Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
325 words
A semiconductor device which comprises: a semiconductor substrate made of a single crystal semiconductor substance; an insulating film formed locally at a predetermined region on a main surface of the substrate; a polycrystalline semiconductor layer formed on said insulating film; a single crystal semiconductor layer formed on said substrate and on said polycrystalline semiconductor layer; at least one isolation region formed to extend from a top main surface of said single crystal semiconductor layer to at least a surface of said insulating film, through said polycrystalline semiconductor layer and formed substantially vertical to a surface of the substrate, so as to electrically isolate at least a first portion formed in said single crystal semiconductor layer which is provided on said insulating film and surrounded by said isolation region, from a second portion formed in said single crystal semiconductor layer which is provided on said substrate, and not surrounded by said isolation region; at least a first semiconductor device formed on a main surface of or inside said first portion, for controlling a device formed in a main surface of or inside said second portion; and at least a second semiconductor device formed on said main surface of or inside said single crystal semiconductor layer forming said second portion on said substrate and not provided with said insulating film thereon, and using another main surface of the substrate opposite to said main surface having said insulating film thereon as a drain electrode to form a power semiconductor device using said second semiconductor device which is controlled by said first semiconductor device, wherein said single crystal semiconductor layer formed on a surface of said substrate in said second portion comprises at least two different unit layers having different amounts of impurities therein, respectively, one of said unit layers adjacent to said substrate has a surface in a same plane as a surface of said polycrystalline semiconductor layer that is formed on the surface of said insulating film.
Claim 2
Dependent Claim
325 words
A semiconductor device which comprises: a semiconductor substrate made of a single crystal semiconductor substance; an insulating film formed locally at a predetermined region on a main surface of the substrate; a polycrystalline semiconductor layer formed on said insulating film; a single crystal semiconductor layer formed on said substrate and on said polycrystalline semiconductor layer; at least one isolation region formed to extend from a top main surface of said single crystal semiconductor layer to at least a surface of said insulating film, through said polycrystalline semiconductor layer and formed substantially vertical to a surface of the substrate, so as to electrically isolate at least a first portion formed in said single crystal semiconductor layer which is provided on said insulating film and surrounded by said isolation region, from a second portion formed in said single crystal semiconductor layer which is provided on said substrate, and not surrounded by said isolation region; at least a first semiconductor device formed on a main surface of or inside said first portion, for controlling a device formed in a main surface of or inside said second portion; and at least a second semiconductor device formed on said main surface of or inside said single crystal semiconductor layer forming said second portion on said substrate and not provided with said insulating film thereon, and using another main surface of the substrate opposite to said main surface having said insulating film thereon as a drain electrode to form a power semiconductor device using said second semiconductor device which is controlled by said first semiconductor device, wherein said single crystal semiconductor layer formed on a surface of said substrate in said second portion comprises at least two different unit layers having different amounts of impurities therein, respectively, one of said unit layers adjacent to said substrate has a surface in a same plane as a surface of said polycrystalline semiconductor layer that is formed on the surface of said insulating film.
Claim 3
Dependent Claim
60 words
A semiconductor device according to claim 1, wherein said isolation region consists of a groove extended from a top surface of said single crystal semiconductor layer to at least a surface of said insulating film, a wall portion thereof being made of the insulating film and a portion existing between said wall portion thereof being filled with the polycrystalline semiconductor.
Claim 4
Dependent Claim
66 words
A semiconductor device according to claim 1, wherein said first portion is provided with a bottom portion comprising a single cry stal semiconductor layer and a polycrystalline semiconductor layer, while on a main side surface of said first portion, mainly a single crystal semiconductor layer is in contact with said isolation region through an insulating film formed on an inner side surface of said isolation region.