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US4801518A
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US
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Method of forming a photoresist pattern
Assignee: FUJII CHEMICALS INDUSTRIAL Co Ltd
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Filing: 1987-12-03
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Granted: 1989-01-31
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Expires: 2007-12-03
Abstract
Abstract A method of forming a photoresist pattern wherein a photoresist coating film of naphthoquinone diazide sulfonate of novolak is formed on a substrate layer, the photoresist coating film is exposed by selectively irradiating with near ultraviolet radiation of 350 to 450 nm through a photomask, and the exposed photoresist coating film is developed with an either a negative type or positive type developing solution. The resultant photoresist pattern is usable for manufacturing a highly integrated circuit such as LSI which requires fine processing techniques.
Inventors
- 👤 Yoshio Yamashita
- 👤 Ryuji Kawazu
- 👤 Toshio Itoh
- 👤 Takateru Asano
- 👤 Kenji Kobayashi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 06:05
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/004; G03F7/022; G03F7/20; G03F7/2002; G03F7/2004; G03F7/26; G03F7/30; G03F7/32; G03F7/325
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
124 words
A method of forming a negative type photoresist pattern consisting essentially of the steps of: forming a photoresist photosensitive coating film of a naphthoquinone diazide sulfonate of a novolak resin on an underlying layer, exposing a photoresist coating film by selectively irradiating with ultraviolet radiation of 350 to 450 nm through a photomask, developing the exposed photoresist coating film with a solution made by mixing non-polar solvents containing one or more solvents selected from the group consisting of halogen-containing solvents and alkylbenzene solvents as the major solvent with one or more solvents having a polarity smaller than that of the major solvent and selected from the group consisting of cyclohexane petroleum ether and n-hexane, thereby removing an unexposed portion of the photoresist coating film.
Claim 2
Independent Claim
124 words
A method of forming a negative type photoresist pattern consisting essentially of the steps of: forming a photoresist photosensitive coating film of a naphthoquinone diazide sulfonate of a novolak resin on an underlying layer, exposing a photoresist coating film by selectively irradiating with ultraviolet radiation of 350 to 450 nm through a photomask, developing the exposed photoresist coating film with a solution made by mixing non-polar solvents containing one or more solvents selected from the group consisting of halogen-containing solvents and alkylbenzene solvents as the major solvent with one or more solvents having a polarity smaller than that of the major solvent and selected from the group consisting of cyclohexane petroleum ether and n-hexane, thereby removing an unexposed portion of the photoresist coating film.
Claim 3
Dependent Claim
18 words
A method of forming a photoresist pattern as claimed in claim 1, wherein the halogen-containing solvent is monochlorobenzene.
Claim 4
Dependent Claim
18 words
A method of forming a photoresist pattern as claimed in claim 1, wherein the alkylbenzene solvent is xylene.
Claim 5
Independent Claim
137 words
A method of forming a negative type photoresist pattern consisting essentially of the steps of: forming a photoresist photosensitive coating film of a naphthoquinone diazide sulfonate of a novolak resin on an underlying layer, exposing a photoresist coating film by selectively irradiating with ultraviolet radiation of 350 to 450 nm through a photomask, baking the exposed photoresist coating film at a temperature of 60° to 130° C., developing the exposed photoresist coating film with a solution made by mixing non-polar solvents containing one or more solvents selected from the group consisting of halogen-containing solvents and alkylbenzene solvents as the major solvent with one or more solvents having polarity smaller than that of the major solvent and selected from the group consisting of cyclohexane, petroleum ether and n-hexane, thereby removing an unexposed portion of the photoresist coating film.
Claim 6
Independent Claim
137 words
A method of forming a negative type photoresist pattern consisting essentially of the steps of: forming a photoresist photosensitive coating film of a naphthoquinone diazide sulfonate of a novolak resin on an underlying layer, exposing a photoresist coating film by selectively irradiating with ultraviolet radiation of 350 to 450 nm through a photomask, baking the exposed photoresist coating film at a temperature of 60° to 130° C., developing the exposed photoresist coating film with a solution made by mixing non-polar solvents containing one or more solvents selected from the group consisting of halogen-containing solvents and alkylbenzene solvents as the major solvent with one or more solvents having polarity smaller than that of the major solvent and selected from the group consisting of cyclohexane, petroleum ether and n-hexane, thereby removing an unexposed portion of the photoresist coating film.
Claim 7
Dependent Claim
18 words
A method of forming a photoresist pattern as claimed in claim 4, wherein the halogen-containing solvent is monochlorobenzene.
Claim 8
Dependent Claim
18 words
A method of forming a photoresist pattern as claimed in claim 4, wherein the alkylbenzene solvent is xylene.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-01-31 | 1992-08-01 | 1993-01-31 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-01-31 | 1996-08-01 | 1997-01-31 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-01-31 | 2000-08-01 | 2001-01-31 | $7700.00 | Window Closed / Lapsed |