Comprehensive testing system

Claim 1

AN ELECTRICAL SYSTEM FOR MAKING A SERIES OF DIFFERENT ELECTRICAL TESTS ON ELECTRONIC DEVICES WHICH ARE SUPPLIED AUTOMATICALLY TO A PLURALITY OF TEST STATIONS IN A SERIAL ORDER, AND FOR ULTIMATELY SORTING THE DEVICES ON THE BASIS OF THEIR ELECTRICAL PARAMETERS AS MEASURED AT SAID TEST STATIONS, SAID ELECTRICAL SYSTEM INCLUDING IN COMBINATION: (A) A PLURALITY OF TESTING CIRCUIT MEANS, ONE FOR EACH OF SAID TEST STATIONS, FOR PERFORMING A SERIES OF DIFFERENT VOLTAGE-CURRENT TESTS ON EACH OF SAID ELECTRONIC DEVICES ON THE BASIS OF ONE TEST AT EACH SAID TEST STATION SO THAT A PLURALITY OF TEST OUTPUT SIGNALS REPRESENTING MEASURED VALUES OF THE PARAMETERS OF EACH SAID DEVICE ARE SUPPLIED SEQUENTIALLY FROM SAID TESTING CIRCUIT MEANS, (B) MEANS FOR EVALUATING SAID TEST OUTPUT SIGNALS FROM SAID TESTING CIRCUIT MEANS INCLUDING A COMPUTER FOR STORING THE INDIVIDUAL TEST OUTPUT SIGNALS FOR A GIVEN DEVICE UNTIL THE SERIES OF TESTS FOR THAT DEVICE IS COMPLETED BY SAID TESTING CIRCUIT MEANS, AND FOR THEN COMPARING THE MEASURED PARAMETER VALUES REPRESENTED BY SAID TEST OUTPUT SIGNALS ON A PRIORITY BASIS AGAINST PARAMETER LIMITES FOR A PLURALITY OF ELECTRICAL CATEGORIES SO AS TO CLASSIFY SUCH DEVICE INTO THE HIGHEST PRIORITY CATEGORY THAT IS SATISFIED BY THE PARAMETERS OF SAID DEVICE AS MEASURED BY SAID TESTING CIRCUIT MEANS, (C) AND MEANS CONTROLLED ELECTRICALLY BY SAID COMPUTER FOR RECEIVING SAID DEVICES FROM SAID TEST STATIONS AND FOR AUTOMATICALLY SORTING SAID DEVICES INTO A PLURALITY OF GROUPS CORRESPONDING TO THE ELECTRICAL CATEGORIES INTO WHICH SAID DEVICES HAVE BEEN CLASSIFIED BY SAID COMPUTER.