Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
273 words
A method of fabricating an integrated circuit for providing low-noise and high-power microwave operation comprising: depositing a buffer on a substrate; depositing a low-noise channel layer above said buffer; depositing a low-noise buffer layer above said low-noise channel layer; depositing a power channel layer above said low-noise buffer layer; depositing a wide bandgap layer above said power channel layer; depositing a cap layer above said wide bandgap layer; forming a first transistor configuration by etching said cap layer, said wide bandgap layer, and said power channel layer in a first pattern to form a first recess exposing said low-noise buffer layer; forming a second transistor configuration by etching said cap layer in a second pattern to form a second recess exposing said wide bandgap layer; etching a third recess inside of said first recess that extends slightly into said low-noise buffer layer; etching a fourth recess inside of said second recess that extends slightly into said wide bandgap layer; depositing a first gate metallization in said third recess; depositing a second gate metallization in said fourth recess; depositing a first drain contact on said cap layer on one side of said first recess and a first source contact on an opposite side of said first recess; and depositing a second drain contact on said cap layer on one side of said second recess and a second source contact on an opposite side of said second recess, wherein said contacts are alloyed and driven through said cap layer, said wide bandgap layer, said power channel layer and said low-noise buffer layer to make contact with said low-noise channel layer and said power channel layer.
Claim 2
Independent Claim
273 words
A method of fabricating an integrated circuit for providing low-noise and high-power microwave operation comprising: depositing a buffer on a substrate; depositing a low-noise channel layer above said buffer; depositing a low-noise buffer layer above said low-noise channel layer; depositing a power channel layer above said low-noise buffer layer; depositing a wide bandgap layer above said power channel layer; depositing a cap layer above said wide bandgap layer; forming a first transistor configuration by etching said cap layer, said wide bandgap layer, and said power channel layer in a first pattern to form a first recess exposing said low-noise buffer layer; forming a second transistor configuration by etching said cap layer in a second pattern to form a second recess exposing said wide bandgap layer; etching a third recess inside of said first recess that extends slightly into said low-noise buffer layer; etching a fourth recess inside of said second recess that extends slightly into said wide bandgap layer; depositing a first gate metallization in said third recess; depositing a second gate metallization in said fourth recess; depositing a first drain contact on said cap layer on one side of said first recess and a first source contact on an opposite side of said first recess; and depositing a second drain contact on said cap layer on one side of said second recess and a second source contact on an opposite side of said second recess, wherein said contacts are alloyed and driven through said cap layer, said wide bandgap layer, said power channel layer and said low-noise buffer layer to make contact with said low-noise channel layer and said power channel layer.
Claim 3
Dependent Claim
24 words
The method of claim 1 wherein said substrate, said buffer, said low-noise channel layer, said power channel layer, and said cap layer are GaAs.
Claim 4
Dependent Claim
12 words
The method of claim 1 wherein said low-noise channel layer is InGaAs.
Claim 5
Dependent Claim
12 words
The method of claim 1 wherein said power channel layer is InGaAs.
Claim 6
Dependent Claim
12 words
The method of claim 1 wherein said wide bandgap layer is AlGaAs.
Claim 7
Dependent Claim
37 words
The method of claim 1 further comprising the step of selectively depositing metallization on one of said layers or on said substrate to form an amplifier incorporating said first transistor and an amplifier incorporating said second transistor.
Claim 8
Dependent Claim
27 words
The method of claim 6 further comprising selectively depositing metallization on one of said layers or on said substrate to form a switch incorporating said first transistor.
Claim 9
Dependent Claim
27 words
The method of claim 6 further comprising selectively depositing metallization on one of said layers or on said substrate to form a switch incorporating said second transistor.
Claim 10
Dependent Claim
28 words
The method of claim 6 further comprising selectively depositing metallization on one of said layers or on said substrate to form a phase shifter incorporating said first transistor.