Device for conveying components particularly integrated chips, from an input magazine to an output magazine

Claim 1

In a device for conveying components received in individual, separate receiving portions of an input magazine, to individual, separate receiving portions of an output magazine, with a testing device arranged between the input magazine and the output magazine, to which are supplied, one after the other, by means of a first conveyor device, the individual components, from the receiving portions of the input magazine, for testing, and which discharges the tested components to a second conveyor device, which enables the components to be discharged to a receiving portion of the output magazine established by the testing device, the combination of storage and indicating devices associated with each receiving portion of the output magazine, which devices are each capable of storing and indicating information corresponding to a component testing or measuring class, and means for moving the second conveyor device in such a manner, relative to the receiving portions of the output magazine on the basis of comparison of data from said testing device and preassigned data stored in the individual storage and indicating devices, that a component, established by the testing device as belonging to a certain component testing or measuring class, can be discharged into the receiving portions associated with this testing or measuring class, said means for moving the second conveyor device also being operative to assign to the storage and indicating device of an available receiving portion a testing or measuring class corresponding to data received from said testing device which does not correspond to preassigned data and to discharge components of such testing or measuring class into said receiving portion.