US5281541A
Expired / Lapsed
US
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Method for repairing an electrically short-circuited semiconductor device, and process for producing a semiconductor device utilizing said method
Assignee: Canon Inc
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Filing: 1991-09-05
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Granted: 1994-01-25
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Expires: 2011-09-05
Abstract
Abstract A method for repairing a defective semiconductor device, the defective semiconductor device including a semiconductor thin film and a conductive thin film, disposed in the named order, on a conductive surface of a substrate, such that the conductive thin film and the conductive surface of the substrate are electrically short-circuited at a pinhole occurring in the semiconductor thin film to form an electrically short-circuited portion. The method includes the steps of applying desired a voltage through an electrode positioned above a surface of the defective semiconductor device, and moving the electrode along the surface of the defective semiconductor device while maintaining a distance between the electrode and the conductive thin film sufficient to allow a discharge to occur when the electrode is above the electrically short-circuited portion, such that the discharge modifies a region of the conductive thin film which is in electrical contact with the conductive surface of the substrate, to establish an electrically noncontacted state between the conductive thin film and the conductive surface of the substrate.
Inventors
- 👤 Keishi Saito
- 👤 Tatsuyuki Aoike
- 👤 Mitsuyuki Niwa
- 👤 Toshimitsu Kariya
- 👤 Yuzo Koda
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-07 21:56
CPC Classifications
H; H10; H10F; H10F71/00; H10F71/135; H10F71/10; H10D; H10D64/00; H10D64/01; H10D64/011; H10F71/103; H10F71/107; H10F77/00; H10F77/10; H10F77/16; H10F77/169; H10F77/1692; H10F77/20; H10F77/244; H10F77/247; H10F77/251; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02P; Y02P70/00; Y02P70/50; Y10; Y10S; Y10S136/00; Y10S136/29
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
171 words
A method for repairing a defective semiconductor device, the defective semiconductor device including a semiconductor thin film and a conductive thin film, disposed in the named order, on a conductive surface of a substrate, such that the conductive thin film and the conductive surface of the substrate are electrically short-circuited at a pinhole occurring in the semiconductor thin film to form an electrically short-circuited portion, said method comprising the steps of: (a) applying a desired voltage through an electrode positioned above a surface of the defective semiconductor device; and (b) moving the electrode along the surface of the defective semiconductor device while maintaining a distance between the electrode and the conductive thin film sufficient to allow a discharge to occur when the electrode is above the electrically short-circuited portion, such that the discharge modifies a region of the conductive thin film which is in electrical contact with the conductive surface of the substrate to establish an electrically noncontacted state between the conductive thin film and the conductive surface of the substrate.
Claim 2
Independent Claim
171 words
A method for repairing a defective semiconductor device, the defective semiconductor device including a semiconductor thin film and a conductive thin film, disposed in the named order, on a conductive surface of a substrate, such that the conductive thin film and the conductive surface of the substrate are electrically short-circuited at a pinhole occurring in the semiconductor thin film to form an electrically short-circuited portion, said method comprising the steps of: (a) applying a desired voltage through an electrode positioned above a surface of the defective semiconductor device; and (b) moving the electrode along the surface of the defective semiconductor device while maintaining a distance between the electrode and the conductive thin film sufficient to allow a discharge to occur when the electrode is above the electrically short-circuited portion, such that the discharge modifies a region of the conductive thin film which is in electrical contact with the conductive surface of the substrate to establish an electrically noncontacted state between the conductive thin film and the conductive surface of the substrate.
Claim 3
Dependent Claim
25 words
The method according to claim 1, wherein the substrate comprises a metal base member and another conductive thin film formed on the metal base member.
Claim 4
Dependent Claim
25 words
The method according to claim 1, wherein the substrate comprises an insulating base member and another conductive thin film formed on the insulating base member.
Claim 5
Dependent Claim
28 words
The method according to claim 1, wherein the electrode is continuously moved above the semiconductor device while leaving a distance between the conductive thin film and the electrode.
Claim 6
Dependent Claim
49 words
The method according to claim 1, wherein the electrode is continuously moved in a first direction above the semiconductor device while leaving a distance between the conductive thin film and the electrode, and wherein the semiconductor device is intermittently moved in a second direction perpendicular to the first direction.
Claim 7
Dependent Claim
39 words
The method according to claim 1, wherein the semiconductor device comprises a continuous semiconductor device comprising the semiconductor thin film and the conductive thin film being disposed in the named order on a conductive surface of a continuous substrate.
Claim 8
Dependent Claim
38 words
The method according to claim 6, wherein the electrode comprises a plurality of probes being arranged at equal intervals above the continuous semiconductor device, and wherein the continuous semiconductor device is continuously moved in a lengthwise direction thereof.
Claim 9
Dependent Claim
16 words
The method according to claim 1, wherein the semiconductor device comprises a pin junction photovoltaic element.
Claim 10
Dependent Claim
20 words
The method according to claim 1, wherein the semiconductor thin film of the semiconductor device includes a silicon-containing semiconductor film.
Claim 11
Dependent Claim
45 words
The method according to claim 1, wherein the conductive thin film of the semiconductor device includes a layer region comprising a material selected from the group consisting of MgF 2 , ZnO, TiO 2 , In 2 O 3 , SnO 2 , and ITO.
Claim 12
Dependent Claim
32 words
The method according to claim 1, wherein the conductive thin film of the semiconductor device includes a layer region comprising a material selected from the group consisting of Ag, Al, and Cr.
Claim 13
Dependent Claim
137 words
A process for producing a semiconductor device comprising the steps of: (a) providing a substrate having a conductive surface; (b) forming a semiconductor thin film and a conductive thin film, in the named order, on the conductive surface of the substrate to prepare the semiconductor device; (c) applying a desired voltage through an electrode positioned above the semiconductor device, and (d) moving the electrode along a surface of the semiconductor device while maintaining a distance between the electrode and the conductive thin film sufficient to allow a discharge to occur when the electrode is above a region of the conductive thin film in electrical contact with the conductive surface of the substrate, such that the discharge modifies the region to establish an electrically noncontacted state between the conductive thin film and the conductive surface of the substrate.
Claim 14
Dependent Claim
137 words
A process for producing a semiconductor device comprising the steps of: (a) providing a substrate having a conductive surface; (b) forming a semiconductor thin film and a conductive thin film, in the named order, on the conductive surface of the substrate to prepare the semiconductor device; (c) applying a desired voltage through an electrode positioned above the semiconductor device, and (d) moving the electrode along a surface of the semiconductor device while maintaining a distance between the electrode and the conductive thin film sufficient to allow a discharge to occur when the electrode is above a region of the conductive thin film in electrical contact with the conductive surface of the substrate, such that the discharge modifies the region to establish an electrically noncontacted state between the conductive thin film and the conductive surface of the substrate.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-01-24 | 1997-07-26 | 1998-01-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-01-24 | 2001-07-26 | 2002-01-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-01-24 | 2005-07-26 | 2006-01-25 | $7700.00 | Window Closed / Lapsed |