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US4682204A Expired / Lapsed US ⏱️ 0.0 years remaining

Fuse element for integrated circuit memory device

Assignee: Toshiba Corp
•
Filing: 1985-12-11
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Granted: 1987-07-21
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Expires: 2005-12-11
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Abstract

Abstract A fuse element prepared from, for example, polycrystalline silicon is deposited on an insulating layer provided on the main surface of a semiconductor substrate in which an IC memory is formed. Connecting portions are integrally formed at both ends of the melting away portion of the fuse element. Each of the connecting portions has a stepped surface having stepped sections. The stepped surface is tightly contacted with a stepped surface having stepped sections formed on the insulating layer.

Inventors

  • 👤 Masakazu Shiozaki
  • 👤 Hidetaro Nishimura

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 00:28
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W20/49; H10W20/493; G; G11; G11C; G11C17/00; G11C17/14; G11C17/16

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 170 words
A fuse element for use within an integrated memory which is formed on an insulation layer mounted on a semiconductor substrate having said integrated memory formed thereon and prepared from a prescribed material to be thermally broken off in case of need, comprising: a melting away portion; connecting portions which are integrally formed at both ends of said melting away portions with a greater width than that of said melting away portion for connecting said melting away portion to said integrated memory; each of said connecting portions being provided with a plurality of paired step sections for increasing the heat capacity of said connecting portions, said plurality of paired stepped sections tightly contacting the surface of corresponding paired step sections formed on said insulating layer, each said paired step section of said connecting portion including a first step which steps down from a first level to a second level and a second step which steps up from said second level to a third level coplanar with the said first level.
Claim 2
Dependent Claim 170 words
A fuse element for use within an integrated memory which is formed on an insulation layer mounted on a semiconductor substrate having said integrated memory formed thereon and prepared from a prescribed material to be thermally broken off in case of need, comprising: a melting away portion; connecting portions which are integrally formed at both ends of said melting away portions with a greater width than that of said melting away portion for connecting said melting away portion to said integrated memory; each of said connecting portions being provided with a plurality of paired step sections for increasing the heat capacity of said connecting portions, said plurality of paired stepped sections tightly contacting the surface of corresponding paired step sections formed on said insulating layer, each said paired step section of said connecting portion including a first step which steps down from a first level to a second level and a second step which steps up from said second level to a third level coplanar with the said first level.
Claim 3
Dependent Claim 18 words
The fuse element according to claim 1, wherein said prescribed material of said fuse element is polycrystalline silicon.
Claim 4
Dependent Claim 17 words
The fuse element according to claim 1, wherein said prescribed material of said fuse element is aluminum.

References Cited (Backward Citations)

US3564354A Cited
US3767981A Cited
US3792319A Cited
US4023197A Cited
US4151546A Cited
US4267633A Cited
JPS5366380A Cited
US4209894A Cited
JPS5724565A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-07-20 1991-01-19 1991-07-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-07-20 1995-01-19 1995-07-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-07-20 1999-01-19 1999-07-21 $7700.00 Window Closed / Lapsed

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