Claims Analysis
Total Claims: 45
Claim 1
Independent Claim
311 words
A method for manufacturing a semiconductor device having a plurality of hermetically sealed compression bonded circuit assemblies disposed in a stack which are clamped together to compression bond circuit elements within the individual circuit assemblies comprising: forming a plurality of hermetically sealed circuit assemblies to be clamped together in the semiconductor device with each circuit assembly containing a plurality of circuit elements to be compression bonded disposed in columns to which is applied a force when the circuit assemblies are clamped together in the stack and having first and second opposed walls; positioning the first wall of each of the plurality of hermetically sealed circuit assemblies in a fixed position with respect to a first flat surface; positioning a separate spring in axial alignment with each of the circuit elements to be compression bonded outside of the circuit assembly containing the circuit element to be compression bonded for each of the circuit assemblies of the stack; inelastically deforming the springs of each circuit assembly by application of a compressive force by a second flat surface parallel to the first flat surface to deform the springs of the circuit assembly with a surface of each of the springs after deformation lying within a plane which is parallel to the opposed first and second walls of the circuit assembly, each inelastically deformed spring having a spring rate within a range which is a function of the circuit element that the spring is in axial alignment; positioning the formed circuit assemblies, including springs which have been deformed in the stack; and clamping the stack of circuit assemblies to apply a compressive force through top and bottom surfaces of the stack to compression bond each of the circuit elements of each of the circuit assemblies of the stack with a pressure within a pressure range that the compression bonded circuit elements are to be operated.
Claim 2
Independent Claim
311 words
A method for manufacturing a semiconductor device having a plurality of hermetically sealed compression bonded circuit assemblies disposed in a stack which are clamped together to compression bond circuit elements within the individual circuit assemblies comprising: forming a plurality of hermetically sealed circuit assemblies to be clamped together in the semiconductor device with each circuit assembly containing a plurality of circuit elements to be compression bonded disposed in columns to which is applied a force when the circuit assemblies are clamped together in the stack and having first and second opposed walls; positioning the first wall of each of the plurality of hermetically sealed circuit assemblies in a fixed position with respect to a first flat surface; positioning a separate spring in axial alignment with each of the circuit elements to be compression bonded outside of the circuit assembly containing the circuit element to be compression bonded for each of the circuit assemblies of the stack; inelastically deforming the springs of each circuit assembly by application of a compressive force by a second flat surface parallel to the first flat surface to deform the springs of the circuit assembly with a surface of each of the springs after deformation lying within a plane which is parallel to the opposed first and second walls of the circuit assembly, each inelastically deformed spring having a spring rate within a range which is a function of the circuit element that the spring is in axial alignment; positioning the formed circuit assemblies, including springs which have been deformed in the stack; and clamping the stack of circuit assemblies to apply a compressive force through top and bottom surfaces of the stack to compression bond each of the circuit elements of each of the circuit assemblies of the stack with a pressure within a pressure range that the compression bonded circuit elements are to be operated.
Claim 3
Dependent Claim
57 words
A method in accordance with claim 1 wherein: the spring rate during thermal expansion of the circuit assemblies caused by operation of the circuit assembly maintains a pressure applied to each of the compression bonded circuit elements by the clamping force and by thermal expansion within the pressure range for operation of the compression bonded circuit elements.
Claim 4
Dependent Claim
18 words
A method in accordance with claim 2 wherein: each of the circuit assemblies of the stack are identical.
Claim 5
Dependent Claim
67 words
A method in accordance with claim 2 wherein: each circuit assembly contains at least two different circuit elements to be compression bonded; and the spring for each of the circuit elements to be compression bonded in each circuit assembly has a spring rate upon deformation in accordance with a specified range of pressures at which the different circuit elements to be compression bonded are to be operated.
Claim 6
Dependent Claim
87 words
A method in accordance with claim 1 wherein: each circuit assembly is connected to and in thermal contact with a heat sink at the time of deformation; the stacked circuit assemblies are clamped together with each circuit assembly being connected to the heat sink to which each circuit assembly was connected when deformation occurred; and each heat sink has opposed surfaces which, except for a circuit assembly at a bottom of the stack, respectively face two circuit assemblies when the stack of circuit assemblies is clamped together.
Claim 7
Dependent Claim
87 words
A method in accordance with claim 2 wherein: each circuit assembly is connected to and in thermal contact with a heat sink at the time of deformation; the stacked circuit assemblies are clamped together with each circuit assembly being connected to the heat sink to which each circuit assembly was connected when deformation occurred; and each heat sink has opposed surfaces which, except for a circuit assembly at a bottom of the stack, respectively face two circuit assemblies when the stack of circuit assemblies is clamped together.
Claim 8
Dependent Claim
87 words
A method in accordance with claim 3 wherein: each circuit assembly is connected to and in thermal contact with a heat sink at the time of deformation; the stacked circuit assemblies are clamped together with each circuit assembly being connected to the heat sink to which each circuit assembly was connected when deformation occurred; and each heat sink has opposed surfaces which, except for a circuit assembly at a bottom of the stack, respectively face two circuit assemblies when the stack of circuit assemblies is clamped together.
Claim 9
Dependent Claim
87 words
A method in accordance with claim 4 wherein: each circuit assembly is connected to and in thermal contact with a heat sink at the time of deformation; the stacked circuit assemblies are clamped together with each circuit assembly being connected to the heat sink to which each circuit assembly was connected when deformation occurred; and each heat sink has opposed surfaces which, except for a circuit assembly at a bottom of the stack, respectively face two circuit assemblies when the stack of circuit assemblies is clamped together.
Claim 10
Dependent Claim
52 words
A method in accordance with claim 5 wherein: the spring for each of the circuit elements to be compression bonded in each circuit assembly has a spring rate upon deformation which causes operation within a specified range of pressures at which the circuit element to be compression bonded is to be operated.
Claim 11
Dependent Claim
47 words
A method in accordance with claim 1 wherein: the spring is comprised of at least one ring with each ring being concentric with an axis of a column and having a C-shaped cross section in which opposite ends of the C are inelastically deformable toward each other.
Claim 12
Dependent Claim
20 words
A method in accordance with claim 1 wherein: the spring is comprised of a lattice having open cells defining columns.
Claim 13
Independent Claim
287 words
A method for manufacturing a semiconductor device having a plurality of hermetically sealed compression bonded circuit assemblies disposed in a stack which are clamped together to compression bond circuit elements within the individual circuit assemblies comprising: forming a plurality of hermetically sealed circuit assemblies to be clamped together to form the semiconductor device with each circuit assembly containing a plurality of circuit elements to be compression bonded disposed in columns to which is applied a force when the circuit assemblies are clamped together in the stack and having first and second opposed walls; positioning the first wall of each of the plurality of hermetically sealed circuit assemblies in a fixed position with respect to a first flat surface; positioning a separate deformable shim in axial alignment with each of the circuit elements to be compression bonded outside of the circuit assembly containing the circuit element to be compression bonded for each of the circuit assemblies of the stack; inelastically deforming the deformable shims of each circuit assembly by application of a compressive force by a second flat surface parallel to the first flat surface to deform the shims of the circuit assembly with a surface of each spring after deformation lying within a plane which is parallel to the opposed first and second walls of the circuit assembly; positioning the formed circuit assemblies, including deformable shims which have been deformed in the stack; and clamping the stack of circuit assemblies to apply a compressive force through top and bottom surfaces of the stack to compression bond each of the circuit elements of each of the circuit assemblies of the stack with a pressure within a pressure range that the compression bonded circuit elements are to be operated.
Claim 14
Independent Claim
287 words
A method for manufacturing a semiconductor device having a plurality of hermetically sealed compression bonded circuit assemblies disposed in a stack which are clamped together to compression bond circuit elements within the individual circuit assemblies comprising: forming a plurality of hermetically sealed circuit assemblies to be clamped together to form the semiconductor device with each circuit assembly containing a plurality of circuit elements to be compression bonded disposed in columns to which is applied a force when the circuit assemblies are clamped together in the stack and having first and second opposed walls; positioning the first wall of each of the plurality of hermetically sealed circuit assemblies in a fixed position with respect to a first flat surface; positioning a separate deformable shim in axial alignment with each of the circuit elements to be compression bonded outside of the circuit assembly containing the circuit element to be compression bonded for each of the circuit assemblies of the stack; inelastically deforming the deformable shims of each circuit assembly by application of a compressive force by a second flat surface parallel to the first flat surface to deform the shims of the circuit assembly with a surface of each spring after deformation lying within a plane which is parallel to the opposed first and second walls of the circuit assembly; positioning the formed circuit assemblies, including deformable shims which have been deformed in the stack; and clamping the stack of circuit assemblies to apply a compressive force through top and bottom surfaces of the stack to compression bond each of the circuit elements of each of the circuit assemblies of the stack with a pressure within a pressure range that the compression bonded circuit elements are to be operated.
Claim 15
Dependent Claim
18 words
A method in accordance with claim 12 wherein: each of the circuit assemblies of the stack are identical.
Claim 16
Dependent Claim
22 words
A method in accordance with claim 12 wherein: each circuit assembly contains at least two different circuit elements to be compression bonded.
Claim 17
Dependent Claim
87 words
A method in accordance with claim 12 wherein: each circuit assembly is connected to and in thermal contact with a heat sink at the time of deformation; the stacked circuit assemblies are clamped together with each circuit assembly being connected to the heat sink to which each circuit assembly was connected when deformation occurred; and each heat sink has opposed surfaces which, excpet for a circuit assembly at a bottom of the stack, respectively face two circuit assemblies when the stack of circuit assemblies is clamped together.
Claim 18
Dependent Claim
87 words
A method in accordance with claim 13 wherein: each circuit assembly is connected to and in thermal contact with a heat sink at the time of deformation; the stacked circuit assemblies are clamped together with each circuit assembly being connected to the heat sink to which each circuit assembly was connected when deformation occurred; and each heat sink has opposed surfaces which, except for a circuit assembly at a bottom of the stack, respectively face two circuit assemblies when the stack of circuit assemblies is clamped together.
Claim 19
Dependent Claim
87 words
A method in accordance with claim 14 wherein: each circuit assembly is connected to and in thermal contact with a heat sink at the time of deformation; the stacked circuit assemblies are clamped together with each circuit assembly being connected to the heat sink to which each circuit assembly was connected when deformation occurred; and each heat sink has opposed surfaces which, except for a circuit assembly at a bottom of the stack, respectively face two circuit assemblies when the stack of circuit assemblies is clamped together.
Claim 20
Dependent Claim
15 words
A method in accordance with claim 12 wherein the deformed shim is a molded resin.
Claim 21
Dependent Claim
17 words
A method in accordance with claim 18 wherein the molded resin is in accordance with AMS 3726-1-2-3.
Claim 22
Independent Claim
286 words
A method for manufacturing a semiconductor device having a plurality of hermetically sealed compression bonded circuit assemblies disposed in a stack which are clamped together to compression bond circuit elements within the individual circuit assemblies comprising: forming a plurality of hermetically sealed circuit assemblies to be clamped together to form the semiconductor device with each circuit assembly containing a plurality of circuit elements to be compression bonded disposed in columns to which is applied a force when the circuit assemblies are clamped together and having first and second opposed walls; positioning the first wall of each of the plurality of hermetically sealed circuit assemblies in a fixed position with respect to a first flat surface; positioning a separate deformable spacer in axial alignment with each of the circuit elements to be compression bonded outside of the circuit assembly containing the circuit element to be compression bonded for each of the circuit assemblies of the stack; inelastically deforming the deformable spacers of each circuit assembly by application of a compressive force by a second flat surface parallel to the first flat surface to deform the spacers of the circuit assembly with a surface of each of the deformable spacers after deformation lying within a plane which is parallel to the opposed first and second walls of the circuit assembly; positioning the formed circuit assemblies including spacers which have been deformed in the stack; and clamping the stack of circuit assemblies to apply a compressive force through top and bottom surfaces of the stack to compression bond each of the circuit elements of each of the circuit assemblies of the stack with a pressure within a pressure range that the compression bonded circuit elements are to be operated.
Claim 23
Independent Claim
286 words
A method for manufacturing a semiconductor device having a plurality of hermetically sealed compression bonded circuit assemblies disposed in a stack which are clamped together to compression bond circuit elements within the individual circuit assemblies comprising: forming a plurality of hermetically sealed circuit assemblies to be clamped together to form the semiconductor device with each circuit assembly containing a plurality of circuit elements to be compression bonded disposed in columns to which is applied a force when the circuit assemblies are clamped together and having first and second opposed walls; positioning the first wall of each of the plurality of hermetically sealed circuit assemblies in a fixed position with respect to a first flat surface; positioning a separate deformable spacer in axial alignment with each of the circuit elements to be compression bonded outside of the circuit assembly containing the circuit element to be compression bonded for each of the circuit assemblies of the stack; inelastically deforming the deformable spacers of each circuit assembly by application of a compressive force by a second flat surface parallel to the first flat surface to deform the spacers of the circuit assembly with a surface of each of the deformable spacers after deformation lying within a plane which is parallel to the opposed first and second walls of the circuit assembly; positioning the formed circuit assemblies including spacers which have been deformed in the stack; and clamping the stack of circuit assemblies to apply a compressive force through top and bottom surfaces of the stack to compression bond each of the circuit elements of each of the circuit assemblies of the stack with a pressure within a pressure range that the compression bonded circuit elements are to be operated.
Claim 24
Dependent Claim
37 words
A method in accordance with claim 20 wherein: the spacers are springs having a spring rate within a range which is a function of the compression bonded circuit element in which the spring is in axial alignment.
Claim 25
Dependent Claim
13 words
A method in accordance with claim 20 wherein: the spacers are deformable shims.
Claim 26
Independent Claim
181 words
A method for manufacturing a hermetically sealed circuit assembly having a plurality of circuit elements to be compression bonded comprising: forming a hermetically sealed circuit assembly containing a plurality of circuit elements to be compression bonded disposed in a spatial pattern, and having first and second opposed walls; positioning the first wall of the hermetically sealed circuit assembly in a fixed position with respect to a first flat surface; positioning a separate spring in axial alignment with each of the circuit elements to be compression bonded outside of the circuit assembly; and inelastically deforming the springs of the circuit assembly by application of a compressive force by a second flat surface parallel to the first flat surface to deform the springs of the circuit assembly with a surface of each of the springs after deformation being disposed within a plane which is parallel to the opposed first and second walls of the circuit assembly, each inelastically deformed spring having a spring rate within a range which is a function of the circuit element in which the spring is in axial alignment.
Claim 27
Independent Claim
181 words
A method for manufacturing a hermetically sealed circuit assembly having a plurality of circuit elements to be compression bonded comprising: forming a hermetically sealed circuit assembly containing a plurality of circuit elements to be compression bonded disposed in a spatial pattern, and having first and second opposed walls; positioning the first wall of the hermetically sealed circuit assembly in a fixed position with respect to a first flat surface; positioning a separate spring in axial alignment with each of the circuit elements to be compression bonded outside of the circuit assembly; and inelastically deforming the springs of the circuit assembly by application of a compressive force by a second flat surface parallel to the first flat surface to deform the springs of the circuit assembly with a surface of each of the springs after deformation being disposed within a plane which is parallel to the opposed first and second walls of the circuit assembly, each inelastically deformed spring having a spring rate within a range which is a function of the circuit element in which the spring is in axial alignment.
Claim 28
Dependent Claim
32 words
A method in accordance with claim 23 further comprising: attaching the deformed springs to the circuit assembly at a position identical to the position of the springs at which deformation took place.
Claim 29
Independent Claim
153 words
A method for manufacturing a hermetically sealed circuit assembly having a plurality of circuit elements to be compression bonded comprising: forming a hermetically sealed circuit assembly containing a plurality of circuit elements to be compression bonded disposed in spatial pattern, and having first and second opposed walls; positioning the first wall of the hermetically sealed circuit assembly in a fixed position with respect to a first flat surface; positioning a separate deformable shim in axial alignment with each of the circuit elements to be compression bonded outside of the circuit assembly; and inelastically deforming the deformable shims of the circuit assembly by application of a compressive force by a second flat surface parallel to the first flat surface to deform the shims of the circuit assembly with a surface of each spring after deformation being disposed within a plane which is parallel to the opposed first and second walls of the circuit assembly.
Claim 30
Independent Claim
153 words
A method for manufacturing a hermetically sealed circuit assembly having a plurality of circuit elements to be compression bonded comprising: forming a hermetically sealed circuit assembly containing a plurality of circuit elements to be compression bonded disposed in spatial pattern, and having first and second opposed walls; positioning the first wall of the hermetically sealed circuit assembly in a fixed position with respect to a first flat surface; positioning a separate deformable shim in axial alignment with each of the circuit elements to be compression bonded outside of the circuit assembly; and inelastically deforming the deformable shims of the circuit assembly by application of a compressive force by a second flat surface parallel to the first flat surface to deform the shims of the circuit assembly with a surface of each spring after deformation being disposed within a plane which is parallel to the opposed first and second walls of the circuit assembly.
Claim 31
Dependent Claim
32 words
A method in accordance with claim 25 further comprising: attaching the deformed shims to the circuit assembly at a position identical to the position of the springs at which deformation took place.
Claim 32
Independent Claim
157 words
A method for manufacturing a hermetically sealed circuit assembly having a plurality of circuit elements to be compression bonded comprising: forming a hermetically sealed circuit assembly containing a plurality of circuit elements to be compression bonded disposed in a spatial pattern, and having first and second opposed walls; positioning the first wall of the hermetically sealed circuit assembly in a fixed position with respect to a first flat surface; positioning a separate deformable spacer in axial alignment with each of the circuit elements to be compression bonded outside of the circuit assembly; and inelastically deforming the deformable spacers of the circuit assembly by application of a compressive force by a second flat surface parallel to the first flat surface to deform the spacers of the circuit assembly with a surface of each of the deformable spacers after deformation being disposed within a plane which is parallel to the opposed first and second walls of the circuit assembly.
Claim 33
Independent Claim
157 words
A method for manufacturing a hermetically sealed circuit assembly having a plurality of circuit elements to be compression bonded comprising: forming a hermetically sealed circuit assembly containing a plurality of circuit elements to be compression bonded disposed in a spatial pattern, and having first and second opposed walls; positioning the first wall of the hermetically sealed circuit assembly in a fixed position with respect to a first flat surface; positioning a separate deformable spacer in axial alignment with each of the circuit elements to be compression bonded outside of the circuit assembly; and inelastically deforming the deformable spacers of the circuit assembly by application of a compressive force by a second flat surface parallel to the first flat surface to deform the spacers of the circuit assembly with a surface of each of the deformable spacers after deformation being disposed within a plane which is parallel to the opposed first and second walls of the circuit assembly.
Claim 34
Dependent Claim
32 words
A method in accordance with claim 27 further comprising: attaching the deformed spacers to the circuit assembly at a position identical to the position of the springs at which deformation took place.
Claim 35
Dependent Claim
12 words
A method in accordance with claim 28 wherein: the spacers are springs.
Claim 36
Dependent Claim
12 words
A method in accordance with claim 28 wherein: the spacers are shims.
Claim 37
Dependent Claim
42 words
A method in accordance with claim 1 wherein: the plurality of columns of circuit elements each have a thickness after the deformation of the springs measured between the deformed springs and one of the first and second walls which is substantially identical.
Claim 38
Dependent Claim
41 words
A method in accordance with claim 12 wherein: the plurality of columns of circuit elements each have a thickness after deformation of the shims measured between the deformed shims and one of the first and second walls which is substantially identical.
Claim 39
Dependent Claim
42 words
A method in accordance with claim 20 wherein: the plurality of columns of circuit elements each have a thickness after the deformation of the spacers measured between the deformed spacers and one of the first and second walls which is substantially identical.
Claim 40
Dependent Claim
33 words
A method in accordance with claim 31 wherein: prior to inelastic deformation of the springs a heat sink having parallel opposed surfaces has one of the opposed surfaces facing one of the walls.
Claim 41
Dependent Claim
33 words
A method in accordance with claim 32 wherein: prior to inelastic deformation of the shims a heat sink having parallel opposed surfaces has one of the opposed surfaces facing one of the walls.
Claim 42
Dependent Claim
33 words
A method in accordance with claim 33 wherein: prior to inelastic deformation of the spacers a heat sink having parallel opposed surfaces has one of the opposed surfaces facing one of the walls.
Claim 43
Dependent Claim
42 words
A method in accordance with claim 23 wherein: the plurality of columns of circuit elements each have a thickness after the deformation of the springs measured between the deformed springs and one of the first and second walls which is substantially identical.
Claim 44
Dependent Claim
42 words
A method in accordance with claim 25 wherein: the plurality of columns of circuit elements each have a thickness after the deformation of the shims measured between the deformed shims and one of the first and second walls which is substantially identical.
Claim 45
Dependent Claim
42 words
A method in accordance with claim 27 wherein: the plurality of columns of circuit elements each have a thickness after the deformation of the spacers measured between the deformed spacers and one of the first and second walls which is substantially identical.