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US4644189A Expired / Lapsed US ⏱️ 0.0 years remaining

Decoder circuit for a static random access memory

Assignee: US Philips Corp
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Filing: 1984-09-11
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Granted: 1987-02-17
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Expires: 2004-09-11
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Abstract

Abstract A decoder circuit for a static random access memory cell and which may be integrated in monolithic form using gallium arsenide field effect transistors. The circuit comprises a first logic NOR-gate P 1 having (n+1) inputs on which the n coded memory address signals or their complements are received, and also the chip-enable selection signal SB. The gate P 1 is connected by a load resistor R to a supply voltage V DD1 . A second NOR-gate P 2 receives the same inputs as the gate P 1 and has as its load a transistor T 0 the gate electrode of which receives the output of the gate P 1 and the drain of which is connected to a power supply voltage V DD2 which is less than V DD1 . The voltage V DD2 is also the supply voltage for the memory cell, and is set at the clipping value of the gate junctions of the constituent transistors of that cell. The output V S of the decoder is produced at the drains of the transistors forming the second NOR-gate P 2 which are connected to the source electrode of the load transistor T 0 . The inputs of the NOR-gates receive a chip-enable selection signal SB after application of the n coded memory address signals, thereby achieving reduced access time for the memory cell.

Inventors

  • 👤 Bertrand Gabillard

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-06 13:55
CPC Classifications
G; G11; G11C; G11C11/00; G11C11/21; G11C11/34; G11C11/40; G11C11/41; G11C11/413; G11C11/417; G11C11/418

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 246 words
A decoder circuit for an integrated monolithic static random access memory, which circuit comprises a first logic NOR-gate (P1) formed by a first row of field effect transistors whose gate electrodes receive "n" coded memory address signals; the sources of said first row of transistors being connected to ground and the drains thereof being connected in common to an output terminal of the first NOR-gate (P1), such output terminal being connected by a load to a source of supply voltage V DD1 and being further connected to the gate electrode of a transistor of an output inverter stage; the source of the inverter stage transistor constituting the output terminal of the decoder circuit and being connected to the common drains of a second row of transistors which form a second NOR-gate (P2); the drain of the inverter stage transistor being connected to a source of supply voltage V DD2 ; the sources of the transistors of the second row being connected to ground and the gate electrodes thereof receiving the "n" coded address signals; each of said first and second rows of transistors comprising a selection transistor being parallel-connected to the respective rows of transistors and having a gate electrode for receiving a common chip-enable selection signal (SB), whereby said chip-enable selection signal (SB) being applied to the selection transistors after the coded memory address signals are applied to each of the two NOR-gates (P1, P2), thereby achieving reduced access time for the random access memory.
Claim 2
Dependent Claim 246 words
A decoder circuit for an integrated monolithic static random access memory, which circuit comprises a first logic NOR-gate (P1) formed by a first row of field effect transistors whose gate electrodes receive "n" coded memory address signals; the sources of said first row of transistors being connected to ground and the drains thereof being connected in common to an output terminal of the first NOR-gate (P1), such output terminal being connected by a load to a source of supply voltage V DD1 and being further connected to the gate electrode of a transistor of an output inverter stage; the source of the inverter stage transistor constituting the output terminal of the decoder circuit and being connected to the common drains of a second row of transistors which form a second NOR-gate (P2); the drain of the inverter stage transistor being connected to a source of supply voltage V DD2 ; the sources of the transistors of the second row being connected to ground and the gate electrodes thereof receiving the "n" coded address signals; each of said first and second rows of transistors comprising a selection transistor being parallel-connected to the respective rows of transistors and having a gate electrode for receiving a common chip-enable selection signal (SB), whereby said chip-enable selection signal (SB) being applied to the selection transistors after the coded memory address signals are applied to each of the two NOR-gates (P1, P2), thereby achieving reduced access time for the random access memory.
Claim 3
Dependent Claim 31 words
A decoder circuit as claimed in claim 1, characterized in that all transistors therein are of the enhancement type and the load of the first NOR-gate (P1) is a resistive load.
Claim 4
Dependent Claim 46 words
A decoder circuit for a static random access memory as claimed in either of claims 1 or 2, characterized in that the supply voltage (V DD1 ) for the first NOR-gate (P1) is higher than the supply voltage (V DD2 ) for the second NOR-gate (P2).
Claim 5
Dependent Claim 25 words
A circuit as claimed in claim 3, characterized in that the supply voltage VDD 1 =1.2 V and the supply voltage V DD2 =0.7 V.
Claim 6
Dependent Claim 36 words
A decoder circuit as claimed in claim 2, characterized in that the length of the gate electrode of each of the transistors is L=0.9 μm, the pinchoff voltage of these transistors being V T =0.1 V.
Claim 7
Dependent Claim 20 words
A decoder circuit as claimed in claim 2, characterized in that the resistance of the resistive load is R=20 Kohms.
Claim 8
Dependent Claim 32 words
A monolithic integrated circuit comprising a random access memory and a decoder circuit as claimed in claim 1, characterized in that all of the transistors therein are gallium arsenide field effect transistors.
Claim 9
Dependent Claim 37 words
A monolithic integrated circuit as claimed in claim 7, characterized in that the supply voltage for the random access memory is equal to the supply voltage V DD2 for the second NOR-gate (P2) of the decoder circuit.

References Cited (Backward Citations)

US3778782A Cited
US3786277A Cited
US3775693A Cited
US3863230A Cited
US4038563A Cited
JPS5640331A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-02-16 1990-08-18 1991-02-17 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-02-16 1994-08-18 1995-02-17 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-02-16 1998-08-18 1999-02-17 $7700.00 Window Closed / Lapsed

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