Patent US4717680A successfully refreshed from Google Patents.
US4717680A
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US
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Fabrication of vertical NPN and PNP bipolar transistors in monolithic substrate
Assignee: Intersil Corp
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Filing: 1987-01-05
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Granted: 1988-01-05
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Expires: 2007-01-05
Abstract
Abstract Vertical PNP and the NPN transistors, each having a gain-bandwidth product greater than 1 GHz are formed in dielectrically isolated regions in polysilicon substrate. The substrate may include additionally dielectrically isolated regions for other devices such as thin oxide capacitors. On one surface of the substrate between the respective device regions a thick field insulator (oxide) layer is formed to minimize parasitics between interconnects and the substrate. Atop this thick field oxide one or more thin film resistors may be formed. Contacts and interconnect metallization for the bipolar devices, capacitors and thin film resistors are preferably made of silicon-doped-aluminum. In the course of manufacture of the PNP and NPN devices like conductivity type regions are formed simultaneously so as to control the parameters of each device. The relatively high f T of each device is achieved by reducing the time delays associated with the devices, through precise control of the parameters of impurity introduction (ion implantation and diffusion steps), so as to obtain narrow base widths (thereby reducing the base transit times), narrow and shallow emitters (for reduced emitter delay and base resistance), and shallow bases and a low resistivity substrate (for reduced device size (high integration density) and collector delay). To minimize the incidence of emitter leakage "pipes", which typically occur in shallow bipolar devices, controlled anneal and oxygen gettering steps are carried out and emitter sheet resistance is optimized. Preferably base contacts are formed by dual, narrow stripe diffusions on opposite sides of a narrow emitter stripe.
Inventors
- 👤 Leo R. Piotrowski
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 17:30
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/60; H10D84/67; H10D84/673; H10D84/01; H10D84/0112; H10D84/0119; H10D84/0121; H10D84/02; H10D84/03; H10D84/038; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/019; H10W10/10
Claims Analysis
Total Claims: 23
Claim 1
Independent Claim
184 words
A process for forming NPN and PNP devices dielectrically isolated P and N conductivity type regions in a semiconductor substrate comprising the steps of: (a) selectively introducing N type impurities into said dielectrically isolated P and N conductivity type regions to form bases of PNP devices and collector contact regions of NPN devices; (b) selectively introducing P type impurities into said dielectrically isolated P and N conductivity type regions to form collector contact regrons of PNP devices and bases of NPN devices; (c) selectively introducing P type impurities to a prescribed depth in the N bases of said PNP devices to form P emitter regions of PNP devices, the base widths of said PNP devices being defined between the bottoms of said P emitter regions and the bottoms of said N base regions; and (d) selectively introducing N-type impurities to a prescribed depth in the P bases of said NPN devices to form N emitter regions of NPN devices, the base widths of said NPN devices being defined between the bottoms of said N emitter regions and the bottoms of said P base regions.
Claim 2
Dependent Claim
184 words
A process for forming NPN and PNP devices dielectrically isolated P and N conductivity type regions in a semiconductor substrate comprising the steps of: (a) selectively introducing N type impurities into said dielectrically isolated P and N conductivity type regions to form bases of PNP devices and collector contact regions of NPN devices; (b) selectively introducing P type impurities into said dielectrically isolated P and N conductivity type regions to form collector contact regrons of PNP devices and bases of NPN devices; (c) selectively introducing P type impurities to a prescribed depth in the N bases of said PNP devices to form P emitter regions of PNP devices, the base widths of said PNP devices being defined between the bottoms of said P emitter regions and the bottoms of said N base regions; and (d) selectively introducing N-type impurities to a prescribed depth in the P bases of said NPN devices to form N emitter regions of NPN devices, the base widths of said NPN devices being defined between the bottoms of said N emitter regions and the bottoms of said P base regions.
Claim 3
Dependent Claim
35 words
A process according to claim 1, wherein step (c) includes selectively introducing P type impurities into collector contact regions of PNP devices and bases of NPN devices, to form respective P type contact areas thereof.
Claim 4
Dependent Claim
35 words
A process according to claim 2, wherein step (d) includes selectively introducing N type impurities into collector contact regions of NPN devices and bases of PNP devices, to form respective N type contact areas thereof.
Claim 5
Dependent Claim
45 words
A process according to claim 2, wherein step (c) includes selectively introducing P type impurities into respective areas of the bases of said NPN devices adjacent to opposite sides of those portions thereof wherein the emitters of said NPN devices are formed in step (d).
Claim 6
Dependent Claim
43 words
A process according to claim 4, wherein step (a) includes selectively introducing N type impurities into respective areas of said dielectrically isolated N-type regions adjacent to opposite sides of those portions thereof wherein bases of said NPN devices are formed in steps (b).
Claim 7
Dependent Claim
35 words
A process according to claim 1, wherein step (d) includes selectively introducing N type impurities into collector contact regions of NPN devices and bases of PNP devices, to form respective N type contact areas thereof.
Claim 8
Dependent Claim
36 words
A process according to claim 6, wherein step (d) includes selectively introducing N type impurities into respective areas of the bases of said PNP devices adjacent to opposite sides of the emitters of said PNP devices.
Claim 9
Dependent Claim
44 words
A process according to claim 7, wherein step (b) includes selectively introducing P type impurities into respective areas of said dielectrically isolated P type regions adjacent to opposite sides of those portions thereof wherein bases of said PNP devices are formed in step (a).
Claim 10
Dependent Claim
111 words
A process according to claim 1, wherein said dielectrically isolated P and N conductivity type regions are monocrystalline P and N regions dielectrically isolated from an adjoining polycrystalline substrate by an oxide layer therebetween, and wherein said process further includes, prior to steps (a)-(d), the steps of: (e) annealing said substrate so as to effectively reduce linear defects in said P and N regions and to out-diffuse oxygen from the surface of said substrate; and (f) contacting said substrate with a prescribed volumetric ratio of chlorine in a carrier so as to tie up oxygen in said substrate and thereby prevent defects in the surface of said P and N regions.
Claim 11
Dependent Claim
30 words
A process according to claim 9, wherein step (e) includes the steps of forming a thin oxide layer on said substrate and then annealing said substrate in a nitrogen atmosphere.
Claim 12
Dependent Claim
43 words
A process according to claim 1, further including the step of selectively forming a thick field oxide on the surface of said substrate so as to cover at least portions of said substrate between said dielectrically isolated P and N conductivity type regions.
Claim 13
Dependent Claim
21 words
A process according to claim 11, further including the step of forming a thin film resistor of said thick field oxide.
Claim 14
Dependent Claim
62 words
A process according to claim 1, further including the steps of: (e) forming an N+ region in a surface portion of an N region; (f) forming a thin insulation layer on the surface of said N+ region; and (g) forming a conductive layer on said thin insulation layer, so as to form a capacitor between said conductive layer and said N+ region.
Claim 15
Dependent Claim
33 words
A process according to claim 13, further including the step of (h) forming silicon-aluminum metallization contacts for the emitter, base and collector regions of said PNP and NPN devices and for said capacitor.
Claim 16
Dependent Claim
43 words
A process accordingto claim 1, wherein step (a) comprises implanting N type ions and diffusing said implanted N-type ions by varying the temperature of said substrate over range of from 950° to 1,100° C. to form said N bases of said PNP devices.
Claim 17
Dependent Claim
45 words
A process according to claim 15, wherein step (b) comprises implanting P type ions and diffusing said implanted P-type ions by varying the temperature of said substrate over a range of from 950° C. to 1,100° C. form said P bases of said NPN devices.
Claim 18
Dependent Claim
29 words
A process according to claim 16, wherein step (c) comprises implanting P type ions and diffusing said implanted P-type ions at a temperature on the order of 1,000° C.
Claim 19
Dependent Claim
37 words
A process according to claim 17, wherein step (d) comprises depositing N type impurties and diffusing the deposited N type impurities at a temperature to provide a sheet resistance on the order of 15-20 ohms per square.
Claim 20
Dependent Claim
24 words
A process according to claim 1, wherein the selective introduction of impurities carried out in steps (a)-(c) is effected by ion implantation and diffusion.
Claim 21
Dependent Claim
23 words
A process according to claim 19, wherein the selective introduction of impurities carried out in step (d) is effected by deposition and diffusion.
Claim 22
Dependent Claim
202 words
A process for forming bipolar devices in dielectrically isolated first and second conductivity type regions in a semiconductor substrate comprising the steps of: (a) selectively introducing first type impurities into said dielectrically isolated second and first conductivity type regions to form bases of first bipolar devices and collector contact regions of second bipolar devices; (b) selectively introducing second type impurities into said dielectrically isolated second and first conductivity type regions to form collector contact regions of first bipolar devices and bases of second bipolar devices; (c) selectively introducing second type impurities to a prescribed depth in the said first type bases of said first bipolar devices to form first emitter regions of first bipolar devices, the base widths of said first bipolar devices being defined between the bottoms of said second type emitter regions and the bottoms of said first type base regions; and (d) selectively introducing first type impurities to a prescribed depth in the second type bases of said second bipolar devices to form first type emitter regions of second bipolar devices, the base widths of said second bipolar devices being defined between the bottoms of said first type emitter regions and the bottoms of said first second base regions.
Claim 23
Dependent Claim
202 words
A process for forming bipolar devices in dielectrically isolated first and second conductivity type regions in a semiconductor substrate comprising the steps of: (a) selectively introducing first type impurities into said dielectrically isolated second and first conductivity type regions to form bases of first bipolar devices and collector contact regions of second bipolar devices; (b) selectively introducing second type impurities into said dielectrically isolated second and first conductivity type regions to form collector contact regions of first bipolar devices and bases of second bipolar devices; (c) selectively introducing second type impurities to a prescribed depth in the said first type bases of said first bipolar devices to form first emitter regions of first bipolar devices, the base widths of said first bipolar devices being defined between the bottoms of said second type emitter regions and the bottoms of said first type base regions; and (d) selectively introducing first type impurities to a prescribed depth in the second type bases of said second bipolar devices to form first type emitter regions of second bipolar devices, the base widths of said second bipolar devices being defined between the bottoms of said first type emitter regions and the bottoms of said first second base regions.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-01-04 | 1991-07-06 | 1992-01-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-01-04 | 1995-07-06 | 1996-01-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-01-04 | 1999-07-06 | 2000-01-05 | $7700.00 | Window Closed / Lapsed |