Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
176 words
A SEMICONDUCTOR BODY COMPRISING: A FIRST LAYER OF SEMICONDUCTOR MATERIAL OF A FIRST CONDUCTIVITY TYPE HAVING AN UPPER AND A LOWER SURFACE: A SUBSTANTIALLY PLANAR SECOND LAYER ADJACENT AND ADHERENT TO THE UPPER SURFACE OF SAID FIRST LAYER, SAID SECOND LAYER COMPRISING A MATERIAL THAT PROTECTS SAID UPPER SURFACE FROM UNWANTED CONTAMINATION: A THIRD LAYER OF SUPPORTING MATERIAL ADJACENT AND ADHERENT TO THE EXPOSED PORTION OF SAID SECOND LAYER, SAID THIRD LAYER MATERIAL CAPABLE OF BEING EASILY REMOVED BY A SUBSTANCE THAT WILL NOT AFFECT SAID SECOND LAYER: A FOURTH LAYER ADJACENT AND ADHERENT TO THE LOWER SURFACE OF SAID FIRST LAYER AND FORMED TO SEPARATE SAID FIRST LAYER INTO A PLURALITY OF SEPARATE AND DISTINCT REGIONS SAID FOURTH LAYER COMPRISING A MATERIAL THAT PROVIDES ELECTRICAL INSULATION ALONG THE ADJACENT FIRST LAYER LOWER SURFACE: A FIFTH LAYER ADJACENT AN ADHERENT TO THE EXPOSED PORTION OF SAID FOURTH LAYER AND COMPRISING A SUPPORTING MATERIAL, WHEREBY INTEGRATED CIRCUITS MAY READILY BE FORMED BY REMOVING SAID THIRD LAYER OF SUPPORTING MATERIAL AND PROCESSING THE REMAINING PORTION OF THE WAFER.
Claim 2
Dependent Claim
176 words
A SEMICONDUCTOR BODY COMPRISING: A FIRST LAYER OF SEMICONDUCTOR MATERIAL OF A FIRST CONDUCTIVITY TYPE HAVING AN UPPER AND A LOWER SURFACE: A SUBSTANTIALLY PLANAR SECOND LAYER ADJACENT AND ADHERENT TO THE UPPER SURFACE OF SAID FIRST LAYER, SAID SECOND LAYER COMPRISING A MATERIAL THAT PROTECTS SAID UPPER SURFACE FROM UNWANTED CONTAMINATION: A THIRD LAYER OF SUPPORTING MATERIAL ADJACENT AND ADHERENT TO THE EXPOSED PORTION OF SAID SECOND LAYER, SAID THIRD LAYER MATERIAL CAPABLE OF BEING EASILY REMOVED BY A SUBSTANCE THAT WILL NOT AFFECT SAID SECOND LAYER: A FOURTH LAYER ADJACENT AND ADHERENT TO THE LOWER SURFACE OF SAID FIRST LAYER AND FORMED TO SEPARATE SAID FIRST LAYER INTO A PLURALITY OF SEPARATE AND DISTINCT REGIONS SAID FOURTH LAYER COMPRISING A MATERIAL THAT PROVIDES ELECTRICAL INSULATION ALONG THE ADJACENT FIRST LAYER LOWER SURFACE: A FIFTH LAYER ADJACENT AN ADHERENT TO THE EXPOSED PORTION OF SAID FOURTH LAYER AND COMPRISING A SUPPORTING MATERIAL, WHEREBY INTEGRATED CIRCUITS MAY READILY BE FORMED BY REMOVING SAID THIRD LAYER OF SUPPORTING MATERIAL AND PROCESSING THE REMAINING PORTION OF THE WAFER.
Claim 3
Dependent Claim
28 words
The body recited in claim 1 wherein said first layer of semiconductor material comprises silicon, and said second and fourth layer materials respectively comprise an oxide of silicon.
Claim 4
Dependent Claim
25 words
The body recited in claim 1 wherein said first layer semiconductor material is monocrystalline and said third and fifth layers comprise respectively a semiconductor material.
Claim 5
Dependent Claim
35 words
The body recited in claim 3 wherein said first layer of semiconductor material comprises monocrystalline silicon, said second and fourth layers comprise respectively silicon dioxide, and said third and fifth layers comprise respectively polycrystaline silicon.
Claim 6
Dependent Claim
19 words
The body recited in claim 4 wherein the oxide of silicon in said second layer is suitable for masking.
Claim 7
Dependent Claim
20 words
The body recited in claim 5 wherein said fourth layer extends substantially through said first layer to said second layer.
Claim 8
Dependent Claim
26 words
The body recited in claim 6 wherein said first layer comprises at least two regions, with one region having a higher impurity concentration than the other.