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US4725984A Expired / Lapsed US ⏱️ 0.0 years remaining

CMOS eprom sense amplifier

Assignee: Atmel Corp
•
Filing: 1984-02-21
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Granted: 1988-02-16
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Expires: 2004-02-21
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Abstract

Abstract Individual CMOS floating-gate memory cells capable of storing data are arranged in an array structure and selected with horizontal and vertical access lines. Current flow through the array cells is measured, amplified, and then compared with an unprogrammed cell using the sense amplifier of the present invention. The sense amplifier tolerates increased variation in the characteristics of programmed or unprogrammed cells and therefore increases the manufacturing yields of the arrays. It additionally achieves fast accessing and sensing of the stored data.

Inventors

  • 👤 William W. Ip
  • 👤 Gust Perlegos

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 04:55
CPC Classifications
G; G11; G11C; G11C7/00; G11C7/06; G11C7/062; G11C16/00; G11C16/02; G11C16/06; G11C16/26; G11C16/28

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 180 words
A circuit for sensing a memory cell value, comprising: (a) a first floating gate transistor programmed with a memory data value, whose gate is electrically connected to a select line and whose drain is electrically connected to ground; (b) a first field effect transistor whose gate and drain are electrically connected to the source of said first floating gate transistor and whose source is electrically connected to a voltage source; (c) a second floating gate transistor programmed with a reference data value, whose gate is electrically connected to the gate of the first floating gate transistor and whose drain is electrically connected to ground; (d) a second field effect transistor whose gate is electrically connected to the gate of said first field effect transistor and whose source is electrically connected to a voltage source and whose drain is electrically connected to the source of said second floating gate transistor; whereby the voltage appearing at the node between said second floating gate transistor and said second field effect transistor is indicative of the data stored in said first floating gate transistor.
Claim 2
Dependent Claim 180 words
A circuit for sensing a memory cell value, comprising: (a) a first floating gate transistor programmed with a memory data value, whose gate is electrically connected to a select line and whose drain is electrically connected to ground; (b) a first field effect transistor whose gate and drain are electrically connected to the source of said first floating gate transistor and whose source is electrically connected to a voltage source; (c) a second floating gate transistor programmed with a reference data value, whose gate is electrically connected to the gate of the first floating gate transistor and whose drain is electrically connected to ground; (d) a second field effect transistor whose gate is electrically connected to the gate of said first field effect transistor and whose source is electrically connected to a voltage source and whose drain is electrically connected to the source of said second floating gate transistor; whereby the voltage appearing at the node between said second floating gate transistor and said second field effect transistor is indicative of the data stored in said first floating gate transistor.

References Cited (Backward Citations)

US4094008A Cited
US4179626A Cited
US4223394A Cited
US4301518A Cited
US4342102A Cited
US4494219A Cited
US4434479A Cited
US4459497A Cited
US4464591A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-02-15 1991-08-17 1992-02-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-02-15 1995-08-17 1996-02-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-02-15 1999-08-17 2000-02-16 $7700.00 Window Closed / Lapsed

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