 further including the step of causing said portion of said first selected region to extend farther into said substrate than the remainder of said first selected region.
Claim 4
Dependent Claim
56 words
The method of claim 2 wherein said step of causing said portion of said first selected region to extend farther into said substrate than the remainder of said first selected region comprises the step of heating said portion of said first selected region with a laser beam to cause melting and subsequent recrystallization of said substrate.
Claim 5
Dependent Claim
58 words
The method of claim 1 further including the steps of: (e) doping a second selected region at a surface of said substrate a second conductivity type; (f) doping a portion of said second selected region to said first conductivity type; and (g) forming contacts to said portion of said second selected region and to said second selected region.
Claim 6
Dependent Claim
55 words
The method of claim 4 further including the steps of causing said portion of said first selected region to extend farther into said substrate than the remainder of said first selected region and causing said portion of said second selected region to extend farther into said substrate than the remainder of said second selected region.
Claim 7
Dependent Claim
81 words
The method of claim 5 wherein said steps of causing said portion of said first selected region to extend farther into said substrate than the remainder of said first selected region and causing said portion of said second selected region to extend farther into said substrate than the remainder of said second selected region comprises the step of heating said portions of said first and second selected regions with a laser beam to cause melting and subsequent recrystallization of said substrate.
Claim 8
Dependent Claim
23 words
The method of claim 6 wherein said substrate is gallium arsenide and said portion of said first selected region is indium gallium arsenide.
Claim 9
Dependent Claim
23 words
The method of claim 1 wherein said substrate is gallium arsenide and said portion of said first selected region is indium gallium arsenide.
Claim 10
Independent Claim
112 words
A method of fabricating a heterojunction bipolar transistor comprising the steps of: (a) providing a substrate of a group III-V semiconductor material; (b) doping a first selected region at a surface of said substrate a predetermined first conductivity type; (c) incorporating a group III element into a portion of said first selected region; (d) doping said portion of said first selected region to a second conductivity type having a bandgap lower than the bandgap of said first selected region; and (e) forming contacts to said portion of said first selected region doped to a second conductivity type and to said first selected region external of said portion of said first selected region.
Claim 11
Independent Claim
112 words
A method of fabricating a heterojunction bipolar transistor comprising the steps of: (a) providing a substrate of a group III-V semiconductor material; (b) doping a first selected region at a surface of said substrate a predetermined first conductivity type; (c) incorporating a group III element into a portion of said first selected region; (d) doping said portion of said first selected region to a second conductivity type having a bandgap lower than the bandgap of said first selected region; and (e) forming contacts to said portion of said first selected region doped to a second conductivity type and to said first selected region external of said portion of said first selected region.
Claim 12
Dependent Claim
26 words
The method of claim 9 wherein steps (c) and (d) are performed concurrently with a laser beam to cause melting and subsequent recrystallization of said substrate.
Claim 13
Dependent Claim
32 words
The method of claim 10 further including the step of causing said portion of said first selected region to extend farther into said substrate than the remainder of said first selected region.
Claim 14
Dependent Claim
32 words
The method of claim 9 further including the step of causing said portion of said first selected region to extend farther into said substrate than the remainder of said first selected region.
Claim 15
Dependent Claim
72 words
The method of claim 9 further including the steps of: (f) doping a second selected region at a surface of said substrate a second conductivity type; (g) incorporating a group III element into a portion of said second selected region; (h) doping said portion of said second selected region to said first conductivity type; and (i) forming contacts to said portion of said second selected region and to said second selected region.
Claim 16
Dependent Claim
47 words
The method of claim 13 wherein steps (c) and (d) are performed concurrently with a laser beam to cause melting and subsequent recrystallization of said substrate and steps (g) and (h) are performed concurrently with a laser beam to cause melting and subsequent recrystallization of said substrate.
Claim 17
Dependent Claim
55 words
The method of claim 14 further including the step of causing said portion of said first selected region to extend farther into said substrate than the remainder of said first selected region and causing said portion of said second selected region to extend farther into said substrate than the remainder of said second selected region.
Claim 18
Dependent Claim
55 words
The method of claim 13 further including the step of causing said portion of said first selected region to extend farther into said substrate than the remainder of said first selected region and causing said portion of said second selected region to extend farther into said substrate than the remainder of said second selected region.