Patent US4789560A successfully refreshed from Google Patents.
US4789560A
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Diffusion stop method for forming silicon oxide during the fabrication of IC devices
Assignee: Advanced Micro Devices Inc
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Filing: 1986-01-08
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Granted: 1988-12-06
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Expires: 2006-01-08
Abstract
Abstract High quality silicon oxide is grown for integrated circuits by oxidizing poly-crystalline silicon under an oxygen gas flow. A diffusion stop layer of thermal silicon nitride is formed on the underlying substrate prior to the deposition of the poly layer to be oxidized. The nitride layer isolates the substrate from diffused oxygen within the poly layer during oxidation, permitting a non-critical, oxidation time. Extension of the oxidation period elimates extended imperfect or "loose" chemical bonds throughout the oxide layer formed. Corner stress common in trench applications is minimized because the nitride prevents oxidation in the substrate. The oxidation of undoped poly over doped poly proceeds conformally because the nitride layer therebetween inhibits the enhanced oxidation effect of impurities in the doped poly.
Inventors
- 👤 Yung-Chau Yen
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 20:24
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/69; H10P14/692; H10P14/6921; H10P14/69215; H10D; H10D1/00; H10D1/01; H10D1/045; H10D1/047; H10D64/00; H10D64/01; H10D64/031; H10D64/035; H10P14/61; H10P14/63; H10P14/6302; H10P14/6316; H10P14/6326; H10P14/6328; H10P14/6334; H10P14/66; H10P14/662; H10P14/694; H10P14/6943; H10P14/69433; H10P95/00; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/014; H10W10/0142; H10W10/10; H10W10/17; H10W20/00; H10W20/01; H10W20/031; H10W20/069; H10P14/6304; H10P14/6306; H10P14/6308; H10P14/6309; H10P14/6322
Claims Analysis
Total Claims: 50
Claim 1
Independent Claim
88 words
A method of forming high quality silicon oxide, comprising the steps of: providing a host support; forming silicon nitride on the host support; forming silicon material on the silicon nitride; and oxidizing the silicon material in an atmosphere comprising dry oxygen gas to form a silicon oxide, comprising the sub-steps of: continuing the oxidation process until the oxide-silicon interface reaches the silicon nitride , and saturating the oxidation reaction within the silicon oxide to perfect loose chemical bonds between the silicon and the oxygen in the silicon oxide.
Claim 2
Independent Claim
88 words
A method of forming high quality silicon oxide, comprising the steps of: providing a host support; forming silicon nitride on the host support; forming silicon material on the silicon nitride; and oxidizing the silicon material in an atmosphere comprising dry oxygen gas to form a silicon oxide, comprising the sub-steps of: continuing the oxidation process until the oxide-silicon interface reaches the silicon nitride , and saturating the oxidation reaction within the silicon oxide to perfect loose chemical bonds between the silicon and the oxygen in the silicon oxide.
Claim 3
Dependent Claim
35 words
The method of claim 1, wherein said oxidizing step further comprises the sub-step of: driving the oxidation process within the silicon material to completion to convert essentially all of the silicon material to silicon oxide.
Claim 4
Dependent Claim
116 words
The method of claim 1, wherein: said oxidizing step further comprises the sub-steps of: elevating the temperature of the silicon material to a temperature sufficient to support the oxidation reaction between oxygen and silicon and to permit the diffusion of oxygen therethrough, and exposing the surface of the silicon material to oxygen which reacts with the surface silicon material forming silicon oxide and diffuses through the silicon oxide to progressively oxidize the silicon material from the surface inward defining an oxide-silicon interface; and said temperature elevating sub-step includes a temperature cycle comprising a warm up period of generally increasing temperature, a main period of generally steady temperature, and a cool down period of generally decreasing temperature.
Claim 5
Dependent Claim
28 words
The method of claim 3, wherein said oxidizing step comprises exposing the silicon material to oxygen prior to the initiation of the main period of the temperature cycle.
Claim 6
Dependent Claim
27 words
The method of claim 3, wherein said oxidizing step comprises exposing the silicon material to oxygen after the termination of the main period of the temperature cycle.
Claim 7
Dependent Claim
24 words
The method of claim 1, wherein the silicon nitride means is the compound formed by three atoms of silicon and four atoms of nitrogen.
Claim 8
Dependent Claim
26 words
The method of claim 1, wherein the silicon nitride means is a single layer of silicon nitride between the host support means and the silicon material.
Claim 9
Dependent Claim
30 words
The method of claim 1, wherein the silicon nitride means is formed at an elevated deposition temperature by low pressure chemical vapor deposition from a vapor containing silicon and nitrogen.
Claim 10
Dependent Claim
41 words
The method of claim 1, wherein the host support means is silicon and the silicon nitride means thereon is thermal nitride grown on the host silicon during a growing period at an elevated growth temperature by decomposing a nitrogen bearing gas.
Claim 11
Dependent Claim
12 words
The method of claim 9, wherein the nitrogen bearing gas is ammonia.
Claim 12
Dependent Claim
23 words
The method of claim 9, wherein the thickness of the grown silicon nitride on the host silicon is limited by the growth temperature.
Claim 13
Dependent Claim
21 words
The method of claim 11, wherein the minimum growth temperature is determined by the threshold reacting temperature of silicon and nitrogen.
Claim 14
Dependent Claim
23 words
The method of claim 11, wherein the thickness uniformity of the grown silicon nitride is improved by extending the silicon nitride growing period.
Claim 15
Dependent Claim
14 words
The method of claim 1, wherein the host support means is single crystal silicon.
Claim 16
Dependent Claim
33 words
The method of claim 1, wherein the host support means is poly crystalline silicon and the nitride prevents diffusion of impurities from the host poly crystalline silicon into the silicon oxide during oxidation.
Claim 17
Independent Claim
114 words
A method of filling a trench with silicon oxide, comprising the steps of: (a) providing a host support; (b) forming a trench in the host support, the trench having opposed side walls and a bottom wall; (c) forming silicon nitride means in the trench and on the host support; (d) forming silicon material on the silicon nitride; (e) oxidizing the silicon material to form silicon oxide and continuing the oxidation process until the oxide-silicon interface reaches the silicon nitride causing the silicon material to merge into the silicon oxide; (f) forming a layer of polycrystalline silicon over the silicon oxide; and (g) oxidizing the polycrystalline silicon to fill the isolation trench with silicon oxide.
Claim 18
Independent Claim
114 words
A method of filling a trench with silicon oxide, comprising the steps of: (a) providing a host support; (b) forming a trench in the host support, the trench having opposed side walls and a bottom wall; (c) forming silicon nitride means in the trench and on the host support; (d) forming silicon material on the silicon nitride; (e) oxidizing the silicon material to form silicon oxide and continuing the oxidation process until the oxide-silicon interface reaches the silicon nitride causing the silicon material to merge into the silicon oxide; (f) forming a layer of polycrystalline silicon over the silicon oxide; and (g) oxidizing the polycrystalline silicon to fill the isolation trench with silicon oxide.
Claim 19
Dependent Claim
32 words
The method of claim 16, wherein said oxidation step (e) comprises: driving the oxidation process within the silicon material to completion to convert essentially all of the silicon material to silicon oxide.
Claim 20
Dependent Claim
36 words
The method of claim 17, wherein said oxidizing step (e), comprises: saturating the oxidation reaction within the silicon oxide to perfect substantially all loose chemical bonds between the silicon and the oxygen in the silicon oxide.
Claim 21
Dependent Claim
108 words
The method of claim 16, wherein: said oxidizing step (e) comprises: evaluating the temperature of the silicon material to a temperature sufficient to support the oxidation reaction between oxygen and silicon and to permit the diffusion of oxygen therethrough, and exposing the surface of the silicon material to oxygen which reacts with the surface silicon material forming silicon oxide and diffuses through the silicon oxide to progressively oxidize the silicon material from the surface inward; and said temperature elevating includes a temperature cycle comprising a warm up period of generally increasing temperature, a main period of generally steady temperature, and a cool down period of generally decreasing temperature.
Claim 22
Dependent Claim
29 words
The method of claim 19, wherein said oxidizing step (e) comprises exposing the silicon material to oxygen prior to the start of the main period of the temperature cycle.
Claim 23
Dependent Claim
28 words
The method of claim 19, wherein said oxidizing step (e) comprises exposing the silicon material to oxygen after the termination of the main period of the temperature cycle.
Claim 24
Dependent Claim
39 words
The method of claim 16, wherein the host support means is silicon and the silicon nitride means thereon is thermal nitride grown on the host silicon during a growing period at an elevated growth temperature by decomposing ammonia gas.
Claim 25
Dependent Claim
23 words
The method of claim 22, wherein the thickness of the grown silicon nitride on the host silicon is limited by the growth temperature.
Claim 26
Dependent Claim
23 words
The method of claim 22, wherein the thickness uniformity of the grown silicon nitride is improved by extending the silicon nitride growing period.
Claim 27
Dependent Claim
18 words
The method of claim 16, wherein the silicon material is a thin layer of undoped poly crystalline silicon.
Claim 28
Dependent Claim
28 words
The method of claim 16, wherein the support host means is single crystal silicon and the trench means is an isolation trench etched in the single crystal silicon.
Claim 29
Dependent Claim
30 words
The method of claim 16 , further comprising the step of : etching the polycrystalline silicon away from the bottom wall of the isolation trench prior to said step (g).
Claim 30
Dependent Claim
33 words
The method of claim 21, wherein the silicon oxide formed over the nitride means functions as an etch stop for removing the poly crystalline silicon from the bottom wall of the isolation trench.
Claim 31
Dependent Claim
29 words
The method of claim 16, wherein the support host means is single crystal silicon and the trench means is a storage capacitor trench etched in the single crystal silicon.
Claim 32
Dependent Claim
19 words
The method of claim 29, further comprising the step of: filling the storage capacitor trench with doped polycrystalline silicon.
Claim 33
Independent Claim
216 words
A method of manufacturing a floating gate device, comprising the steps of: providing a host silicon; forming a first silicon nitride layer on the host silicon; forming first silicon material on the first silicon nitride layer; oxidizing the first silicon material to form a first silicon oxide dielectric, comprising the sub-steps of: continuing the oxidation process forming the first silicon oxide dielectric layer until the first oxide-silicon interface reaches the first silicon nitride layer causing the first silicon material to merge into the first silicon oxide dielectric , and saturating the oxidation reaction within the silicon oxide to perfect loose chemical bonds between the silicon material and oxygen; providing doped poly silicon gate material over the first silicon oxide dielectric; forming a second silicon nitride layer on the poly silicon gate material; forming second silicon material on the second silicon nitride layer; and oxidizing the second silicon material to form a second silicon oxide dielectric layer, comprising the sub-steps of: continuing the oxidation process forming the second silicon oxide dielectric layer until the second oxide-silicon interface reaches the second silicon nitride layer causing the second silicon material to merge into the second silicon oxide dielectric, and saturating the oxidation reaction within the silicon oxide to perfect loose chemical bonds between the silicon material and the oxygen.
Claim 34
Independent Claim
216 words
A method of manufacturing a floating gate device, comprising the steps of: providing a host silicon; forming a first silicon nitride layer on the host silicon; forming first silicon material on the first silicon nitride layer; oxidizing the first silicon material to form a first silicon oxide dielectric, comprising the sub-steps of: continuing the oxidation process forming the first silicon oxide dielectric layer until the first oxide-silicon interface reaches the first silicon nitride layer causing the first silicon material to merge into the first silicon oxide dielectric , and saturating the oxidation reaction within the silicon oxide to perfect loose chemical bonds between the silicon material and oxygen; providing doped poly silicon gate material over the first silicon oxide dielectric; forming a second silicon nitride layer on the poly silicon gate material; forming second silicon material on the second silicon nitride layer; and oxidizing the second silicon material to form a second silicon oxide dielectric layer, comprising the sub-steps of: continuing the oxidation process forming the second silicon oxide dielectric layer until the second oxide-silicon interface reaches the second silicon nitride layer causing the second silicon material to merge into the second silicon oxide dielectric, and saturating the oxidation reaction within the silicon oxide to perfect loose chemical bonds between the silicon material and the oxygen.
Claim 35
Dependent Claim
42 words
The method of claim 31, wherein said steps of oxidizing the first and second silicon materials each comprise the sub-step of: driving the oxidation process within the silicon material to completion to converting essentially all of the silicon material to silicon oxide.
Claim 36
Dependent Claim
132 words
The method of claim 32, wherein: said steps of oxidizing the first and second silicon materials each comprise the sub-steps of: elevating the temperature of the first silicon material to a temperature sufficient to support the oxidation reaction between oxygen and silicon and to permit the diffusion of oxygen therethrough, and exposing the surface of the first silicon material to oxygen which reacts with the surface silicon of the first silicon material forming silicon oxide and diffuses through the silicon oxide to progressively oxidize the first silicon material from the surface inward defining a first oxide-silicon interface; and said temperature elevating sub-steps each include a temperature cycle comprising a warm up period of generally increasing temperature, a main period of generally steady temperature, and a cool down period of generally decreasing temperature.
Claim 37
Dependent Claim
32 words
The method of claim 33, wherein each said oxidizing step comprises exposing the silicon material to the dry oxygen gas prior to the start of the main period of the termpature cycle.
Claim 38
Dependent Claim
31 words
The method of claim 33, wherein each said oxidizing step comprises exposing the silicon material to the dry oxygen gas after the termination of the main period of the temperature cycle.
Claim 39
Dependent Claim
39 words
The method of claim 31, wherein the host support means is silicon and the silicon nitride means thereon is thermal nitride grown on the host silicon during a growing period at an elevated growth temperature by decomposing ammonia gas.
Claim 40
Dependent Claim
23 words
The method of claim 36, wherein the thickness of the grown silicon nitride on the host silicon is limited by the growth temperature.
Claim 41
Dependent Claim
23 words
The method of claim 37, wherein the thickness uniformity of the grown silicon nitride is improved by extending the silicon nitride growing period.
Claim 42
Independent Claim
83 words
A method of fabricating a floating gate device, comprising the steps of: (a) providing a substrate; (b) providing a first oxide layer on the substrate; (c) providing a gate material on the first oxide layer; (d) providing a silicon nitride layer on the gate material; (e) providing silicon material on the silicon nitride layer; and (f) oxidizing the silicon material and saturating the oxidation reaction within the oxidized silicon material to perfect substantially all loose chemical bonds between the silicon material and oxygen.
Claim 43
Independent Claim
83 words
A method of fabricating a floating gate device, comprising the steps of: (a) providing a substrate; (b) providing a first oxide layer on the substrate; (c) providing a gate material on the first oxide layer; (d) providing a silicon nitride layer on the gate material; (e) providing silicon material on the silicon nitride layer; and (f) oxidizing the silicon material and saturating the oxidation reaction within the oxidized silicon material to perfect substantially all loose chemical bonds between the silicon material and oxygen.
Claim 44
Dependent Claim
30 words
A method of fabricating a floating gate device according the claim 39, wherein said oxidizing step (f) comprises converting essentially all of the silicon material to an oxide of silicon.
Claim 45
Dependent Claim
32 words
A method of fabricating a floating gate device according to claim 40, wherein said oxidizing step (f) comprises providing an oxide of silicon suitable for an active element in a semiconductor device.
Claim 46
Dependent Claim
29 words
A method of fabricating a floating gate device according to claim 41, wherein said oxidizing step (f) comprises oxidizing the silicon material in an atmosphere comprising dry oxygen gas.
Claim 47
Independent Claim
72 words
A method of filling a trench with silicon oxide, comprising the steps of: (a) providing a substrate; (b) providing a trench in the substrate; (c) providing a silicon nitride layer in the trench; (d) providing polycrystalline silicon on the silicon nitride layer; and (e) oxidizing the polycrystalline silicon to fill the trench with silicon oxide and continuing the oxidation process until substantially all of the silicon material is converted to silicon oxide.
Claim 48
Independent Claim
72 words
A method of filling a trench with silicon oxide, comprising the steps of: (a) providing a substrate; (b) providing a trench in the substrate; (c) providing a silicon nitride layer in the trench; (d) providing polycrystalline silicon on the silicon nitride layer; and (e) oxidizing the polycrystalline silicon to fill the trench with silicon oxide and continuing the oxidation process until substantially all of the silicon material is converted to silicon oxide.
Claim 49
Dependent Claim
77 words
A method of filling a trench with silicon oxide according to claim 43, further comprising the steps of: providing silicon material on the silicon nitride layer after said step (c); and oxidizing the silicon material to form a silicon oxide layer and continuing the oxidation process until substantially all of the silicon material is converted to silicon oxide prior to said step (d); wherein said step (d) comprises providing the polycrystalline silicon on the silicon oxide layer.
Claim 50
Dependent Claim
43 words
A method of filling a trench with silicon oxide according to claim 44, wherein the trench has side walls and a bottom, further comprising the step of etching the polycrystalline silicon away from the bottom of the trench prior to said step (e).
References Cited (Backward Citations)
US3549411A
Cited
US3652324A
Cited
JPS4831034A
Cited
US3911168A
Cited
US4001465A
Cited
US4230745A
Cited
US4435447A
Cited
US4254161A
Cited
US4278705A
Cited
US4333964A
Cited
US4473598A
Cited
US4597159A
Cited
US4583281A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1991-12-06 | 1992-06-06 | 1992-12-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-12-06 | 1996-06-06 | 1996-12-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-12-06 | 2000-06-06 | 2000-12-06 | $7700.00 | Window Closed / Lapsed |