US5201995A
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US
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Alternating cyclic pressure modulation process for selective area deposition
Assignee: MCNC Research and Development Institute
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Filing: 1992-03-16
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Granted: 1993-04-13
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Expires: 2012-03-16
Abstract
Abstract A novel process for the selective deposition of solid-phase materials is disclosed, which process requires only the modulation of a single auxiliary gas within a suitable reactor assembly. According to the disclosed method, selective area deposition can be obtained on any desired microelectronic substrate by the creation of a vapor-phase chemical equilibrium system capable of deposition and etching the material to be deposited. The vapor-phase system is designed around a single reversible reaction wherein the material to be deposited equilibrates between that solid phase and its vapor-phase constituent species. By modulating an auxiliary gas flow into the reactor assembly, alternating deposition and etching processes can be obtained to yield an overall process which results in net overall selective and uniform deposition.
Inventors
- 👤 Arnold Reisman
- 👤 Dorota Temple
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 23:19
CPC Classifications
C; C23; C23C; C23C16/00; C23C16/04; C23C16/44; C23C16/455; H; H10; H10P; H10P14/00; H10P14/20; H10P14/27; H10P14/271; H10P14/272; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3414; H10P14/3421; H10P14/40; H10P14/42; H10P14/43; H10P14/432; H10P50/00; H10P50/20; H10P50/24; H10P50/242; H10P50/244; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/056; H10W20/057
Claims Analysis
Total Claims: 32
Claim 1
Independent Claim
147 words
A process for depositing a predetermined thickness of a solid-phase material on a substrate located in a chemical reactor, said process comprising the steps of: combining a predetermined quantity of supply components to produce a confined vapor-phase chemical equilibrium system capable of both depositing and etching said material; transporting said chemical equilibrium system into contact with said substrate; flowing into said reactor and into a vapor-phase mixture with said chemical equilibrium system an independent flow of an auxiliary gas; and cyclically modulating said flow of said auxiliary gas into said reactor while maintaining the production and transportation of said chemical equilibrium system therein to alternatively stimulate said system toward deposition and then etching of said material on and from said substrate or visa-versa, said cyclical flow modulation being continued for a duration and at a frequency sufficient to yield net deposition of said material on said substrate.
Claim 2
Dependent Claim
147 words
A process for depositing a predetermined thickness of a solid-phase material on a substrate located in a chemical reactor, said process comprising the steps of: combining a predetermined quantity of supply components to produce a confined vapor-phase chemical equilibrium system capable of both depositing and etching said material; transporting said chemical equilibrium system into contact with said substrate; flowing into said reactor and into a vapor-phase mixture with said chemical equilibrium system an independent flow of an auxiliary gas; and cyclically modulating said flow of said auxiliary gas into said reactor while maintaining the production and transportation of said chemical equilibrium system therein to alternatively stimulate said system toward deposition and then etching of said material on and from said substrate or visa-versa, said cyclical flow modulation being continued for a duration and at a frequency sufficient to yield net deposition of said material on said substrate.
Claim 3
Dependent Claim
31 words
A process according to claim 1, wherein said auxiliary gas is selected from the group consisting of at least one of an inert gas, H 2 gas, and said supply components.
Claim 4
Dependent Claim
26 words
A process according to claim 1 for the deposition of zinc oxide, wherein said supply components comprise ZnO, H 2 gas and, optionally, an inert gas.
Claim 5
Dependent Claim
49 words
A process according to claim 1 for the deposition of copper, wherein said supply components comprise Cu; a gas mixture selected from the group consisting of H 2 gas+HX gas and H 2 gas+X 2 gas, where X is Cl, Br, F or I; and, optionally, an inert gas.
Claim 6
Dependent Claim
52 words
A process according to claim 1 for the deposition of silicon, wherein said supply components comprise Si; a gas mixture selected from the group consisting of HX gas, H 2 gas +X 2 gas and HX gas+H 2 gas, where X is Cl, Br, F or I; and, optionally, an inert gas.
Claim 7
Dependent Claim
40 words
A process according to claim 1 for the deposition of aluminum, wherein said supply components comprise Al; and a gas mixture selected from the group consisting of Cl,(v); H 2 gas+Cl 2 (v) and HCl(v); and, optionally, an inert gas.
Claim 8
Dependent Claim
46 words
A process according to claim 1 for the deposition of germanium, wherein said supply components comprise Ge; a gas mixture selected from the group consisting of HX gas and H, gas+X 2 gas, where X is Cl, Br, F or I; and, optionally, an inert gas.
Claim 9
Dependent Claim
47 words
A process according to claim 1 for the deposition of titanium, wherein said supply components comprise Ti; a gas mixture selected from the group consisting of HX gas and H 2 gas+X 2 gas, where X is Cl, Br, F or I; and, optionally, an inert gas.
Claim 10
Dependent Claim
48 words
A process according to claim 1 for the deposition of gallium arsenide, wherein said supply components comprise GAs; a gas mixture selected from the group consisting of HX gas and H 2 gas+X 2 gas, where X is Cl, Br, F or I; and, optionally, an inert gas.
Claim 11
Dependent Claim
25 words
A process according to claim 1 for the deposition of germanium, wherein said supply components comprise Ge, H 2 O(v) and, optionally, an inert gas.
Claim 12
Dependent Claim
47 words
A process according to claim 1 for the deposition of tungsten, wherein said supply components comprise W; a gas mixture selected from the group consisting of HX(v) and H 2 gas +X 2 gas where X is Cl, Br, F or I; and, optionally, an inert gas.
Claim 13
Dependent Claim
36 words
A process according to claim 1, wherein said substrate is selected from the group consisting of refractory metals, nonrefractory metals, refractory metal oxides, nonrefractory metal oxides, refractory metal nitrides, nonrefractory metal nitrides, semiconductors and alloys thereof.
Claim 14
Dependent Claim
42 words
A process according to claim 1, wherein said substrate comprises a microelectronic substrate having a masking layer covering selected portions thereof, said process selectively depositing said predetermined thickness of a solid-phase material on said microelectronic substrate, but not on said masking layer.
Claim 15
Dependent Claim
13 words
A process according to claim 13, wherein said substrate comprises multiple masking layers.
Claim 16
Dependent Claim
36 words
A process according to claim 1, wherein said material is selected from the group consisting of refractory metals, nonrefractory metals, refractory metal oxides, nonrefractory metal oxides, refractory metal nitrides, nonrefractory metal nitrides, semiconductors and alloys thereof.
Claim 17
Dependent Claim
25 words
A process according to claim 13, wherein said masking layer is selected from the group consisting of silicon dioxide, silicon nitride, aluminum oxide, and polyimide.
Claim 18
Dependent Claim
98 words
A process for depositing a predetermined thickness of a solid phase material on a substrate, comprising the steps of: flowing predetermined supply gases adjacent said substrate to produce a chemical equilibrium system capable of both depositing and etching said material on and from said substrate, respectively; and cyclicly flowing adjacent said substrate, at least one auxiliary gas selected from the group consisting of said supply gases and gases which are unreactive in said chemical equilibrium system, while continuing to flow said supply gases, to alternatingly stimulate said chemical equilibrium system toward deposition and then etching of said material.
Claim 19
Dependent Claim
98 words
A process for depositing a predetermined thickness of a solid phase material on a substrate, comprising the steps of: flowing predetermined supply gases adjacent said substrate to produce a chemical equilibrium system capable of both depositing and etching said material on and from said substrate, respectively; and cyclicly flowing adjacent said substrate, at least one auxiliary gas selected from the group consisting of said supply gases and gases which are unreactive in said chemical equilibrium system, while continuing to flow said supply gases, to alternatingly stimulate said chemical equilibrium system toward deposition and then etching of said material.
Claim 20
Dependent Claim
25 words
A process according to claim 17 for the deposition of zinc oxide, wherein said supply gases comprise H 2 gas and, optionally, an inert gas.
Claim 21
Dependent Claim
48 words
A process according to claim 17 for the deposition of copper, wherein said supply gases comprise a gas mixture selected from the group consisting of H 2 gas+HX gas and H 2 gas+X 2 gas, where X is Cl, Br, F or I; and, optionally, an inert gas.
Claim 22
Dependent Claim
40 words
A process according to claim 17 for the deposition of aluminum, wherein said supply gases comprise a gas mixture selected from the group consisting of Cl 2 (v), H 2 gas+Cl 2 gas and HCl; and, optionally, an inert gas.
Claim 23
Dependent Claim
36 words
A process according to claim 17, wherein said substrate is selected from the group consisting of refractory metals, nonrefractory metals, refractory metal oxides, nonrefractory metal oxides, refractory metal nitrides, nonrefractory metal nitrides, semiconductors and alloys thereof.
Claim 24
Dependent Claim
42 words
A process according to claim 17, wherein said substrate comprises a microelectronic substrate having a masking layer covering selected portions thereof, said process selectively depositing said predetermined thickness of a solid-phase material on aid microelectronic substrate, but not on said masking layer.
Claim 25
Dependent Claim
13 words
A process according to claim 22, wherein said substrate comprises multiple masking layers.
Claim 26
Dependent Claim
36 words
A process according to claim 17, wherein said material is selected from the group consisting of refractory metals, nonrefractory metals, refractory metal oxides, nonrefractory metal oxides, refractory metal nitrides, nonrefractory metal nitrides, semiconductors and alloys thereof.
Claim 27
Dependent Claim
25 words
A process according to claim 17, wherein said masking layer is selected from the group consisting of silicon dioxide, silicon nitride, aluminum oxide, and polyimide.
Claim 28
Dependent Claim
156 words
A chemical reactor assembly for depositing a predetermined thickness of a solid-phase material on a substrate located within said chemical reactor, said reactor assembly comprising: means for combining a predetermined quantity of supply components to produce a confined vapor-phase chemical equilibrium system capable of both depositing and etching said material; plumbing means for transporting said chemical equilibrium system into contact with said substrate; valve means for flowing into said reactor and into a vapor-phase mixture with said chemical equilibrium system an independent flow of an auxiliary gas; and control means for cyclically modulating said flow of said auxiliary gas into said reactor while maintaining the production and transportation of said chemical equilibrium system therein to alternatively stimulate said system toward deposition and then etching of said material on and from said substrate, said cyclical flow modulation being continued for a duration and at a frequency sufficient to yield net deposition of said material on said substrate.
Claim 29
Dependent Claim
156 words
A chemical reactor assembly for depositing a predetermined thickness of a solid-phase material on a substrate located within said chemical reactor, said reactor assembly comprising: means for combining a predetermined quantity of supply components to produce a confined vapor-phase chemical equilibrium system capable of both depositing and etching said material; plumbing means for transporting said chemical equilibrium system into contact with said substrate; valve means for flowing into said reactor and into a vapor-phase mixture with said chemical equilibrium system an independent flow of an auxiliary gas; and control means for cyclically modulating said flow of said auxiliary gas into said reactor while maintaining the production and transportation of said chemical equilibrium system therein to alternatively stimulate said system toward deposition and then etching of said material on and from said substrate, said cyclical flow modulation being continued for a duration and at a frequency sufficient to yield net deposition of said material on said substrate.
Claim 30
Dependent Claim
42 words
A reactor assembly according to claim 26, wherein said plumbing means comprises a mixing means for receiving said flow of auxiliary gas from said valve means and for mixing said auxiliary gas with said chemical equilibrium system to produce said vapor-phase mixture.
Claim 31
Dependent Claim
46 words
A reactor assembly according to claim 26, further comprising a source region wherein said supply components are combined for the production of said chemical equilibrium system and deposition region located downstream of said source region wherein said chemical equilibrium system comes into contact with said substrate.
Claim 32
Dependent Claim
32 words
A reactor assembly according to claim 28, further comprising a mixing region located between said source and deposition regions, said mixing region receiving the flow of said auxiliary gas into said reactor.
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