Patent US5119314A successfully refreshed from Google Patents.
US5119314A
Expired / Lapsed
US
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Semiconductor integrated circuit device
Assignee: Hitachi Ltd
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Filing: 1989-11-28
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Granted: 1992-06-02
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Expires: 2009-11-28
Abstract
Abstract A semiconductor integrated circuit device which can operate at high speed and involves a low power consumption and a high integration density, wherein a Bi-CMOS basic cell and a Bi-CMOS macro cell are employed to define a critical path and a CMOS basic cell and a CMOS macro cell are employed for a portion of the device other than the critical path.
Inventors
- 👤 Takashi Hotta
- 👤 Masahiro Iwamura
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 13:20
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/90; H10D84/996; G; G06; G06F; G06F30/00; G06F30/30; G06F30/39; Y; Y10; Y10S; Y10S257/00; Y10S257/923
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
210 words
A method of manufacturing a standard cell semiconductor integrated circuit device incorporating a first macro cell including CMOS gates without bipolar gates and a second macro cell including bipolar and CMOS gates comprising: a function design step; a logic design step where a desired logic according to said function design step is assembled using logical macro cells included in a prepared logical cell library; evaluating a plurality of paths for said semiconductor integrated circuit device, and determining at least a first path which has a delay time greater than a predetermined delay time specification; allotting physical cells to the logical macro cells with reference to a physical cell library where a set of a plurality of physical cells having the same logic function including the first macro cell and the second macro cell are prepared, wherein the first macro cell is allotted in areas of said integrated circuit other than said first path and wherein the second macro cell is allotted in a portion of the integrated circuit which defines said first path to reduce delay time along said first path; and returning to said logic design step when the predetermined delay time specification is not satisfied even by the allotment of the second macro cell in said first path.
Claim 2
Independent Claim
210 words
A method of manufacturing a standard cell semiconductor integrated circuit device incorporating a first macro cell including CMOS gates without bipolar gates and a second macro cell including bipolar and CMOS gates comprising: a function design step; a logic design step where a desired logic according to said function design step is assembled using logical macro cells included in a prepared logical cell library; evaluating a plurality of paths for said semiconductor integrated circuit device, and determining at least a first path which has a delay time greater than a predetermined delay time specification; allotting physical cells to the logical macro cells with reference to a physical cell library where a set of a plurality of physical cells having the same logic function including the first macro cell and the second macro cell are prepared, wherein the first macro cell is allotted in areas of said integrated circuit other than said first path and wherein the second macro cell is allotted in a portion of the integrated circuit which defines said first path to reduce delay time along said first path; and returning to said logic design step when the predetermined delay time specification is not satisfied even by the allotment of the second macro cell in said first path.
Claim 3
Dependent Claim
23 words
A method of manufacturing according to claim 1, wherein the first path has the largest delay time of the plurality of evaluated paths.
Claim 4
Independent Claim
200 words
A method of manufacturing a standard cell semiconductor integrated circuit device incorporating a first polycell including CMOS gates without bipolar gates and a second polycell including bipolar and CMOS gates comprising: a function design step; a logic design step where a desired logic according to said function design step is assembled using logical polycells included in a prepared logical cell library; evaluating a plurality of paths for said semiconductor integrated circuit device, and determining at least a first path which has a delay time greater than a predetermined delay time specification; allotting physical cells to the logical polycells with reference to a physical cell library where a set of a plurality of physical cells having the same logic function including the first polycell and the second polycell are prepared, wherein the first polycell is allotted in areas of said integrated circuit other than said first path and the second polycell is allotted in a portion of the integrated circuit which defines said first path to reduce delay time along said first path; and returning to said logic design step when the predetermined delay time specification is not satisfied even by the allotment of the second polycell in said first path.
Claim 5
Independent Claim
200 words
A method of manufacturing a standard cell semiconductor integrated circuit device incorporating a first polycell including CMOS gates without bipolar gates and a second polycell including bipolar and CMOS gates comprising: a function design step; a logic design step where a desired logic according to said function design step is assembled using logical polycells included in a prepared logical cell library; evaluating a plurality of paths for said semiconductor integrated circuit device, and determining at least a first path which has a delay time greater than a predetermined delay time specification; allotting physical cells to the logical polycells with reference to a physical cell library where a set of a plurality of physical cells having the same logic function including the first polycell and the second polycell are prepared, wherein the first polycell is allotted in areas of said integrated circuit other than said first path and the second polycell is allotted in a portion of the integrated circuit which defines said first path to reduce delay time along said first path; and returning to said logic design step when the predetermined delay time specification is not satisfied even by the allotment of the second polycell in said first path.
Claim 6
Dependent Claim
23 words
A method of manufacturing according to claim 3, wherein the first path has the largest delay time of the plurality of evaluated paths.
Claim 7
Independent Claim
314 words
A method of manufacturing a standard cell semiconductor integrated circuit device incorporating a first macro cell including CMOS gates without bipolar gates, a second macro cell including bipolar and CMOS gates, a first polycell including CMOS gates without bipolar gates and a second polycell including bipolar and CMOS gates comprising: a function design step; a logic design step where a desired logic according to said function design step is assembled using logical macro cells and logical polycells including in a prepared logic cell library; evaluating a plurality of paths for said semiconductor integrated circuit device, and determining at least a first path which has a delay time greater than a predetermined delay time specification; allotting physical cells to the logical macro cells with reference to a physical cell library where a set of a plurality of physical cells having the same logic function including the first macro cell and the second macro cell are prepared, wherein the first macro cell is allotted in areas of said integrated circuit other than said first path and the second macro cell is allotted in a portion of the integrated circuit which defines said first path to reduce delay time along said first path; allotting physical cells to the logical polycells with reference to a physical cell library where a set of a plurality of physical cells having the same logic function including the first polycell and the second polycell are prepared, wherein the first polycell is allotted in areas of said integrated circuit other than said first path and said second polycell is allotted in a portion of the integrated circuit which defines said first path to reduce delay time along said first path; and returning to said logic design step when the predetermined delay time specification is not satisfied even by the allotment with the second macro cell and the second polycell in said first path.
Claim 8
Independent Claim
314 words
A method of manufacturing a standard cell semiconductor integrated circuit device incorporating a first macro cell including CMOS gates without bipolar gates, a second macro cell including bipolar and CMOS gates, a first polycell including CMOS gates without bipolar gates and a second polycell including bipolar and CMOS gates comprising: a function design step; a logic design step where a desired logic according to said function design step is assembled using logical macro cells and logical polycells including in a prepared logic cell library; evaluating a plurality of paths for said semiconductor integrated circuit device, and determining at least a first path which has a delay time greater than a predetermined delay time specification; allotting physical cells to the logical macro cells with reference to a physical cell library where a set of a plurality of physical cells having the same logic function including the first macro cell and the second macro cell are prepared, wherein the first macro cell is allotted in areas of said integrated circuit other than said first path and the second macro cell is allotted in a portion of the integrated circuit which defines said first path to reduce delay time along said first path; allotting physical cells to the logical polycells with reference to a physical cell library where a set of a plurality of physical cells having the same logic function including the first polycell and the second polycell are prepared, wherein the first polycell is allotted in areas of said integrated circuit other than said first path and said second polycell is allotted in a portion of the integrated circuit which defines said first path to reduce delay time along said first path; and returning to said logic design step when the predetermined delay time specification is not satisfied even by the allotment with the second macro cell and the second polycell in said first path.
Claim 9
Dependent Claim
23 words
A method of manufacturing according to claim 5, wherein the first path has the largest delay time of the plurality of evaluated paths.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-06-02 | 1995-12-02 | 1996-06-02 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-06-02 | 1999-12-02 | 2000-06-02 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-06-02 | 2003-12-02 | 2004-06-02 | $7700.00 | Window Closed / Lapsed |