Patent US4784970A successfully refreshed from Google Patents.
US4784970A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Process for making a double wafer moated signal processor
Assignee: Grumman Corp
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Filing: 1987-11-18
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Granted: 1988-11-15
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Expires: 2007-11-18
Abstract
Abstract The method of forming a multiwafer integrated circuit for abutting electrical connection to external electronics is disclosed. The method comprises forming a plurality of grooves in the first surface of each of first and second wafers. The grooves are filled with a body of insulating material and joined along the groove surfaces thereof. In one embodiment active circuitry is formed in one of the abutting wafer surfaces. In another embodiment active circuitry is formed in a non-abutting surface of one of the wafers. Conductive leads are applied to the surface of one of the wafers to be in electrical communication with the doped regions. At least one of the conductive leads extends across at least a portion of the grooves. The wafers are trimmed in length so that the lengthwise edges of the wafers are defined by the grooves and the butt end of at least one of the conductive leads is exposed. A layer of conductive material is deposited along the lengthwise edge of the wafers in electrical communication with the exposed conductive lead to facilitate communication between the doped regions and external electronics.
Inventors
- 👤 Allen L. Solomon
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 08:20
CPC Classifications
H; H10; H10P; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10P90/1914; H10W; H10W10/00; H10W10/10; H10W10/181; H10W20/00; H10W20/01; H10W90/00; H10W72/00; H10W72/834; H10W90/20; H10W90/26; Y; Y10; Y10S; Y10S148/00; Y10S148/05; Y10S148/085
Claims Analysis
Total Claims: 19
Claim 1
Independent Claim
252 words
A method of forming an integrated circuit for abutting electrical connection with external electronics comprising: forming a plurality of grooves in a first surface of each of first and second wafers, each of said wafers having a length and a thickness, said grooves extending a portion of the thickness of each of the wafers; filling the grooves formed in said first and second wafers with a body of insulating material; joining the first and second wafers along the grooved surfaces thereof; thinning the first wafer so that the grooves formed therein extend the entire thickness of the first wafer; forming doped regions on a second surface of the first wafer; selectively applying conductive leads upon the second surface of said first wafer, said conductive leads being in electrical communication with the doped regions, at least one of said conductive leads extending across at least a portion of a groove formed in said first wafer; thinning the second wafer so that the grooves formed therein extend the entire thickness of the second wafer; trimming the length of the first and second wafers so that lengthwise edges of the first and second wafers are defined by the grooves and at least one of said conductive leads is exposed at a lengthwise edge of said first wafer; and depositing conductive material along at least one lengthwise edge of the wafers, said conductive material being in electrical communication with the exposed conductive lead and effective to facilitate electrical communication between the doped regions and external electronics.
Claim 2
Independent Claim
252 words
A method of forming an integrated circuit for abutting electrical connection with external electronics comprising: forming a plurality of grooves in a first surface of each of first and second wafers, each of said wafers having a length and a thickness, said grooves extending a portion of the thickness of each of the wafers; filling the grooves formed in said first and second wafers with a body of insulating material; joining the first and second wafers along the grooved surfaces thereof; thinning the first wafer so that the grooves formed therein extend the entire thickness of the first wafer; forming doped regions on a second surface of the first wafer; selectively applying conductive leads upon the second surface of said first wafer, said conductive leads being in electrical communication with the doped regions, at least one of said conductive leads extending across at least a portion of a groove formed in said first wafer; thinning the second wafer so that the grooves formed therein extend the entire thickness of the second wafer; trimming the length of the first and second wafers so that lengthwise edges of the first and second wafers are defined by the grooves and at least one of said conductive leads is exposed at a lengthwise edge of said first wafer; and depositing conductive material along at least one lengthwise edge of the wafers, said conductive material being in electrical communication with the exposed conductive lead and effective to facilitate electrical communication between the doped regions and external electronics.
Claim 3
Dependent Claim
39 words
The method as recited in claim 1 further comprising the step of depositing a second layer of insulating material along the first surface of said first wafer to cover exposed surfaces of said conductive leads and said doped regions.
Claim 4
Dependent Claim
27 words
The method as recited in claim 1 further comprising the step of depositing a second layer of insulating material along the first surface of said first wafer.
Claim 5
Dependent Claim
30 words
The method as recited in claim 3 wherein the step of depositing said second layer of insulating material is performed before filling the grooves with a body of insulating material.
Claim 6
Dependent Claim
27 words
The method as recited in claim 1 wherein the step of forming the doped regions is performed before filling the grooves with a body of insulating material.
Claim 7
Dependent Claim
27 words
The method as recited in claim 1 wherein the step of thinning the first wafer is performed before filling the grooves with a body of insulating material.
Claim 8
Dependent Claim
28 words
The method as recited in claim 6 wherein the step of thinning the second wafer is also performed before filling the grooves with a body of insulating material.
Claim 9
Dependent Claim
28 words
The method as recited in claim 1 wherein grooves in the first wafer are formed to have a different shape than the grooves formed in the second wafer.
Claim 10
Independent Claim
280 words
The method of forming a multiwafer integrated circuit for abutting electrical connection to external electronics comprising: forming a plurality of grooves in the surface of each of first and second wafers, each of said wafers having a length and a thickness, said grooves extending a portion of the thickness of each of the wafers; filling the grooves formed in said first and second wafers with a body of insulating material; forming doped regions on the first surface of said first wafer; selectively applying conductive leads upon the first surface of said first wafer, said conductive leads being in electrical communication with the doped regions, at least one of said conductive leads extending across at least a portion of a groove formed in said first wafer; depositing a first layer of insulating material along the first surface of said first wafer to cover exposed surfaces of said conductive leads and said doped region; joining said first and second wafers along the first surfaces thereof; thinning said first wafer so that the grooves formed therein extend the entire thickness of said first wafer; thinning the second wafer so that the grooves formed therein extend the entire thickness of the second wafer; trimming the length of said first and second wafers so that lengthwise edges of the first and second wafers are defined by the grooves formed therein, and at least one of said conductive leads is exposed at a lengthwise edge of said wafer; and depositing conductive material along at least one lengthwise edge of the wafers, said conductive material being in electrical communication with the exposed conductive lead and effective to facilitate electrical communication between the doped regions and external electronics.
Claim 11
Independent Claim
280 words
The method of forming a multiwafer integrated circuit for abutting electrical connection to external electronics comprising: forming a plurality of grooves in the surface of each of first and second wafers, each of said wafers having a length and a thickness, said grooves extending a portion of the thickness of each of the wafers; filling the grooves formed in said first and second wafers with a body of insulating material; forming doped regions on the first surface of said first wafer; selectively applying conductive leads upon the first surface of said first wafer, said conductive leads being in electrical communication with the doped regions, at least one of said conductive leads extending across at least a portion of a groove formed in said first wafer; depositing a first layer of insulating material along the first surface of said first wafer to cover exposed surfaces of said conductive leads and said doped region; joining said first and second wafers along the first surfaces thereof; thinning said first wafer so that the grooves formed therein extend the entire thickness of said first wafer; thinning the second wafer so that the grooves formed therein extend the entire thickness of the second wafer; trimming the length of said first and second wafers so that lengthwise edges of the first and second wafers are defined by the grooves formed therein, and at least one of said conductive leads is exposed at a lengthwise edge of said wafer; and depositing conductive material along at least one lengthwise edge of the wafers, said conductive material being in electrical communication with the exposed conductive lead and effective to facilitate electrical communication between the doped regions and external electronics.
Claim 12
Dependent Claim
27 words
The method as recited in claim 9 further comprising the step of depositing a second layer of insulating material along the first surface of said first wafer.
Claim 13
Dependent Claim
30 words
The method as recited in claim 10 wherein the step of depositing a second layer of insulating material is performed before filling the grooves with a body of insulating material.
Claim 14
Dependent Claim
27 words
The method as recited in claim 9 further comprising the step of depositing a second layer of insulating material along the first surface of said second wafer.
Claim 15
Dependent Claim
30 words
The method as recited in claim 10 wherein the step of depositing a second layer of insulating material is performed before filling the grooves with a body of insulating material.
Claim 16
Dependent Claim
31 words
The method as recited in claim 9 wherein a groove formed in the first wafer is filled with a body of insulating material prior to joining the first and second wafers.
Claim 17
Dependent Claim
28 words
The method as recited in claim 9 wherein the groove formed in the second wafer is filled with a body of insulating material after the wafers are joined.
Claim 18
Dependent Claim
22 words
The method as recited in claim 15 wherein the groove formed in the second wafer is filled after thinning the second wafer.
Claim 19
Dependent Claim
29 words
The method as recited in claim 9 wherein the grooves in the first wafer are formed to have a different shape than the grooves formed in the second wafer.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-11-15 | 1992-05-16 | 1992-11-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-11-15 | 1996-05-16 | 1996-11-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-11-15 | 2000-05-16 | 2000-11-15 | $7700.00 | Window Closed / Lapsed |