US4518455A
Expired / Lapsed
US
⏱️ 0.0 years remaining
CVD Process
Assignee: AT&T Inc
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Filing: 1982-09-02
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Granted: 1985-05-21
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Expires: 2002-09-02
Abstract
Abstract A chemical vapor deposition epitaxial reactor (10) comprised of a quartz tube (12) with banks of IR lamp proximate the outside surface thereof. A splitter plate (30) located at the inlet of the tube (12) separates reactive gases and nonreactive gases directed longitudinally into the tube. The nonreactive gases, directed along the inside surface of the tube (12), substantially prevents unwanted reactant deposition on the inside surface of the tube (12).
Inventors
- 👤 Kevin A. Muething
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 23:54
CPC Classifications
C; C30; C30B; C30B25/00; C30B25/02; C30B25/14
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
110 words
A method for depositing reactants on the surface of a semiconductor wafer positioned in an elongated hollow member in a chemical vapor deposition reactor, the method comprising the steps of: heating the wafer; directing a first gas stream containing gaseous reactant compounds in a gaseous ambient containing hydrogen along the hollow member to deposit reactants on the surface of the heated wafer; and simultaneously directing a second gas stream comprised of the hydrogen-containing gaseous ambient along the hollow member between the gaseous reactant compounds and the inner surface of the hollow member to substantially eliminate the deposition of reactants thereon without interfering with the deposition of reactants on the wafer.
Claim 2
Independent Claim
110 words
A method for depositing reactants on the surface of a semiconductor wafer positioned in an elongated hollow member in a chemical vapor deposition reactor, the method comprising the steps of: heating the wafer; directing a first gas stream containing gaseous reactant compounds in a gaseous ambient containing hydrogen along the hollow member to deposit reactants on the surface of the heated wafer; and simultaneously directing a second gas stream comprised of the hydrogen-containing gaseous ambient along the hollow member between the gaseous reactant compounds and the inner surface of the hollow member to substantially eliminate the deposition of reactants thereon without interfering with the deposition of reactants on the wafer.
Claim 3
Dependent Claim
34 words
The method as set forth in claim 1 wherein the elongated hollow member is a glass tube and the wafer is radiantly heated from a source located proximate the outside surface of the tube.
Claim 4
Dependent Claim
26 words
The method as set forth in claim 1 wherein the velocity of the first gas stream is equal to the velocity of the second gas stream.
Claim 5
Dependent Claim
26 words
The method as set forth in claim 1 wherein the velocity of the second gas stream is greater than the velocity of the first gas stream.
Claim 6
Independent Claim
135 words
A method for depositing reactants on the surface of a semiconductor wafer positioned in an elongated hollow member in a chemical vapor deposition reactor, the method comprising the steps of: heating the wafer; directing a first gas stream containing gaseous reactant compounds in a gaseous ambient containing hydrogen along the hollow member to deposit reactants on the surface of the heated wafer; and simultaneously directing a second gas stream comprised of the hydrogen-containing gaseous ambient along the hollow member between the gaseous reactant compounds and the inner surface of the hollow member at a velocity three times that of said first gas stream thereby decreasing the concentration of the gaseous reactant compounds along the inner surface of the hollow member to substantially eliminate reactant deposition thereon without interfering with the reactant deposition on the wafer.
Claim 7
Independent Claim
135 words
A method for depositing reactants on the surface of a semiconductor wafer positioned in an elongated hollow member in a chemical vapor deposition reactor, the method comprising the steps of: heating the wafer; directing a first gas stream containing gaseous reactant compounds in a gaseous ambient containing hydrogen along the hollow member to deposit reactants on the surface of the heated wafer; and simultaneously directing a second gas stream comprised of the hydrogen-containing gaseous ambient along the hollow member between the gaseous reactant compounds and the inner surface of the hollow member at a velocity three times that of said first gas stream thereby decreasing the concentration of the gaseous reactant compounds along the inner surface of the hollow member to substantially eliminate reactant deposition thereon without interfering with the reactant deposition on the wafer.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1988-05-20 | 1988-11-19 | 1989-05-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1992-05-20 | 1992-11-19 | 1993-05-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1996-05-20 | 1996-11-19 | 1997-05-21 | $7700.00 | Window Closed / Lapsed |