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US5210438A
Expired / Lapsed
US
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Semiconductor resistance element and process for fabricating same
Assignee: Fujitsu Semiconductor Ltd
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Filing: 1991-12-16
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Granted: 1993-05-11
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Expires: 2011-12-16
Abstract
Abstract A semiconductor resistance element of one electrical conduction type comprises: a semiconductor region including a first impurity of opposite electrical conduction type and second impurity of one electrical conduction type, wherein said second impurity is more heavily introduced so that a predetermined resistance is obtained; and electrode regions provided on both ends of said semiconductor region.
Inventors
- 👤 Shunji Nakamura
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 19:22
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/40; H10D1/47; H10D1/01; H10D1/025; H10D30/00; H10D30/01; H10D30/021; H10D30/031; H10D30/0312; H10D30/0314; H10D30/0321
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
170 words
A semiconductor device comprising a semiconductor resistance element, said semiconductor resistance element comprising: a semiconductor region having a first impurity which is a first conductivity type and is introduced into said semiconductor region with a first impurity concentration and a second impurity which is introduced into said semiconductor region with a second impurity concentration, wherein the first impurity is an opposite conductivity type and said first impurity concentration is 3×10 18 cm -3 or more, wherein the second impurity concentration is greater than the first impurity concentration, an entirety of said semiconductor region having the first and second introduced impurity concentrations together therein to thereby form a specific resistance, and further said semiconductor region having opposingly-located first and second ends; two electrode regions electrically connected to said semiconductor region, each being positioned on one of the first and second ends of said semiconductor region; and a wiring layer formed above said semiconductor region and extending over an entire length of said semiconductor region from the first to second ends thereof.
Claim 2
Dependent Claim
170 words
A semiconductor device comprising a semiconductor resistance element, said semiconductor resistance element comprising: a semiconductor region having a first impurity which is a first conductivity type and is introduced into said semiconductor region with a first impurity concentration and a second impurity which is introduced into said semiconductor region with a second impurity concentration, wherein the first impurity is an opposite conductivity type and said first impurity concentration is 3×10 18 cm -3 or more, wherein the second impurity concentration is greater than the first impurity concentration, an entirety of said semiconductor region having the first and second introduced impurity concentrations together therein to thereby form a specific resistance, and further said semiconductor region having opposingly-located first and second ends; two electrode regions electrically connected to said semiconductor region, each being positioned on one of the first and second ends of said semiconductor region; and a wiring layer formed above said semiconductor region and extending over an entire length of said semiconductor region from the first to second ends thereof.
Claim 3
Dependent Claim
171 words
A semiconductor device which is a Thin Film Transistor (TFT), said semiconductor device comprising: a semiconductor region having a first impurity which is a first conductivity type and is introduced into said semiconductor region with a first impurity concentration and a second impurity which is introduced into said semiconductor region with a second impurity concentration, wherein the first impurity is an opposite conductivity type and said first impurity concentration is 3×10 18 cm -3 or more, wherein the second impurity concentration is greater than the first impurity concentration, an entirety of said semiconductor region having the first and second introduced impurity concentrations together therein to thereby form a specific resistance, and further said semiconductor region having opposingly-located first and second ends; two electrode regions electrically connected to said semiconductor region, each being positioned on one of the first and seconds ends of said semiconductor region; and a wiring layer formed above said semiconductor region and extending over an entire length of said semiconductor region from the first to second ends thereof.
Claim 4
Dependent Claim
171 words
A semiconductor device which is a Thin Film Transistor (TFT), said semiconductor device comprising: a semiconductor region having a first impurity which is a first conductivity type and is introduced into said semiconductor region with a first impurity concentration and a second impurity which is introduced into said semiconductor region with a second impurity concentration, wherein the first impurity is an opposite conductivity type and said first impurity concentration is 3×10 18 cm -3 or more, wherein the second impurity concentration is greater than the first impurity concentration, an entirety of said semiconductor region having the first and second introduced impurity concentrations together therein to thereby form a specific resistance, and further said semiconductor region having opposingly-located first and second ends; two electrode regions electrically connected to said semiconductor region, each being positioned on one of the first and seconds ends of said semiconductor region; and a wiring layer formed above said semiconductor region and extending over an entire length of said semiconductor region from the first to second ends thereof.
Claim 5
Dependent Claim
162 words
A semiconductor resistance element comprising: a semiconductor region having a first impurity which is a first conductivity type and is introduced into said semiconductor region with a first impurity concentration and a second impurity which is introduced into said semiconductor region with a second impurity concentration, wherein the first impurity is an opposite conductivity type and said first impurity concentration is 3×10 18 cm -3 or more, wherein the second impurity concentration is greater than the first impurity concentration, an entirety of said semiconductor region having the first and second introduced impurity concentrations together therein to thereby form a specific resistance, and further said semiconductor region having opposingly-located first and second ends; two electrode regions electrically connected to said semiconductor region, each being positioned on one of the first and seconds ends of said semiconductor region; and a wiring layer formed above said semiconductor region and extending over an entire length of said semiconductor region from the first to second ends thereof.
Claim 6
Dependent Claim
162 words
A semiconductor resistance element comprising: a semiconductor region having a first impurity which is a first conductivity type and is introduced into said semiconductor region with a first impurity concentration and a second impurity which is introduced into said semiconductor region with a second impurity concentration, wherein the first impurity is an opposite conductivity type and said first impurity concentration is 3×10 18 cm -3 or more, wherein the second impurity concentration is greater than the first impurity concentration, an entirety of said semiconductor region having the first and second introduced impurity concentrations together therein to thereby form a specific resistance, and further said semiconductor region having opposingly-located first and second ends; two electrode regions electrically connected to said semiconductor region, each being positioned on one of the first and seconds ends of said semiconductor region; and a wiring layer formed above said semiconductor region and extending over an entire length of said semiconductor region from the first to second ends thereof.
Claim 7
Dependent Claim
24 words
A semiconductor resistance element according to claim 2, wherein said concentration of said opposite conductivity type impurity is 3×10 19 cm -3 or more.
Claim 8
Dependent Claim
15 words
A semiconductor resistance element according to claim 3, wherein said semiconductor region is polycrystalline silicon.
Claim 9
Dependent Claim
16 words
A semiconductor resistance element according to claim 3, wherein said semiconductor region is a monocrystalline silicon.
Claim 10
Dependent Claim
15 words
A semiconductor resistance element according to claim 3, wherein said semiconductor region is amorphous silicon.
Claim 11
Dependent Claim
14 words
A semiconductor resistance element according to claim 3, wherein said semiconductor region is germanium.
Claim 12
Dependent Claim
52 words
A semiconductor resistance element according to claim 3, wherein one of said first impurity and said second impurity comprises at least one element selected from P, As and Sb, and the other of said first impurity and said second impurity comprises at least one element selected from B, Ga, In and Al.
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