Module tester and sorter for use in a module test system

Claim 2

Apparatus for testing and sorting modules into module-receiving bins comprising a frame carrying a downwardly-inclined chute configured to receive the modules in file orientation, a test station on said chute, said test station including means for testing the modules to determine certain electrical characteristics thereof as they pass through the test station, a sorting station carried by the frame below the test station and in alignment with the chute, a wheel carrying a number of module-receiving buckets rotatably mounted on the frame, drive means for rotating the wheel so that the buckets stop one after the other at the sorting station and indexing the wheel only when a module is received by a bucket located at the sorting station, said sorting station including sorting means responsive to said testing means for passing modules with certain electrical characteristics through a bucket at the sorting station and into a bin and temporarily retaining modules with other characteristics in the buckets for deposit in another bin, each bucket includes a jaw, the sorting means including means for opening the jaw of a bucket located at the sorting station to enable a module to pass through said bucket.

Claim 3

Apparatus for testing and sorting modules into modulereceiving bins comprising a frame carrying a downwardly-inclined chute configured to receive the modules in file orientation, a test station on said chute, said test station including means for testing the modules to determine certain electrical characteristics thereof as they pass through the test station, a sorting station carried by the frame below the test station and in alignment with the chute, a wheel carrying a number of module-receiving buckets rotatably mounted on the frame, drive means for rotating the wheel so that the buckets stop one after the other at the sorting station and indexing the wheel only when a module is received by a bucket located at the sorting station, said sorting station including sorting means responsive to said testing means for passing modules with certain electrical characteristics through a bucket at the sorting station and into a bin and temporarily retaining modules with other characteristics in the buckets for deposit in another bin, each bucket includes a jaw, the sorting means including means for opening the jaw of a bucket located at the sorting station to enable a module to pass through said bucket.

Claim 4

Apparatus for testing and sorting modules into modulereceiving bins comprising a frame carrying a downwardly-inclined chute configured to receive the modules in file orientation, a test station on said chute, said test station including means for testing the modules to determine certain electrical characteristics thereof as they pass through the test station, a sorting station carried by the frame below the test station and in alignment with the chute, a wheel carrying a number of module-receiving buckets rotatably mounted on the frame, drive means for rotating the wheel so that the buckets stop one after the other at the sorting station and indexing the wheel only when a module is received by a bucket located at the sorting station, said sorting station including sorting means responsive to said testing means for passing modules with certain electrical characteristics through a bucket at the sorting station and into a bin and temporarily retaining modules with other characteristics in the buckets for deposit in another bin, each bucket includes a jaw, the sorting means including means for opening the jaw of a bucket located at the sorting station to enable a module to pass through said bucket.

Claim 5

Apparatus for testing and sorting modules as set forth in claim 1 wherein each of the buckets has a spring member biasing its jaw to a closed position.

Claim 6

Apparatus for testing and sorting modules as set forth in claim 2 wherein each jaw carries a floor which protrudes into the chute.

Claim 7

Apparatus for testing and sorting modules as set forth in claim 2 wherein the sorting means further comprises a number of solenoid drives carried by the frame, circumferentially spaced about the path of rotation of the wheel, each said drive including an arm for engaging a jaw of a bucket in alignment therewith, a module-receiving bin being situated in alignment below each solenoid drive.

Claim 8

Apparatus for testing and sorting modules into module-receiving bins comprising a frame carrying a downwardly-inclined chute configured to receive the modules in file orientation, a test station on said chute, said test station including means for testing the modules to determine certain electrical characteristics thereof as they pass through the test station, a sorting station carried by the frame below the test station and in alignment with the chute, a wheel carrying a number of module-receiving buckets rotatably mounted on the frame, drive means for rotating the wheel so that the buckets stop one after the other at the sorting station and indexing the wheel only when a module is received by a bucket located at the sorting station, said sorting station including sorting means responsive to said testing means for passing modules with certain electrical characteristics through a bucket at the sorting station and into a bin and temporarily retaining modules with other characteristics in the buckets for deposit in another bin, the testing means includes a probe assembly having an array of contact fingers, and means for shifting said fingers in a direction transverse of the chute and into contact with a module at the testing station.

Claim 9

Apparatus for testing and sorting modules into module-receiving bins comprising a frame carrying a downwardly-inclined chute configured to receive the modules in file orientation, a test station on said chute, said test station including means for testing the modules to determine certain electrical characteristics thereof as they pass through the test station, a sorting station carried by the frame below the test station and in alignment with the chute, a wheel carrying a number of module-receiving buckets rotatably mounted on the frame, drive means for rotating the wheel so that the buckets stop one after the other at the sorting station and indexing the wheel only when a module is received by a bucket located at the sorting station, said sorting station including sorting means responsive to said testing means for passing modules with certain electrical characteristics through a bucket at the sorting station and into a bin and temporarily retaining modules with other characteristics in the buckets for deposit in another bin, the testing means includes a probe assembly having an array of contact fingers, and means for shifting said fingers in a direction transverse of the chute and into contact with a module at the testing station.

Claim 10

Apparatus for testing and sorting modules as set forth in claim 5, the modules comprisinG memory modules with a set of contact pins, and wherein the array of contact fingers is complementary to the array of pins of the module.