Patent US5008727A successfully refreshed from Google Patents.
US5008727A
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Standard cell having test pad for probing and semiconductor integrated circuit device containing the standard cells
Assignee: Panasonic Holdings Corp
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Filing: 1989-01-23
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Granted: 1991-04-16
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Expires: 2009-01-23
Abstract
Abstract A cell containing a test pad is defined as a standard cell, in the same fashion as a logic circuit, and is disposed and wired, together with logic circuit cells, in the internal circuit region excluding the input and output pad regions around the chip by a standard cell system. The cell containing the test pad possesses the pad region for feeding a reference potential in the cell, or the pad region capable of detecting a reference signal, or the layout pattern for expressing an arbitrary code for distinguishing the cell from other cells.
Inventors
- 👤 Joji Katsura
- 👤 Yoshiyuki Takagi
- 👤 Shigeru Watari
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 04:38
CPC Classifications
H; H10; H10D; H10D89/00; H10D89/10
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
32 words
In a standard cell comprising a plurality of different types of standard cells, a circuit cell containing at least one test pad for probing comprising one of said plurality of standard cells.
Claim 2
Dependent Claim
32 words
In a standard cell comprising a plurality of different types of standard cells, a circuit cell containing at least one test pad for probing comprising one of said plurality of standard cells.
Claim 3
Dependent Claim
69 words
In a standard cell system comprising a plurality of different types of standard cells, a circuit cell comprising one of said standard cells, said circuit cell comprising: at least one test pad for probing disposed in said cell; and at least one reference voltage pad to which a reference voltage is supplied, said at least one reference voltage pad being disposed adjacent to said at least one test pad.
Claim 4
Dependent Claim
69 words
In a standard cell system comprising a plurality of different types of standard cells, a circuit cell comprising one of said standard cells, said circuit cell comprising: at least one test pad for probing disposed in said cell; and at least one reference voltage pad to which a reference voltage is supplied, said at least one reference voltage pad being disposed adjacent to said at least one test pad.
Claim 5
Dependent Claim
69 words
In a standard cell system comprising a plurality of different types of standard cells, a circuit cell comprising one of said standard cells, said circuit cell comprising: at least one test pad for probing disposed in said cell; and at least one reference signal pad to which a reference signal is supplied, said at least one reference signal pad being disposed adjacent to said at least one test pad.
Claim 6
Dependent Claim
69 words
In a standard cell system comprising a plurality of different types of standard cells, a circuit cell comprising one of said standard cells, said circuit cell comprising: at least one test pad for probing disposed in said cell; and at least one reference signal pad to which a reference signal is supplied, said at least one reference signal pad being disposed adjacent to said at least one test pad.
Claim 7
Dependent Claim
15 words
A cell as recited in claim 3, wherein said reference signal comprises a clock signal.
Claim 8
Dependent Claim
53 words
In a standard cell system comprising a plurality of different types of standard cells, a circuit cell comprising one of said standard cells, said circuit cell comprising: at least one test pad for probing disposed in said cell; and at least one pattern having a distinctive shape for discriminating a cell disposition state.
Claim 9
Dependent Claim
53 words
In a standard cell system comprising a plurality of different types of standard cells, a circuit cell comprising one of said standard cells, said circuit cell comprising: at least one test pad for probing disposed in said cell; and at least one pattern having a distinctive shape for discriminating a cell disposition state.
Claim 10
Dependent Claim
38 words
A semiconductor integrated circuit device in which a plurality of standard cells are disposed and wired: wherein at least one standard cell selected from among said plurality of standard cells has at least one test pad for probing.
Claim 11
Dependent Claim
38 words
A semiconductor integrated circuit device in which a plurality of standard cells are disposed and wired: wherein at least one standard cell selected from among said plurality of standard cells has at least one test pad for probing.
Claim 12
Dependent Claim
46 words
A semiconductor integrated circuit device as recited in claim 6: wherein said at least one selected standard cell having at least one test pad for probing is disposed and wired in a region excluding input and output pads used for making connections external to the device.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-04-15 | 1994-10-15 | 1995-04-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-04-15 | 1998-10-15 | 1999-04-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-04-15 | 2002-10-15 | 2003-04-16 | $7700.00 | Window Closed / Lapsed |