US4489104A
Expired / Lapsed
US
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Polycrystalline silicon resistor having limited lateral diffusion
Assignee: Industrial Technology Research Institute
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Filing: 1983-06-03
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Granted: 1984-12-18
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Expires: 2003-06-03
Abstract
Abstract An improved polycrystalline silicon resistor having limited lateral diffusion, integrated circuits containing such resistors, and a method of their preparation is disclosed. The polysilicon resistor is formed by first doping the polysilicon layer with a p or n type impurity and thereafter neutralizing the treated layer with impurities of the other type so as to form a device wherein the concentration gradient between the resistor region of the aforesaid layer and its environment is low. The low concentration gradient reduces lateral diffusion during manufacture, thereby permitting manufacture of integrated circuits of higher circuit density and resistors with smaller dimensions, lower temperature coefficients and higher reliability.
Inventors
- 👤 Ming-Kwang Lee
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 00:08
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/40; H10D1/47; H10B; H10B10/00; H10B10/15; Y; Y10; Y10S; Y10S148/00; Y10S148/136; Y10S438/00; Y10S438/934; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49082; Y10T29/49099
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
147 words
A process for fabricating a polysilicon resistor having limited lateral diffusion in a polysilicon film supported on an insulated substrate which comprises: (a) doping said film of polycrystalline silicon with an n-type dopant to a concentration of at least 1×10 18 /cm 3 ; (b) heat-treating the doped polycrystalline silicon film at a temperature of from about 600° to 1200° C., in an atmosphere of inert or oxidizing gases for a 3 to 60 min. period; (c) selectively doping the resistor region of the heat-treated doped polycrystalline silicon film with a p-type dopant in a concentration less than or equal to the concentration of dopant in step (a) to form a resistor region; (d) activating the doubly doped heat-treated polycrystalline silicon film at a temperature of from about 900° to 1150° C. in an atmoshpere of inert or oxidizing gases for a 3 to 60 min. period.
Claim 2
Dependent Claim
147 words
A process for fabricating a polysilicon resistor having limited lateral diffusion in a polysilicon film supported on an insulated substrate which comprises: (a) doping said film of polycrystalline silicon with an n-type dopant to a concentration of at least 1×10 18 /cm 3 ; (b) heat-treating the doped polycrystalline silicon film at a temperature of from about 600° to 1200° C., in an atmosphere of inert or oxidizing gases for a 3 to 60 min. period; (c) selectively doping the resistor region of the heat-treated doped polycrystalline silicon film with a p-type dopant in a concentration less than or equal to the concentration of dopant in step (a) to form a resistor region; (d) activating the doubly doped heat-treated polycrystalline silicon film at a temperature of from about 900° to 1150° C. in an atmoshpere of inert or oxidizing gases for a 3 to 60 min. period.
Claim 3
Dependent Claim
16 words
The process of claim 1 wherein the doping steps are performed using ion-implantation or thermal diffusion.
Claim 4
Dependent Claim
41 words
The process of claim 1 wherein said insulated substrate is thermally grown silicon oxide on a silicon substrate; deposited silicon oxide on a silicon substrate; deposited silicon oxide on a sapphire substrate; a silicon oxide substrate, or an aluminum oxide substrate.
Claim 5
Dependent Claim
22 words
The process of claim 1 wherein the substrate is silicon, germanium, or a binary group III-V compound or a group II-VI compound.
Claim 6
Dependent Claim
14 words
The process of claim 1 wherein the n-type dopant is phosphorous, antimony or arsenic.
Claim 7
Dependent Claim
15 words
The process of claim 1 wherein the p-type dopant is boron, aluminum, gallium, or indium.
Claim 8
Dependent Claim
24 words
The process of claim 1 wherein a laser, xenon lamp, electron beam or ion beam is the source of energy for the heat treatment.
Claim 9
Dependent Claim
34 words
The process of claim 1 wherein a silicon oxide film is deposited on the doped polycrystalline silicon film prior to heat treating, said heat treating taking place in the presence of an oxidizing gas.
Claim 10
Dependent Claim
17 words
The process of claim 1 wherein the polysilicon resistor is fabricated as part of an integrated circuit.
Claim 11
Dependent Claim
31 words
The process of claim 1 wherein the polysilicon resistor has a sheet resistivity greater than 10 8 ohms/square, a low temperature coefficient, and an activation energy of less than 0.3 eV.
References Cited (Backward Citations)
US4088799A
Cited
US4120808A
Cited
US4148761A
Cited
US4147668A
Cited
US4166279A
Cited
US4392992A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1987-12-18 | 1988-06-18 | 1988-12-18 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-12-18 | 1992-06-18 | 1992-12-18 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-12-18 | 1996-06-18 | 1996-12-18 | $7700.00 | Window Closed / Lapsed |