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US5253202A Expired / Lapsed US ⏱️ 0.0 years remaining

Word line driver circuit for dynamic random access memories

Assignee: International Business Machines Corp
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Filing: 1991-02-05
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Granted: 1993-10-12
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Expires: 2011-02-05
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Abstract

Abstract A wordline driver circuit for reading the contents of a Dynamic Random Access Memory (DRAM). The circuit is implemented in CMOS and is capable of pulling the wordlines to a negative potential with respect to the substrate, thereby decreasing the access time. An NMOS pull-down transistor channel is implemented as a P-well within an N-well. Applying a negative potential to the source of the pull-down transistor permits the transistor to be switched so that a negative potential is applied to the wordline when the NMOS pull-down transistor is gated into conduction. A PMOS pull-up transistor is serially connected to the NMOS pull-down transistor drain, permitting the wordline to be driven positively.

Inventors

  • 👤 Gary B. Bronner
  • 👤 Sang H. Dhong
  • 👤 Wei Hwang

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 12:28
CPC Classifications
G; G11; G11C; G11C11/00; G11C11/21; G11C11/34; G11C11/40; G11C11/401; G11C11/4063; G11C11/407; G11C11/408; G11C11/4085; G11C11/4087

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 160 words
A wordline driver for a CMOS dynamic random access memory comprising: a PMOS transistor having a source connected to a positive terminal of a voltage source serially connected with an NMOS transistor, said PMOS and NMOS transistor having a common gate connection for receiving a decoder logic signal, and having a common series connection for driving the word line of a row of memory cells; a trench capacitor connected at one end to said NMOS transistor drain and connected at a second end to a common substrate which is connected to a negative terminal of said voltage source; and, an on-chip voltage generator connected to said one end of said trench capacitor and said substrate for charging said trench capacitor to a potential below the potential of said substrate, whereby said wordline is driven between a positive potential applied to said PMOS transistor source and a negative voltage supplied by said trench capacitor in response to said decoder logic signal.
Claim 2
Dependent Claim 160 words
A wordline driver for a CMOS dynamic random access memory comprising: a PMOS transistor having a source connected to a positive terminal of a voltage source serially connected with an NMOS transistor, said PMOS and NMOS transistor having a common gate connection for receiving a decoder logic signal, and having a common series connection for driving the word line of a row of memory cells; a trench capacitor connected at one end to said NMOS transistor drain and connected at a second end to a common substrate which is connected to a negative terminal of said voltage source; and, an on-chip voltage generator connected to said one end of said trench capacitor and said substrate for charging said trench capacitor to a potential below the potential of said substrate, whereby said wordline is driven between a positive potential applied to said PMOS transistor source and a negative voltage supplied by said trench capacitor in response to said decoder logic signal.
Claim 3
Dependent Claim 26 words
The wordline driver of claim 1, wherein said NMOS transistor is implemented as a P-well forming a conductive channel in an N-well of a P+ substrate.
Claim 4
Dependent Claim 15 words
The wordline driver of claim 1 wherein said trench capacitor is formed in said substrate.
Claim 5
Dependent Claim 69 words
The wordline driver of claim 1 wherein said on-chip voltage generator comprises: a ring oscillator for supplying an alternating pulsed signal; a clamping circuit connecting said ring oscillator to said trench capacitor, charging said trench capacitor to a negative voltage with respect to said substrate; and, a voltage regulator connected to monitor said trench capacitor voltage and inhibit said ring oscillator when said capacitor has reached a predetermined level.
Claim 6
Dependent Claim 58 words
The wordline driver of claim 4 wherein said voltage regulator comprises a cross coupled latch, having two nodes, one of which is connected through a transistor to a source of potential VDD, the other of which is connected through a transistor to a reference source of potential, said second transistor having a gate connected to said trench capacitor.
Claim 7
Dependent Claim 77 words
The wordline driver of claim 1 further comprising: a second PMOS transistor serially connected to a second NMOS transistor, said second transistors forming common gate connections connected to receive said decoder signal, and having a serial connection connected to gate connections of said first PMOS and NMOS serially connected transistors, said second serially connected transistors providing a regulating function when said decoder signal amplitude is greater than the power supply voltage across said first serially connected transistors.

References Cited (Backward Citations)

US3925120A Cited
US4072868A Cited
US4124863A Cited
US4697252A Cited
US4642667A Cited
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US4720739A Cited
US4901280A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-10-11 1997-04-12 1997-10-12 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-10-11 2001-04-12 2001-10-12 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-10-11 2005-04-12 2005-10-12 $7700.00 Window Closed / Lapsed

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