Integrated circuit handler

Claim 2

An integrated circuit handling machine for handling and sorting integrated circuit chips, including means for supplying circuit chips to be tested in an upright column, first means to retain said column by retaining the lower chip in a holding position, a plurality of selectively operable second means each being operable to selectively retain from downward movement a second chip in said column and all chips in the column above the second chip, means to select and render operable one of said second means, each of said selectively operable second means being positioned to engage a second chip of a stack of chips of different length than the chips used with the other second means means to selectively release said first means while one of said second means is retaining a second chip to permit said lower chip to move, a chip testing station on said machine and guide means on said machine positioned to guide a released lower chip to the testing station.

Claim 3

The machine of claim 1 and a guide on said machine adjacent said column of chips, said second means comprising a movable member, and means to move said movable member into engagement with a side surface of said second chip to frictionally clamp said second chip against said guide when the second means is retaining said second chip.

Claim 4

An integrated circuit chip handler including a frame, means providing a supply of integrated circuit chips having electical leads thereon, a testing station, means to support an integrated circuit chip in said testing station, a test circuitry for connecting to said integrated circuit chip in said testing station, and an interface board removably mounted on said frame, said interface board including a plurality of movable contacts aligned with leads of an integrated circuit chip in said testing station, means to move said contacts to and from position engaging leads of said integrated circuit chip in said testing station, remote connection means for connection of remote circuitry leading from said interface board, and circuit path means on said interface board for electrically connecting said contacts and said remote connection means.

Claim 5

An integrated circuit chip handler including a frame, means providing a supply of integrated circuit chips having electical leads thereon, a testing station, means to support an integrated circuit chip in said testing station, a test circuitry for connecting to said integrated circuit chip in said testing station, and an interface board removably mounted on said frame, said interface board including a plurality of movable contacts aligned with leads of an integrated circuit chip in said testing station, means to move said contacts to and from position engaging leads of said integrated circuit chip in said testing station, remote connection means for connection of remote circuitry leading from said interface board, and circuit path means on said interface board for electrically connecting said contacts and said remote connection means.

Claim 6

The combination of claim 3 wherein said last mentioned means comprises circuit paths which are not continuous between said remote connection means and said contacts, and path patch cord connection means for completing electrical connection between selected ones of said contacts and remote connection means.

Claim 7

The combination of claim 3 wherein said contacts comprise contact arms mechanically mounted on said interface board and biased to an open position, and means to move said contacts to a closed position wherein said contacts resiliently engage the leads on said integrated circuit chip held in said testing station.

Claim 8

An integrated circuit handling machine for sorting chip bodies having integrated circuits thereon in response to external test signals including means for supplying chip bodies having integrated circuits to be tested, means defining a testing position, guide means for guiding said chip bodies from the means to supply to the testing position, said guide means comprising a generally upright rib extending above the testing position so that the chip bodies having integrated circuits thereon will move under gravity along said rib when unrestrained, each of said chip bodies having contact leads extending outwardlY from said chip body and arranged substantially parallel and spaced apart, said rib being of size to fit between said spaced contact leads, means to hold said chip bodies individually in testing position, test means at the testing position for connecting to the integrated circuit on a chip body in the test position through said contact leads and to provide a sort signal indicating a sort category for a tested integrated circuit, means to release the chip body having a tested integrated circuit from the retaining means, a sorting section for receiving chip bodies having tested integrated circuits, and means comprising a guide member pivotally mounted about an axis substantially perpendicular to the path of travel of a chip body having a tested integrated circuit from said testing position to said sorting section and movable between a plurality of positions, a plurality of storage means for storing chip bodies passing through said sorting section, said guide member being movable to one of its positions to guide a chip body having a tested integrated circuit from said testing position selectively to one of the plurality of storage means in response to a particular sort signal, separate means positioned between said guide member and each of said storage means to normally intercept chip bodies moving toward any individual storage means comprising a stop rod for each individual storage means, bias means to normally move said stop rods into the path of travel of a chip body moving from said sorting section toward the respective storage means associated with each of said stop rods, and means to withdraw one of the stop rods to permit passage of a chip body to an associated storage means in response to a sort signal moving the guide member to guide a chip body to that storage means.

Claim 9

An integrated circuit handling machine for sorting chip bodies having integrated circuits thereon in response to external test signals including means for supplying chip bodies having integrated circuits to be tested, means defining a testing position, guide means for guiding said chip bodies from the means to supply to the testing position, said guide means comprising a generally upright rib extending above the testing position so that the chip bodies having integrated circuits thereon will move under gravity along said rib when unrestrained, each of said chip bodies having contact leads extending outwardlY from said chip body and arranged substantially parallel and spaced apart, said rib being of size to fit between said spaced contact leads, means to hold said chip bodies individually in testing position, test means at the testing position for connecting to the integrated circuit on a chip body in the test position through said contact leads and to provide a sort signal indicating a sort category for a tested integrated circuit, means to release the chip body having a tested integrated circuit from the retaining means, a sorting section for receiving chip bodies having tested integrated circuits, and means comprising a guide member pivotally mounted about an axis substantially perpendicular to the path of travel of a chip body having a tested integrated circuit from said testing position to said sorting section and movable between a plurality of positions, a plurality of storage means for storing chip bodies passing through said sorting section, said guide member being movable to one of its positions to guide a chip body having a tested integrated circuit from said testing position selectively to one of the plurality of storage means in response to a particular sort signal, separate means positioned between said guide member and each of said storage means to normally intercept chip bodies moving toward any individual storage means comprising a stop rod for each individual storage means, bias means to normally move said stop rods into the path of travel of a chip body moving from said sorting section toward the respective storage means associated with each of said stop rods, and means to withdraw one of the stop rods to permit passage of a chip body to an associated storage means in response to a sort signal moving the guide member to guide a chip body to that storage means.