Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
204 words
A semiconductor laser, comprising: (a) a semiconductor substrate; and (b) a plurality of semiconductor layers, positioned upon said semiconductor substrate, comprising: (1) a quantum well region comprised of Ga y In 1-y P for propagating optical signals along an axis of propagation, said quantum well region having a PN junction proximate thereto, and wherein said quantum well region is formed to be strained relative to layers disposed adjacent thereto; (2) a first graded index layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P having a graded index of refraction disposed adjacent a first side of said quantum well region, said graded index of refraction being largest at the interface of said first graded index layer and said quantum well region and decreasing in a direction away from said quantum well region; and (3) a second graded index layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P having a graded index of refraction disposed adjacent a second side of said quantum well region, said graded index of refraction being largest at the interface of said second graded index layer and said quantum well region and decreasing in a direction away from said quantum well region.
Claim 2
Dependent Claim
204 words
A semiconductor laser, comprising: (a) a semiconductor substrate; and (b) a plurality of semiconductor layers, positioned upon said semiconductor substrate, comprising: (1) a quantum well region comprised of Ga y In 1-y P for propagating optical signals along an axis of propagation, said quantum well region having a PN junction proximate thereto, and wherein said quantum well region is formed to be strained relative to layers disposed adjacent thereto; (2) a first graded index layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P having a graded index of refraction disposed adjacent a first side of said quantum well region, said graded index of refraction being largest at the interface of said first graded index layer and said quantum well region and decreasing in a direction away from said quantum well region; and (3) a second graded index layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P having a graded index of refraction disposed adjacent a second side of said quantum well region, said graded index of refraction being largest at the interface of said second graded index layer and said quantum well region and decreasing in a direction away from said quantum well region.
Claim 3
Dependent Claim
77 words
A semiconductor laser as recited in claim 1 wherein both said first and second graded index layers comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P have a value of x which varies from a minimum of approximately 0.40 at said interface of said graded index layer and said quantum well region to a maximum value selected from the range of 0.80 to 0.1 in a direction away from said quantum well region.
Claim 4
Dependent Claim
28 words
A semiconductor laser as recited in claim 2 wherein said quantum well region comprised of Ga y In 1-y P has a value of y of approximately 0.43.
Claim 5
Dependent Claim
79 words
A semiconductor laser as recited in claim 3, further comprising: (a) a first bounding layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P, said first bounding layer interdisposed between said first graded index layer and said quantum well region; and (b) a second bounding layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P, said second bounding layer interdisposed between said second graded index layer and said quantum well region.
Claim 6
Dependent Claim
42 words
A semiconductor laser as recited in claim 4 wherein both said first and second bounding layers comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P have a value of x selected from the range of 0.20 to 0.30.
Claim 7
Dependent Claim
69 words
A semiconductor laser as recited in claim 5, further comprising: (a) a first cladding layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P, said first cladding layer positioned adjacent said first graded index layer; and (b) a second cladding layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P, said second cladding layer positioned adjacent said second graded index layer.
Claim 8
Dependent Claim
42 words
A semiconductor laser as recited in claim 6 wherein both said first and second cladding layers comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P have a value of x selected from the range of 0.80 to 1.0.
Claim 9
Dependent Claim
51 words
A semiconductor laser as recited in claim 7 wherein both said first and second cladding layers comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P have a value of x selected to approximately equal said maximum value of x in said first and second graded index layers.
Claim 10
Dependent Claim
26 words
A semiconductor laser as recited in claim 7 wherein said quantum well region has a thickness selected from the range of 0.006 micrometers to 0.012 micrometers.
Claim 11
Dependent Claim
29 words
A semiconductor laser as recited in claim 7 wherein both said first and second bounding layers have a thickness selected from the range of 0.004 micrometers to 0.008 micrometers.
Claim 12
Dependent Claim
210 words
A semiconductor laser, comprising: (a) a semiconductor substrate; and (b) a plurality of semiconductor layers, positioned upon said semiconductor substrate, comprising: (1) a quantum well region comprised of (Al z Ga 1-z ) 0 .41 In 0 .59 P for propagating optical signals along an axis of propagation, said quantum well region having a PN junction proximate thereto, and wherein said quantum well region is formed to be strained relative to layers disposed adjacent thereto; (2) a first graded index layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P having a graded index of refraction disposed adjacent a first side of said quantum well region, said graded index of refraction being largest at the interface of said first graded index layer and said quantum well region and decreasing in a direction away from said quantum well region; and (3) a second graded index layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P having a graded index of refraction disposed adjacent a second side of said quantum well region, said graded index of refraction being largest at the interface of said second graded index layer and said quantum well region and decreasing in a direction away from said quantum well region.
Claim 13
Dependent Claim
210 words
A semiconductor laser, comprising: (a) a semiconductor substrate; and (b) a plurality of semiconductor layers, positioned upon said semiconductor substrate, comprising: (1) a quantum well region comprised of (Al z Ga 1-z ) 0 .41 In 0 .59 P for propagating optical signals along an axis of propagation, said quantum well region having a PN junction proximate thereto, and wherein said quantum well region is formed to be strained relative to layers disposed adjacent thereto; (2) a first graded index layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P having a graded index of refraction disposed adjacent a first side of said quantum well region, said graded index of refraction being largest at the interface of said first graded index layer and said quantum well region and decreasing in a direction away from said quantum well region; and (3) a second graded index layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P having a graded index of refraction disposed adjacent a second side of said quantum well region, said graded index of refraction being largest at the interface of said second graded index layer and said quantum well region and decreasing in a direction away from said quantum well region.
Claim 14
Dependent Claim
77 words
A semiconductor laser as recited in claim 11 wherein both said first and second graded index layers comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P have a value of x which varies from a minimum of approximately 0.40 at said interface of said graded index layer and said quantum well region to a maximum value selected from the range of 0.80 to 1.0 in a direction away from said quantum well region.
Claim 15
Dependent Claim
39 words
A semiconductor laser as recited in claim 12 wherein said quantum well region comprised of (Al z Ga 1-z ) 0 .41 In 0 .59 P has a value of z selected from the range of 0.0 to 0.30.
Claim 16
Dependent Claim
79 words
A semiconductor laser as recited in claim 13, further comprising: (a) a first bounding layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P, said first bounding layer interdisposed between said first graded index layer and said quantum well region; and (b) a second bounding layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P, said second bounding layer interdisposed between said second graded index layer and said quantum well region.
Claim 17
Dependent Claim
42 words
A semiconductor laser as recited in claim 14 wherein both said first and second bounding layers comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P have a value of x selected from the range of 0.30 to 0.40.
Claim 18
Dependent Claim
69 words
A semiconductor laser as recited in claim 15, further comprising: (a) a first cladding layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P, said first cladding layer positioned adjacent said first graded index layer; and (b) a second cladding layer comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P, said second cladding layer positioned adjacent said second graded index layer.
Claim 19
Dependent Claim
42 words
A semiconductor laser as recited in claim 16 wherein both said first and second cladding layers comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P have a value of x selected from the range of 0.80 to 1.0.
Claim 20
Dependent Claim
51 words
A semiconductor laser as recited in claim 17 wherein both said first and second cladding layers comprised of (Al x Ga 1-x ) 0 .51 In 0 .49 P have a value of x selected to approximately equal said maximum value of x in said first and second graded index layers.
Claim 21
Dependent Claim
26 words
A semiconductor laser as recited in claim 17 wherein said quantum well region has a thickness selected from the range of 0.006 micrometers to 0.012 micrometers.
Claim 22
Dependent Claim
29 words
A semiconductor laser as recited in claim 17 wherein both said first and second bounding layers have a thickness selected from the range of 0.004 micrometers to 0.008 micrometers.