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US5173446A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor substrate manufacturing by recrystallization using a cooling medium

Assignee: Ricoh Co Ltd
•
Filing: 1991-06-13
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Granted: 1992-12-22
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Expires: 2011-06-13
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Abstract

Abstract A semiconductor substrate comprises a foundation, a semiconductor monocrystalline film formed on the foundation, and a high-melting-point metal film or a high-melting-point metal alloy film disposed in at least part of a region between the semiconductor monocrystalline film and the foundation. The high-melting-point metal film disposed below the semiconductor monocrystalline film can be utilized as a conductor in a semiconductor device.

Inventors

  • 👤 Toshifumi Asakawa
  • 👤 Daisuke Kosaka
  • 👤 Haruo Nakayama

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 07:22
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/29; H10P14/2926; H10D; H10D84/00; H10D84/01; H10D84/02; H10D84/03; H10D84/038; H10D88/00; H10D88/01; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/2921; H10P14/32; H10P14/3202; H10P14/3238; H10P14/3241; H10P14/3242; H10P14/3244; H10P14/3248; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3414; H10P14/3421; H10P14/3451; H10P14/3452; H10P14/3458; H10P14/38; H10P14/3802; H10P14/3808; H10P14/3814; H10P14/3818; H10P14/382; H10P34/00; H10P34/40; H10P34/42; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10W; H10W10/00; H10W10/01; H10W10/061; H10W10/10; H10W10/181; H10W20/00; H10W20/01; H10W20/021; H10P90/1912; H10W10/011; H10W10/012; H10W10/13; Y; Y10; Y10S; Y10S117/00; Y10S117/903; Y10S117/904; Y10S117/905

Claims Analysis

Total Claims: 14
Claim 1
Independent Claim 93 words
A method of manufacturing a semiconductor substrate, comprising the steps of: depositing an amorphous semiconductor film or a polycrystalline semiconductor film on a foundation covered at least partly with a high-melting-point metal film or a high-melting-point metal alloy film; disposing a transparent cooling medium on said semiconductor film; melting said semiconductor film by irradiating said semiconductor film with energy through said transparent cooling medium to improve the uniformity of the distribution of heat in said semiconductor film irradiated with energy; and growing a single-crystal region in said semiconductor film irradiated with said energy.
Claim 2
Independent Claim 93 words
A method of manufacturing a semiconductor substrate, comprising the steps of: depositing an amorphous semiconductor film or a polycrystalline semiconductor film on a foundation covered at least partly with a high-melting-point metal film or a high-melting-point metal alloy film; disposing a transparent cooling medium on said semiconductor film; melting said semiconductor film by irradiating said semiconductor film with energy through said transparent cooling medium to improve the uniformity of the distribution of heat in said semiconductor film irradiated with energy; and growing a single-crystal region in said semiconductor film irradiated with said energy.
Claim 3
Dependent Claim 18 words
A method according to claim 1, in which said irradiated energy comprises energy applied by a laser beam.
Claim 4
Dependent Claim 17 words
A method according to claim 1, in which said transparent cooling medium comprises a liquid organic compound.
Claim 5
Dependent Claim 38 words
A method according to claim 1, in which said irradiated energy comprises energy selected from the group consisting of energy applied by a light beam, energy applied by an electron beam, and energy applied by a heat ray.
Claim 6
Dependent Claim 25 words
A method according to claim 3, in which said liquid organic compound has a melting point which is higher than that of said semiconductor film.
Claim 7
Dependent Claim 30 words
A method according to claim 3, in which said liquid organic compound comprises a material selected from the group consisting of polyethylene glycol, polyethylene ether, polyethylene ester and polyethylene oxide.
Claim 8
Independent Claim 170 words
A method of manufacturing a solid state structure, comprising: providing a foundation of an electrically isolating material having an upper surface covered at least partly with a metal film; forming a polycrystalline semiconductor film or an amorphous semiconductor film over said foundation and over said metal film, the melting point of said metal film being higher than that of said semiconductor film; irradiating said semiconductor film with radiant energy which passes through said semiconductor film and reaches said metal film to monocrystallize said semiconductor film; forming grooves dividing said metal film into laterally spaced patches and dividing said monocrystallized semiconductor film at least into islands which are over the respective ones of said patches of said metal film, said grooves eclectically isolating said islands from each other in a lateral direction, and forming respective active devices at said islands and making electrical contact to selected portions of said active devices by making eclectrically conductive interior portions of said grooves which contact respective ones of said patches of said metal film.
Claim 9
Independent Claim 170 words
A method of manufacturing a solid state structure, comprising: providing a foundation of an electrically isolating material having an upper surface covered at least partly with a metal film; forming a polycrystalline semiconductor film or an amorphous semiconductor film over said foundation and over said metal film, the melting point of said metal film being higher than that of said semiconductor film; irradiating said semiconductor film with radiant energy which passes through said semiconductor film and reaches said metal film to monocrystallize said semiconductor film; forming grooves dividing said metal film into laterally spaced patches and dividing said monocrystallized semiconductor film at least into islands which are over the respective ones of said patches of said metal film, said grooves eclectically isolating said islands from each other in a lateral direction, and forming respective active devices at said islands and making electrical contact to selected portions of said active devices by making eclectrically conductive interior portions of said grooves which contact respective ones of said patches of said metal film.
Claim 10
Dependent Claim 33 words
A method according to claim 7, in which said irradiating step comprises melting a region of said semiconductor film and causing said region to move relative to said semiconductor film to effect monocrystallizing.
Claim 11
Independent Claim 146 words
A method of manufacturing a solid state structure, comprising the steps of: providing a foundation of an electrically isolating material having an upper surface covered with a first metal film, and providing a second metal film over said first metal film, said second metal film being in the form of laterally spaced patches which are eclectically isolated from said first metal film by laterally spaced portions of an electrically insulating film, said insulating film being disposed between said first metal film and said second metal film; forming a polycrystalline semiconductor film or an amorphous semiconductor film over said foundation and over said second metal film, the melting point of said first metal film being higher than that of said semiconductor film; and irradiating said semiconductor film with radiant energy which passes through said semiconductor film and reaches said first metal film to monocrystallize said semiconductor film.
Claim 12
Independent Claim 146 words
A method of manufacturing a solid state structure, comprising the steps of: providing a foundation of an electrically isolating material having an upper surface covered with a first metal film, and providing a second metal film over said first metal film, said second metal film being in the form of laterally spaced patches which are eclectically isolated from said first metal film by laterally spaced portions of an electrically insulating film, said insulating film being disposed between said first metal film and said second metal film; forming a polycrystalline semiconductor film or an amorphous semiconductor film over said foundation and over said second metal film, the melting point of said first metal film being higher than that of said semiconductor film; and irradiating said semiconductor film with radiant energy which passes through said semiconductor film and reaches said first metal film to monocrystallize said semiconductor film.
Claim 13
Dependent Claim 36 words
A method according to claim 9 including dividing said monocrystallized semiconductor film into first islands which are over said patches of said second metal film and second islands which are directly on said first metal film.
Claim 14
Dependent Claim 27 words
A method according to claim 10 including making selected electrical contacts to said first and second metal films by making eclectically conductive interior portions of said grooves.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-12-22 1996-06-22 1996-12-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-12-22 2000-06-22 2000-12-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-12-22 2004-06-22 2004-12-22 $7700.00 Window Closed / Lapsed

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