Gas control for X-ray lithographic system

Claim 2

An X-ray lithographic system in which an X-ray mask including a patterned mask membrane is positioned in spaced alignment with a semiconductor wafer substrate having an X-ray sensitive resist material thereon, said system comprising an X-ray source, a chamber though which X-rays are passed to an exit therein to a patterned mask membrane sealing said exit, means for flowing a low X-ray-attenuation gas into said chamber at a pressure near the ambient surrounding the outside of the chamber and means for venting said gas from said chamber in a controlled manner such that the gas pressure at said mask prevents ingress of contaminating gas into said chamber and does not significantly deflect said mask membrane with respect to the semiconductor wafer substrate and the velocity of venting gas is sufficient to prevent back diffusion of contaminating gases into said chamber, said means for venting comprising an inverted U-shaped vent tube extending at a first end from a position in said chamber adjacent a bottom portion of said chamber upwardly to a position outwardly of said chamber, said tube then extending downwardly to a second end of said tube exterior of said chamber and terminating in an orifice at a level approximate the level of the mask membrane.

Claim 3

An X-ray lithographic system in which an X-ray mask including a patterned mask membrane is positioned in spaced alignment with a semiconductor wafer substrate having an X-ray sensitive resist material thereon, said system comprising an X-ray source, a chamber through which X-rays are passed to an exit therein to a patterned mask membrane sealing said exit, means for flowing a low X-ray-attenuation gas into said chamber at a pressure near the ambient surrounding the outside of the chamber and means for venting said gas from said chamber in a controlled manner such that the gas pressure at said mask prevents ingress of contaminating gas into said chamber and does not significantly deflect said mask membrane with respect to the semiconductor wafer substrate and the velocity of venting gas is sufficient to prevent back diffusion of contaminating gases into said chamber; and wherein said chamber is oriented vertically and in which said means for venting includes an inverted U-shaped vent tube extending first upwardly from said chamber to a position outwardly of said chamber, said tube then extending downwardly to an end orifice of said tube exterior of said chamber at a level approximate the level of the mask membrane.

Claim 4

An X-ray lithographic system in which an X-ray mask including a patterned mask membrane is positioned in spaced alignment with a semiconductor wafer substrate having an X-ray sensitive resist material thereon, said system comprising an X-ray source, a chamber through which X-rays are passed to an exit therein to a patterned mask membrane sealing said exit, means for flowing a low X-ray-attenuation gas into said chamber at a pressure near the ambient surrounding the outside of the chamber and means for venting said gas from said chamber in a controlled manner such that the gas pressure at said mask prevents ingress of contaminating gas into said chamber and does not significantly deflect said mask membrane with respect to the semiconductor wafer substrate and the velocity of venting gas is sufficient to prevent back diffusion of contaminating gases into said chamber; and wherein said chamber is oriented vertically and in which said means for venting includes an inverted U-shaped vent tube extending first upwardly from said chamber to a position outwardly of said chamber, said tube then extending downwardly to an end orifice of said tube exterior of said chamber at a level approximate the level of the mask membrane.

Claim 5

The invention as set forth in claim 2 further including means for tuning the level of said end orifice to vary the pressure on a side of the patterned mask membrane facing said X-ray source and adjust pressure differentials across the patterned mask membrane.

Claim 6

The invention as set forth in claim 1 further comprising means for maintaining a process gas atmosphere in a zone surrounding a side of said mask membrane, facing away from said X-ray source, and said substrate to prevent ingress of contaminants and ambient atmosphere to said zone, said process gas atmosphere being at a gas pressure that does not significantly deflect said mask membrane with respect to said substrate.

Claim 7

An X-ray lithographic system in which an X-ray mask including a patterned mask membrane is positioned in spaced alignment with a semiconductor wafer substrate having an X-ray sensitive resist material thereon, said system comprising: an X-ray source, a low attenuation chamber through which X-rays are passed to an exit therein to a patterned mask membrane sealing said exit; means for flowing a low X-ray-attenuation gas into said chamber at a pressure near the ambient surrounding the outside of the chamber and means for venting said gas from said chamber in a controlled manner such that the gas pressure at said mask prevents ingress of contaminating gas into said chamber and does not significantly deflect said mask membrane with respect to the semiconductor wafer substrate and the velocity of venting gas is sufficient to prevent back diffusion of contaminating gases into said chamber; means for maintaining a process gas atmosphere in a zone surrounding a side of said mask membrane, facing away from said X-ray source, and said substrate to prevent ingress of contaminants and ambient atmosphere to said zone, said process gas atmosphere being at a gas pressure that does not significantly deflect said mask membrane with respect to said substrate; and wherein said means for maintaining a process gas atmosphere includes a gas flange having a planar surface extending parallel to and spaced from said mask membrane and means for flowing a process gas into said zone and past said gas flange.

Claim 8

An X-ray lithographic system in which an X-ray mask including a patterned mask membrane is positioned in spaced alignment with a semiconductor wafer substrate having an X-ray sensitive resist material thereon, said system comprising: an X-ray source, a low attenuation chamber through which X-rays are passed to an exit therein to a patterned mask membrane sealing said exit; means for flowing a low X-ray-attenuation gas into said chamber at a pressure near the ambient surrounding the outside of the chamber and means for venting said gas from said chamber in a controlled manner such that the gas pressure at said mask prevents ingress of contaminating gas into said chamber and does not significantly deflect said mask membrane with respect to the semiconductor wafer substrate and the velocity of venting gas is sufficient to prevent back diffusion of contaminating gases into said chamber; means for maintaining a process gas atmosphere in a zone surrounding a side of said mask membrane, facing away from said X-ray source, and said substrate to prevent ingress of contaminants and ambient atmosphere to said zone, said process gas atmosphere being at a gas pressure that does not significantly deflect said mask membrane with respect to said substrate; and wherein said means for maintaining a process gas atmosphere includes a gas flange having a planar surface extending parallel to and spaced from said mask membrane and means for flowing a process gas into said zone and past said gas flange.

Claim 9

The invention as set forth in claim 5 in which said substrate is mounted on a chuck and wherein said gas flange is sealed by a flexible seal to said chuck and said mask includes a mask frame sealed by a flexible seal to a mask holder supporting said mask.

Claim 10

The invention as set forth in claim 6 in which said gas flange is spaced from said mask frame forming a gap extending peripherally around said gas flange, said gap having a height of from about 10 to about 1000 microns.

Claim 11

The invention as set forth in claim 6 in which said gas flange and said chuck includes interdigitated circular bosses to block transmission of stray X-rays.

Claim 12

The invention as set forth in claim 4 wherein said means for maintaining a process gas atmosphere includes means for flowing process gas into said zone and vent means extending from said zone to flow process gas exteriorly of said zone.

Claim 15

The method as set forth in claim 10 further comprising flowing a substrate fabrication process gas into said zone and venting said gas from said zone at a velocity to prevent ingress of contaminating gas to said zone and at a pressure to avoid deflection of said mask.