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US5008733A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor device

Assignee: DuPont Toray Specialty Materials KK
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Filing: 1988-02-26
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Granted: 1991-04-16
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Expires: 2008-02-26
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Abstract

Abstract A semiconductor device (1) in which a heat-bondable cured silicone (7) is applied and heat-bonded to the surface of only a predetermined principal portion of the semiconductor device so as not to contact bonding wires (3), flip chip solder portions (8) or beam leads, in order to protect the surface of the principal portion, and a seal layer (6) or (10) is provided after the heat bonding of the cured silicone. The cured silicone (7) is preferably in the form of a film, and a heat-resistant base material (12) may be laminated to one side of the cured silicone. Breaking of bonding wires (3), cracking of solder portions (8) and separation of beam leads do not occur because only the portion to be protected can be protected by coating with the cured silicone (7) and the portion not to be protected is not so coated. Moreover, sisnce there is no contamination caused by a silicone exhalation, the occurrence of a defective bonding and the separation of a sealing resin can be prevented. The seal layers (6 ) and (10) are each constituted by a hermetic seal or a resin seal.

Inventors

  • 👤 Katsutoshi Mine
  • 👤 Yoshitsugu Morita
  • 👤 Satoshi Miyamae

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 12:36
CPC Classifications
H; H10; H10W; H10W76/00; H10W76/10; H10W76/12; H10W76/15; H10W76/157; H10W74/00; H10W74/10; H10W74/111; H10W74/121; H10W74/131; H10W74/137; H10W72/00; H10W72/01; H10W72/015; H10W72/01515; H10W72/071; H10W72/075; H10W72/50; H10W72/521; H10W72/522; H10W72/531; H10W72/5363; H10W72/551; H10W72/552; H10W72/5522; H10W72/5524; H10W90/00; H10W90/701; H10W90/721; H10W90/724; H10W90/751; H10W90/756

Claims Analysis

Total Claims: 16
Claim 1
Independent Claim 39 words
A process for forming a semiconductor device having a protective coating which comprises applying a heat-bondable, previously cured silicone to at least a major portion of the surface of the semiconductor device and heat-bonding the silicone to said surface.
Claim 2
Dependent Claim 39 words
A process for forming a semiconductor device having a protective coating which comprises applying a heat-bondable, previously cured silicone to at least a major portion of the surface of the semiconductor device and heat-bonding the silicone to said surface.
Claim 3
Dependent Claim 39 words
The process device as set forth in claim 1, which is a wire bonding type semiconductor device with said heat-bondable cured silicone applied and heat-bonded to the surface of at least a principal portion thereof without contacting bonding wires.
Claim 4
Dependent Claim 38 words
The semiconductor device as set forth in claim 1, which is a flip chip type semiconductor device with said heat-bonded cured silicone applied and heat-bonded to the surface of at least a principal portion thereof without contacting solder.
Claim 5
Dependent Claim 39 words
The process device as set forth in claim 1, which is a beam lead type semiconductor device with said heat-bondable cured silicone applied and heat-bonded to the surface of at least a principal portion thereof without contacting beam leads.
Claim 6
Dependent Claim 31 words
The process device as set forth in any one of claims 2, 3 and 4, wherein said principal portion of the semiconductor device is a principal portion of a semiconductor chip.
Claim 7
Dependent Claim 20 words
The process device as set forth in claim 1, wherein said heat-bondable cured silicone is a heat-bondable silicone rubber film.
Claim 8
Dependent Claim 28 words
The process device as set forth in claim 6, wherein the thickness of said heat-bondable silicone rubber film is in the range of 30 microns to 1 millimeter.
Claim 9
Dependent Claim 20 words
The process device as set forth in claim 1, wherein said heat-bondable cured silicone is a heat-bondable silicone resin film.
Claim 10
Dependent Claim 28 words
The process device as set forth in claim 8, wherein the thickness of said heat-bondable silicone resin film is in the range of 30 microns to 1 millimeter.
Claim 11
Dependent Claim 24 words
The process device as set forth in claim 1, wherein a heat-resistant base material is laminated to one side of said heat-bondable cured silicone.
Claim 12
Dependent Claim 26 words
The process device as set forth in claim 10, wherein the thickness of said heat-resistant base material is in the range of 1 to 100 microns.
Claim 13
Dependent Claim 19 words
The process device as set forth in claim 10, wherein said heat-resistant base material is a heat-resistant plastic film.
Claim 14
Dependent Claim 18 words
The process device as set forth in claim 12, wherein said heat-resistant plastic film is a polyimide film.
Claim 15
Dependent Claim 27 words
The process device as set forth in claim 1, wherein said heat-bondable cured silicone is a cured silicone having silicon atom-bonded hydrogen atoms in a cured state.
Claim 16
Dependent Claim 56 words
The process device as set forth in claim 14, wherein said cured silicone is a cured product of a composition which contains as main components a vinyl group-containing organopolysiloxane, an organohydrogen polysiloxane and a platinum compound catalyst and in which silicon atom-bonded hydrogen atoms are present in a large excess relative to silicon atom-bonded vinyl groups.

References Cited (Backward Citations)

US3939488A Cited
US4331970A Cited
GB2036428A Cited
JPS55140249A Cited
US4626556A Cited
DE3222791A1 Cited
JPS5947745A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-04-15 1994-10-15 1995-04-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-04-15 1998-10-15 1999-04-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-04-15 2002-10-15 2003-04-16 $7700.00 Window Closed / Lapsed

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