US5173446A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semiconductor substrate manufacturing by recrystallization using a cooling medium
Assignee: Ricoh Co Ltd
•
Filing: 1991-06-13
•
Granted: 1992-12-22
•
Expires: 2011-06-13
Abstract
Abstract A semiconductor substrate comprises a foundation, a semiconductor monocrystalline film formed on the foundation, and a high-melting-point metal film or a high-melting-point metal alloy film disposed in at least part of a region between the semiconductor monocrystalline film and the foundation. The high-melting-point metal film disposed below the semiconductor monocrystalline film can be utilized as a conductor in a semiconductor device.
Inventors
- 👤 Toshifumi Asakawa
- 👤 Daisuke Kosaka
- 👤 Haruo Nakayama
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 07:22
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/29; H10P14/2926; H10D; H10D84/00; H10D84/01; H10D84/02; H10D84/03; H10D84/038; H10D88/00; H10D88/01; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/2921; H10P14/32; H10P14/3202; H10P14/3238; H10P14/3241; H10P14/3242; H10P14/3244; H10P14/3248; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3414; H10P14/3421; H10P14/3451; H10P14/3452; H10P14/3458; H10P14/38; H10P14/3802; H10P14/3808; H10P14/3814; H10P14/3818; H10P14/382; H10P34/00; H10P34/40; H10P34/42; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10W; H10W10/00; H10W10/01; H10W10/061; H10W10/10; H10W10/181; H10W20/00; H10W20/01; H10W20/021; H10P90/1912; H10W10/011; H10W10/012; H10W10/13; Y; Y10; Y10S; Y10S117/00; Y10S117/903; Y10S117/904; Y10S117/905
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
93 words
A method of manufacturing a semiconductor substrate, comprising the steps of: depositing an amorphous semiconductor film or a polycrystalline semiconductor film on a foundation covered at least partly with a high-melting-point metal film or a high-melting-point metal alloy film; disposing a transparent cooling medium on said semiconductor film; melting said semiconductor film by irradiating said semiconductor film with energy through said transparent cooling medium to improve the uniformity of the distribution of heat in said semiconductor film irradiated with energy; and growing a single-crystal region in said semiconductor film irradiated with said energy.
Claim 2
Independent Claim
93 words
A method of manufacturing a semiconductor substrate, comprising the steps of: depositing an amorphous semiconductor film or a polycrystalline semiconductor film on a foundation covered at least partly with a high-melting-point metal film or a high-melting-point metal alloy film; disposing a transparent cooling medium on said semiconductor film; melting said semiconductor film by irradiating said semiconductor film with energy through said transparent cooling medium to improve the uniformity of the distribution of heat in said semiconductor film irradiated with energy; and growing a single-crystal region in said semiconductor film irradiated with said energy.
Claim 3
Dependent Claim
18 words
A method according to claim 1, in which said irradiated energy comprises energy applied by a laser beam.
Claim 4
Dependent Claim
17 words
A method according to claim 1, in which said transparent cooling medium comprises a liquid organic compound.
Claim 5
Dependent Claim
38 words
A method according to claim 1, in which said irradiated energy comprises energy selected from the group consisting of energy applied by a light beam, energy applied by an electron beam, and energy applied by a heat ray.
Claim 6
Dependent Claim
25 words
A method according to claim 3, in which said liquid organic compound has a melting point which is higher than that of said semiconductor film.
Claim 7
Dependent Claim
30 words
A method according to claim 3, in which said liquid organic compound comprises a material selected from the group consisting of polyethylene glycol, polyethylene ether, polyethylene ester and polyethylene oxide.
Claim 8
Independent Claim
170 words
A method of manufacturing a solid state structure, comprising: providing a foundation of an electrically isolating material having an upper surface covered at least partly with a metal film; forming a polycrystalline semiconductor film or an amorphous semiconductor film over said foundation and over said metal film, the melting point of said metal film being higher than that of said semiconductor film; irradiating said semiconductor film with radiant energy which passes through said semiconductor film and reaches said metal film to monocrystallize said semiconductor film; forming grooves dividing said metal film into laterally spaced patches and dividing said monocrystallized semiconductor film at least into islands which are over the respective ones of said patches of said metal film, said grooves eclectically isolating said islands from each other in a lateral direction, and forming respective active devices at said islands and making electrical contact to selected portions of said active devices by making eclectrically conductive interior portions of said grooves which contact respective ones of said patches of said metal film.
Claim 9
Independent Claim
170 words
A method of manufacturing a solid state structure, comprising: providing a foundation of an electrically isolating material having an upper surface covered at least partly with a metal film; forming a polycrystalline semiconductor film or an amorphous semiconductor film over said foundation and over said metal film, the melting point of said metal film being higher than that of said semiconductor film; irradiating said semiconductor film with radiant energy which passes through said semiconductor film and reaches said metal film to monocrystallize said semiconductor film; forming grooves dividing said metal film into laterally spaced patches and dividing said monocrystallized semiconductor film at least into islands which are over the respective ones of said patches of said metal film, said grooves eclectically isolating said islands from each other in a lateral direction, and forming respective active devices at said islands and making electrical contact to selected portions of said active devices by making eclectrically conductive interior portions of said grooves which contact respective ones of said patches of said metal film.
Claim 10
Dependent Claim
33 words
A method according to claim 7, in which said irradiating step comprises melting a region of said semiconductor film and causing said region to move relative to said semiconductor film to effect monocrystallizing.
Claim 11
Independent Claim
146 words
A method of manufacturing a solid state structure, comprising the steps of: providing a foundation of an electrically isolating material having an upper surface covered with a first metal film, and providing a second metal film over said first metal film, said second metal film being in the form of laterally spaced patches which are eclectically isolated from said first metal film by laterally spaced portions of an electrically insulating film, said insulating film being disposed between said first metal film and said second metal film; forming a polycrystalline semiconductor film or an amorphous semiconductor film over said foundation and over said second metal film, the melting point of said first metal film being higher than that of said semiconductor film; and irradiating said semiconductor film with radiant energy which passes through said semiconductor film and reaches said first metal film to monocrystallize said semiconductor film.
Claim 12
Independent Claim
146 words
A method of manufacturing a solid state structure, comprising the steps of: providing a foundation of an electrically isolating material having an upper surface covered with a first metal film, and providing a second metal film over said first metal film, said second metal film being in the form of laterally spaced patches which are eclectically isolated from said first metal film by laterally spaced portions of an electrically insulating film, said insulating film being disposed between said first metal film and said second metal film; forming a polycrystalline semiconductor film or an amorphous semiconductor film over said foundation and over said second metal film, the melting point of said first metal film being higher than that of said semiconductor film; and irradiating said semiconductor film with radiant energy which passes through said semiconductor film and reaches said first metal film to monocrystallize said semiconductor film.
Claim 13
Dependent Claim
36 words
A method according to claim 9 including dividing said monocrystallized semiconductor film into first islands which are over said patches of said second metal film and second islands which are directly on said first metal film.
Claim 14
Dependent Claim
27 words
A method according to claim 10 including making selected electrical contacts to said first and second metal films by making eclectically conductive interior portions of said grooves.
References Cited (Backward Citations)
US4059461A
Cited
US4292091A
Cited
JPS5638057A
Cited
EP0047140A2
Cited
EP0057135A2
Cited
EP0078681A2
Cited
US4415383A
Cited
US4523962A
Cited
JPS59175721A
Cited
US4545823A
Cited
JPS6163019A
Cited
US4659587A
Cited
JPS61102723A
Cited
DD234529A1
Cited
DE3508469A1
Cited
DE3620300A1
Cited
JPS624085A
Cited
US4822752A
Cited
JPS62219510A
Cited
US4822751A
Cited
US4717681A
Cited
US4752590A
Cited
US4826785A
Cited
JPH01227423A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-12-22 | 1996-06-22 | 1996-12-22 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-12-22 | 2000-06-22 | 2000-12-22 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-12-22 | 2004-06-22 | 2004-12-22 | $7700.00 | Window Closed / Lapsed |