US4806496A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for manufacturing photoelectric conversion devices
Assignee: Semiconductor Energy Laboratory Co Ltd
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Filing: 1987-01-28
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Granted: 1989-02-21
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Expires: 2007-01-28
Abstract
Abstract Photoelectric conversion devices are manufactured at high yield by repairing the devices during the final steps of the manufacuturing process. Short current paths resulting from the formation process of semiconductor layers can be eliminated by applying a reverse voltage to the layers, which thus are heated and made insulating. After the elimination of the short current paths, the reverse current no longer passes beyond 15 mA on a reverse voltage of 8 V.
Inventors
- 👤 Kunio Suzuki
- 👤 Ippei Kobayashi
- 👤 Katsuhiko Shibata
- 👤 Masato Susukida
- 👤 Mikio Kinka
- 👤 Takeshi Fukada
- 👤 Susumu Nagayama
- 👤 Masayoshi Abe
- 👤 Shunpei Yamazaki
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 07:36
CPC Classifications
H; H10; H10F; H10F71/00; H10F71/135; H10F71/10; H10F19/00; H10F19/30; H10F19/31; H10F71/103; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02P; Y02P70/00; Y02P70/50; Y10; Y10S; Y10S136/00; Y10S136/29
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
99 words
A method for curing defects of a photoelectric conversion device having first and second electrodes and a semiconductor layer inbetween incorporating a pin junction therein, said method comprising: connecting a voltage source and an ammeter in series between said first and second electrodes; and applying a reverse bias voltage less than the breakdown voltage across said semiconductor layer by said voltage source through said first and second electrodes, while the current passing through said semiconductor layer is monitored for the purpose of confirming the drop of said current which indicates burning out of the defects of said semiconductor layer.
Claim 2
Independent Claim
99 words
A method for curing defects of a photoelectric conversion device having first and second electrodes and a semiconductor layer inbetween incorporating a pin junction therein, said method comprising: connecting a voltage source and an ammeter in series between said first and second electrodes; and applying a reverse bias voltage less than the breakdown voltage across said semiconductor layer by said voltage source through said first and second electrodes, while the current passing through said semiconductor layer is monitored for the purpose of confirming the drop of said current which indicates burning out of the defects of said semiconductor layer.
Claim 3
Dependent Claim
17 words
The method of claim 1 wherein said reverse bias voltage is gradually increased during said applying step.
Claim 4
Dependent Claim
15 words
The method of claim 1 wherein said semiconductor layer is made of a non-single-crystalline semiconductor.
Claim 5
Dependent Claim
39 words
The method of claim 1 wherein after said reverse bias voltage applying step the electric characteristics of said device are tested using the connection between said electrode arrangement and the voltage supply for said reverse bias voltage applying step.
Claim 6
Dependent Claim
26 words
The method of claim 1 wherein said device is composed of a plurality of independent photoelectric conversion units which are connected with each other in series.
Claim 7
Dependent Claim
16 words
The method of claim 5 wherein each unit is provided with a respective reverse bias voltage.
Claim 8
Dependent Claim
25 words
The method of claim 1 wherein said electrode arrangement includes a transparent conductive oxide layer directly in contact with a surface of said semiconductor layer.
Claim 9
Dependent Claim
25 words
The method of claim 1 wherein said electrode arrangement includes a transparent conductive nitride layer directly in contact with a surface of said semiconductor layer.
Claim 10
Dependent Claim
28 words
The method of claim 1 wherein the voltage across said semiconductor layer is monitored, during said applying step, by a voltmeter connected between said first and second electrodes.
References Cited (Backward Citations)
US4166918A
Cited
US4451970A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-02-21 | 1992-08-22 | 1993-02-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-02-21 | 1996-08-22 | 1997-02-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-02-21 | 2000-08-22 | 2001-02-21 | $7700.00 | Window Closed / Lapsed |