Patent US5113236A successfully refreshed from Google Patents.
US5113236A
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Integrated circuit device particularly adapted for high voltage applications
Assignee: FGP CORP
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Filing: 1990-12-14
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Granted: 1992-05-12
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Expires: 2010-12-14
Abstract
Abstract A silicon on insulator of integrated circuit comprising a plurality of components typically adopted for high voltage application having a semiconductor substrate of a first conductivity type, an insulating layer provided on the substrate, a semiconductor layer provided on the insulating layer, a number of laterally separated circuit elements forming parts of a number of subcircuits provided in the semiconductor layer, a diffusion layer of a second conductivity type opposite to that of the first conductivity type provided in the substrate and laterally separated from all the other circuit elements and means for holding the diffusion layer at a voltage at least equal to that of the highest potential of any of the subcircuits present in the integrated device.
Inventors
- 👤 Emil Arnold
- 👤 Steven L. Merchant
- 👤 Peter W. Shackle
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 13:39
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/60; H10D1/62; H10D1/66; H10D30/00; H10D30/60; H10D30/64; H10D30/65; H10D30/657; H10D30/67; H10D30/6704; H10D30/6713; H10D30/6715; H10D30/6717; H10D88/00; H10P; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10W; H10W10/00; H10W10/01; H10W10/051; H10W10/061; H10W10/10; H10W10/181; H10W10/50; H10P90/1908; H10W10/011; H10W10/014; H10W10/17
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
108 words
An integrated circuit device exhibiting improved voltage breakdown properties, comprising a semiconductor foundational substrate of a resistivity greater than about 100 ohm-cm of a first conductivity type, an insulating layer provided on said substrate, a semiconductor layer provided on said insulating layer, a plurality of laterally separated circuit elements forming parts of subcircuits provided in said semiconductor layer, a diffusion area of a second conductivity type, opposite to said first conductivity type, provided in said substrate, underlying none of said circuit elements and means for contacting and holding said diffusion area at a voltage at least equal to the highest potential of any subcircuit in said circuit device.
Claim 2
Dependent Claim
108 words
An integrated circuit device exhibiting improved voltage breakdown properties, comprising a semiconductor foundational substrate of a resistivity greater than about 100 ohm-cm of a first conductivity type, an insulating layer provided on said substrate, a semiconductor layer provided on said insulating layer, a plurality of laterally separated circuit elements forming parts of subcircuits provided in said semiconductor layer, a diffusion area of a second conductivity type, opposite to said first conductivity type, provided in said substrate, underlying none of said circuit elements and means for contacting and holding said diffusion area at a voltage at least equal to the highest potential of any subcircuit in said circuit device.
Claim 3
Dependent Claim
24 words
The integrated circuit device of claim 1, wherein said substrate is a p-type semiconductor substrate and said diffusion area is a n-type diffusion area.
Claim 4
Dependent Claim
22 words
The integrated circuit device of claim 2, wherein the substrate is a p-type silicon substrate and the insulating layer is silicon dioxide.
Claim 5
Dependent Claim
17 words
The integrated circuit device of claim 3 wherein the semiconducting layer is substantially n-type monocrystalline silicon layer.
Claim 6
Dependent Claim
20 words
The integrated circuit device of claim 3, wherein a single diffusion area is provided for a multiplicity of circuit components.
Claim 7
Dependent Claim
40 words
The integrated circuit device of claim 3 wherein the diffusion layer is held at a voltage higher than the highest potential of any subcircuit in said integrated circuit device and said diffusion area is provided with a separate potential source.
Claim 8
Dependent Claim
119 words
An integrated circuit device exhibiting improved voltage breakdown properties, particularly adapted for high voltage applications, comprising a relatively high resistivity semiconductor foundational substrate of a first conductivity type, an insulating layer provided on said substrate, a semiconductor layer of a second conductivity type opposite to said first conductivity type provided on said insulating layer, a plurality of circuit elements forming parts of subcircuits provided in said semiconductor layer, a diffusion area of said second conductivity type provided in said semiconductor layer, underlying none of said circuit elements, said diffusion area having no overlying circuit element, and means for holding said diffusion area at a voltage at least equal to the highest potential of any subcircuit in said circuit device.
Claim 9
Dependent Claim
119 words
An integrated circuit device exhibiting improved voltage breakdown properties, particularly adapted for high voltage applications, comprising a relatively high resistivity semiconductor foundational substrate of a first conductivity type, an insulating layer provided on said substrate, a semiconductor layer of a second conductivity type opposite to said first conductivity type provided on said insulating layer, a plurality of circuit elements forming parts of subcircuits provided in said semiconductor layer, a diffusion area of said second conductivity type provided in said semiconductor layer, underlying none of said circuit elements, said diffusion area having no overlying circuit element, and means for holding said diffusion area at a voltage at least equal to the highest potential of any subcircuit in said circuit device.
Claim 10
Dependent Claim
32 words
The integrated circuit device of claim 7 wherein the substrate is a p-type semiconductor substrate, the semiconductor layer is an n-type semiconductor layer, and the diffusion area is an n-type diffusion area.
Claim 11
Dependent Claim
31 words
The integrated circuit device of claim 8 wherein the substrate is a p-type silicon substrate, the insulating layer is silicon dioxide and the semiconductor layer is substantially n-type monocrystalline silicon layer.
Claim 12
Dependent Claim
39 words
An integrated circuit device of claim 9 wherein the diffusion area is held at a voltage higher than the highest potential of any subcircuit in said integrated circuit device and said diffusion area provided with a separate potential source.
Claim 13
Dependent Claim
108 words
A semiconductor-on-insulator lateral MOS transistor source-follower bridge structure exhibiting improved voltage breakdown properties, particularly adapted for high voltage applications comprising a semiconductor foundational substrate of a first conductivity type, an insulating layer provided on said substrate, a semiconducting layer provided on said insulating layer, drain, gate, source and interconnect portions of said transistor provided in said semiconductor layer, a diffusion area of a second conductivity type, opposite to said first conductivity type, provided in said substrate, underlying none of said drain, gate and source portions and means for holding said diffusion area at a voltage at least equal to the highest potential of said drain and source portions.
Claim 14
Dependent Claim
108 words
A semiconductor-on-insulator lateral MOS transistor source-follower bridge structure exhibiting improved voltage breakdown properties, particularly adapted for high voltage applications comprising a semiconductor foundational substrate of a first conductivity type, an insulating layer provided on said substrate, a semiconducting layer provided on said insulating layer, drain, gate, source and interconnect portions of said transistor provided in said semiconductor layer, a diffusion area of a second conductivity type, opposite to said first conductivity type, provided in said substrate, underlying none of said drain, gate and source portions and means for holding said diffusion area at a voltage at least equal to the highest potential of said drain and source portions.
Claim 15
Dependent Claim
22 words
The structure of claim 11 wherein said substrate is a p-type semiconductor substrate and said diffusion area is a n-type diffusion area.
Claim 16
Dependent Claim
19 words
The structure of claim 12 wherein the substrate is p-type silicon substrate and the insulating layer is silicon dioxide.
Claim 17
Dependent Claim
15 words
The structure of claim 13 wherein the semiconductor layer is substantially n-type monocrystalline silicon layer.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-05-12 | 1995-11-11 | 1996-05-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-05-12 | 1999-11-11 | 2000-05-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-05-12 | 2003-11-11 | 2004-05-12 | $7700.00 | Window Closed / Lapsed |