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US4716451A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor device with internal gettering region

Assignee: Intersil Corp
•
Filing: 1982-12-10
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Granted: 1987-12-29
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Expires: 2002-12-10
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Abstract

Abstract A semiconductor device includes a substrate of single crystalline silicon having the active regions of a semiconductor element, such as the source, drain, channel and gates, along one surface of the substrate, and a thin gettering region of a gettering material in the substrate. The gettering region is spaced from both surfaces of the substrate and is adjacent the active regions of the semiconductor element so as to getter contaminants in the substrate from the area of the substrate containing the semiconductor element.

Inventors

  • 👤 Sheng T. Hsu
  • 👤 Doris W. Flatley

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 06:59
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/80; H10D84/82; H10D84/83; H10D84/85; H10D84/859; H10P; H10P36/00; H10P36/03; H10W; H10W15/00; H10W15/01

Claims Analysis

Total Claims: 10
Claim 1
Independent Claim 70 words
A semiconductor device comprising: a substrate of single crystalline silicon having opposed surfaces, the active region of at least one semiconductor element on said substrate adjacent one of said surfaces, and means for gettering including a thin gettering region of a substantially unannealed gettering material in said substrate spaced from both said surfaces and extending adjacent but spaced from the active regions of at least one of said semiconductor elements.
Claim 2
Dependent Claim 70 words
A semiconductor device comprising: a substrate of single crystalline silicon having opposed surfaces, the active region of at least one semiconductor element on said substrate adjacent one of said surfaces, and means for gettering including a thin gettering region of a substantially unannealed gettering material in said substrate spaced from both said surfaces and extending adjacent but spaced from the active regions of at least one of said semiconductor elements.
Claim 3
Dependent Claim 35 words
A semiconductor device in accordance with claim 1 in which the gettering region ions are of the same conductivity type but in a higher concentration than is contained in the surrounding portions of the substrate.
Claim 4
Dependent Claim 34 words
A semiconductor device in accordance with cliam 2 in which the portion of the substrate across which the gettering region extends is of P type conductivity and the gettering material is ions of boron.
Claim 5
Dependent Claim 34 words
A semiconductor device in accordance with cliam 2 in which the portion of the substrate across which the gettering region extends is of P type conductivity and the gettering material is ions of boron.
Claim 6
Dependent Claim 104 words
A semiconductor device comprising: a substrate of single crystalline silicon having opposed surfaces, a pair of adjacent wells in said substrate along one of said surfaces, one of said wells being of one conductivity type and the other of said wells being of the opposite conductivity type, the active region of at least one semiconductor element being along said surface at one of said wells, and means for gettering including a thin gettering region of a substantially unannealed gettering material extending across one of said wells spaced from both of said surfaces and adjacent to but spaced from the active regions in said well.
Claim 7
Dependent Claim 104 words
A semiconductor device comprising: a substrate of single crystalline silicon having opposed surfaces, a pair of adjacent wells in said substrate along one of said surfaces, one of said wells being of one conductivity type and the other of said wells being of the opposite conductivity type, the active region of at least one semiconductor element being along said surface at one of said wells, and means for gettering including a thin gettering region of a substantially unannealed gettering material extending across one of said wells spaced from both of said surfaces and adjacent to but spaced from the active regions in said well.
Claim 8
Dependent Claim 31 words
A semiconductor device in accordance with claim 4 in which the gettering region contains ions of the same conductivity type but in higher concentration than the ions in the one well.
Claim 9
Dependent Claim 26 words
A semiconductor device in accordance with claim 5 in which the one well is of P type conductivity and the gettering material is ions of boron.
Claim 10
Dependent Claim 25 words
A semiconductor device in accordance with claim 6 in which the one well includes at least one MOS transistor element and the semiconductor element therein.

References Cited (Backward Citations)

US3465209A Cited
US3457632A Cited
US3556879A Cited
US3946425A Cited
US3838440A Cited
US4053925A Cited
US4053335A Cited
US4454523A Cited
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US4435895A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-12-28 1991-06-29 1991-12-29 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-12-28 1995-06-29 1995-12-29 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-12-28 1999-06-29 1999-12-29 $7700.00 Window Closed / Lapsed

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