Semiconductor integrated circuit device

Abstract

Abstract PURPOSE:To enable to simply set the output state of an output circuit to be used for a direct current characteristic test by a method wherein a switching gate circuit and a simple circuit such as a test circuit, which is used in common for all output circuits, are added. CONSTITUTION:An internal logic circuit LOG is constituted of a gate array formed by a master slice system. An output signal formed by the internal logic circuit LOG is transmitted to an output circuit OB through a switching gate circuit G in order to facilitate the direct current characteristic test of the output circuit OB. The other input terminal of the switching gate circuit G and its switching control terminal are respectively supplied in common with a signal formed by a test circuit TST. The test circuit TST is supplied with the test mode signal utilizing an aging inable signal terminal AE.

Inventors

• 👤 Masao Mizukami
• 👤 水上　雅雄

Bibliographic Details