Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
246 words
A decoder circuit for an integrated monolithic static random access memory, which circuit comprises a first logic NOR-gate (P1) formed by a first row of field effect transistors whose gate electrodes receive "n" coded memory address signals; the sources of said first row of transistors being connected to ground and the drains thereof being connected in common to an output terminal of the first NOR-gate (P1), such output terminal being connected by a load to a source of supply voltage V DD1 and being further connected to the gate electrode of a transistor of an output inverter stage; the source of the inverter stage transistor constituting the output terminal of the decoder circuit and being connected to the common drains of a second row of transistors which form a second NOR-gate (P2); the drain of the inverter stage transistor being connected to a source of supply voltage V DD2 ; the sources of the transistors of the second row being connected to ground and the gate electrodes thereof receiving the "n" coded address signals; each of said first and second rows of transistors comprising a selection transistor being parallel-connected to the respective rows of transistors and having a gate electrode for receiving a common chip-enable selection signal (SB), whereby said chip-enable selection signal (SB) being applied to the selection transistors after the coded memory address signals are applied to each of the two NOR-gates (P1, P2), thereby achieving reduced access time for the random access memory.
Claim 2
Dependent Claim
246 words
A decoder circuit for an integrated monolithic static random access memory, which circuit comprises a first logic NOR-gate (P1) formed by a first row of field effect transistors whose gate electrodes receive "n" coded memory address signals; the sources of said first row of transistors being connected to ground and the drains thereof being connected in common to an output terminal of the first NOR-gate (P1), such output terminal being connected by a load to a source of supply voltage V DD1 and being further connected to the gate electrode of a transistor of an output inverter stage; the source of the inverter stage transistor constituting the output terminal of the decoder circuit and being connected to the common drains of a second row of transistors which form a second NOR-gate (P2); the drain of the inverter stage transistor being connected to a source of supply voltage V DD2 ; the sources of the transistors of the second row being connected to ground and the gate electrodes thereof receiving the "n" coded address signals; each of said first and second rows of transistors comprising a selection transistor being parallel-connected to the respective rows of transistors and having a gate electrode for receiving a common chip-enable selection signal (SB), whereby said chip-enable selection signal (SB) being applied to the selection transistors after the coded memory address signals are applied to each of the two NOR-gates (P1, P2), thereby achieving reduced access time for the random access memory.
Claim 3
Dependent Claim
31 words
A decoder circuit as claimed in claim 1, characterized in that all transistors therein are of the enhancement type and the load of the first NOR-gate (P1) is a resistive load.
Claim 4
Dependent Claim
46 words
A decoder circuit for a static random access memory as claimed in either of claims 1 or 2, characterized in that the supply voltage (V DD1 ) for the first NOR-gate (P1) is higher than the supply voltage (V DD2 ) for the second NOR-gate (P2).
Claim 5
Dependent Claim
25 words
A circuit as claimed in claim 3, characterized in that the supply voltage VDD 1 =1.2 V and the supply voltage V DD2 =0.7 V.
Claim 6
Dependent Claim
36 words
A decoder circuit as claimed in claim 2, characterized in that the length of the gate electrode of each of the transistors is L=0.9 μm, the pinchoff voltage of these transistors being V T =0.1 V.
Claim 7
Dependent Claim
20 words
A decoder circuit as claimed in claim 2, characterized in that the resistance of the resistive load is R=20 Kohms.
Claim 8
Dependent Claim
32 words
A monolithic integrated circuit comprising a random access memory and a decoder circuit as claimed in claim 1, characterized in that all of the transistors therein are gallium arsenide field effect transistors.
Claim 9
Dependent Claim
37 words
A monolithic integrated circuit as claimed in claim 7, characterized in that the supply voltage for the random access memory is equal to the supply voltage V DD2 for the second NOR-gate (P2) of the decoder circuit.