Process for the production of electrical isolation zones in a CMOS integrated circuit

Claim 2

A process for the production of electrical isolation zones for isolating the n regions from the p regions of a CMOS integrated circuit formed on a silicon substrate, comprising the steps of: (a) producing a first mask on the surface of the silicon substrate, said first mask having first patterns which mask at least a part of the p regions; (b) producing a second mask on the surface of the silicon substrate, said second mask having second patterns which mask at least a part of the n regions, steps (a) and (b) being interchangable in that either step may be performed before the other; (c) etching the unmasked regions of the silicon substrate so as to form electrical isolation trenches; (d) anisotropically etching the silicon substrate while simultaneously isotropically etching the patterns of the first mask and forming inclined sides in the upper part of the trenches so that the electrical isolation trenches become wider towards the upper surface of the silicon substrate; and wherein the second mask can be selectively etched with respect to the first mask, the first and second patterns being spaced apart and defining between them the location and the width of the electrical iolation trenches produced between the n regions and the p regions.

Claim 3

A process according to claim 1, wherein: the sides and bottom of the electrical isolation trenches are covered by an oxide film.

Claim 4

A process according the claim 1, wherein: the electrical isolation trenches are filled in with an isolation material consisting of a polycrystalline silicon or a silicide.

Claim 5

A process according to claim 1, wherein: a p-type doping of the inclined sides of the electrical isolation trenches is performed.

Claim 6

A process for the production of electrical isolation zones for isolating the n regions from the p regions of a CMOS integrated circuit formed on a silicon substrate, comprising the steps of: (a') producing a first mask, at a first location on the upper surface of the silicon substrate, having patterns so as to mask the p regions, and producing a second mask, at a second location on the upper surface of the silicon substrate, having patterns so as to mask the n regions; (b') depositing on the silicon substrate and the first mask a layer of a first material which can be selectively etched with respect to a second material layer and the first mask, the layer of the first material having parts on the patterns of the first mask; (c') depositing the second material layer above the first material layer; (d') anisotropically etching the second material layer until the parts of the layer of the first material are exposed; (e') etching the exposed first material until the silicon substrate surface is exposed; (f') etching the silicon substrate exposed during step (e') in order to form electrical isolation trenches; (g') isotropically etching the patterns of the first mask formed above the p regions and anisotropically etching the silicon substrate to form inclined sides in the upper part of the electrical isolation trenches, the inclined sides being in contact with the p regions, the electrical isolation trenches being wider towards the upper surface of the silicon substrate; and (h') filling the electrical isolation trenches with an electrically isolating material.

Claim 7

A process for the production of electrical isolation zones for isolating the n regions from the p regions of a CMOS integrated circuit formed on a silicon substrate, comprising the steps of: (a') producing a first mask, at a first location on the upper surface of the silicon substrate, having patterns so as to mask the p regions, and producing a second mask, at a second location on the upper surface of the silicon substrate, having patterns so as to mask the n regions; (b') depositing on the silicon substrate and the first mask a layer of a first material which can be selectively etched with respect to a second material layer and the first mask, the layer of the first material having parts on the patterns of the first mask; (c') depositing the second material layer above the first material layer; (d') anisotropically etching the second material layer until the parts of the layer of the first material are exposed; (e') etching the exposed first material until the silicon substrate surface is exposed; (f') etching the silicon substrate exposed during step (e') in order to form electrical isolation trenches; (g') isotropically etching the patterns of the first mask formed above the p regions and anisotropically etching the silicon substrate to form inclined sides in the upper part of the electrical isolation trenches, the inclined sides being in contact with the p regions, the electrical isolation trenches being wider towards the upper surface of the silicon substrate; and (h') filling the electrical isolation trenches with an electrically isolating material.

Claim 8

A process according to claim 5, wherein the second material layer is resin.

Claim 9

A process according to claim 5, wherein: an n-type ion implantation for purposes of forming the n regions takes place between steps a' and b'.

Claim 10

A process according to claim 5, wherein: a p-type ion implantation takes place between steps g' and h' for purposes of forming the p regions.

Claim 11

A process according to claim 7 or 8, wherein: an annealing is performed in order to diffuse the implanted ions into the silicon substrate.

Claim 12

A process according to claim 5, wherein: resin is deposited on the layer of the first material and the resin and the second material layer are etched during step d'.

Claim 13

A process according to claim 5, wherein: on the silicon substrate is deposited at least one protective layer prior to step a' and the regions of said at least one protective layer are exposed during step e' and eliminated between steps e' and f'.

Claim 14

A process according to claim 5, wherein: between steps g' and h' there is a thermal oxidation of the silicon substrate leading to the formation of an oxide film on the sides and the bottom of the electrical isolation trenches.

Claim 15

A process according to claim 5, wherein: after step h' a local field oxide is produced above the electrical isolation trenches.

Claim 16

A process according to claim 5, wherein: the remainder of the first mask and the remainder of the second material layer are eliminated by etching between steps g' and h'.

Claim 17

A process according to claim 5, wherein: the remainder of the first material layer is eliminated between steps g' and h'.