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US4628217A Expired / Lapsed US ⏱️ 0.0 years remaining

Fast scan/set testable latch using two levels of series gating with one current source

Assignee: Unisys Corp
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Filing: 1984-03-22
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Granted: 1986-12-09
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Expires: 2004-03-22
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Abstract

Abstract An economical circuit of n transistors and m resistors (n=4, m=1 for Emitter Coupled Logic (ECL); n=3, m=0 for Current Mode Logic (CML)) interconnects to a fast differential feedback latch of r transistors and s resistors (r=12, s=9 for ECl; r=7, s=3 for CML) using two levels of series gating and one current source in order to establish scan/set testability of such latch. An additional interconnected circuit of v transistors and w resistors (b=2, w-1 for ECL; v=1, w=0 for CML) further establishes either a reset or a set capability for such latch. The economical total scan/set testable latch of x transistors and y resistors (x=18, y=11 for ECL; x=11, y=3 for CML) exhibits an excellent delay-power product since a single current is selectively steered into one of four different paths, the remaining three of which paths are shut down. Use of but a single current source provides further economy of silicon implementation. All such economies are achieved by the trade-off that the scan/set testable latch does exhibit a higher than normal number of combinations of input signal conditions responsively to which the output signals will be indeterminate: some 9 out of a nominal 32 combinations of 5 input signals for which the output states of latches are often specified will produce undetermined signal outputs. Such 9 combinations are, however, essentially unused and never encountered when the scan/set testable latch is implemented and used, as is primarily intended, in gate array technology.

Inventors

  • 👤 Dale F. Berndt

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 19:19
CPC Classifications
H; H03; H03K; H03K3/00; H03K3/02; H03K3/26; H03K3/28; H03K3/281; H03K3/286; H03K3/288; H03K3/2885; H03K3/027; H03K3/037; H03K3/0375

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 465 words
In interconnection to and functional augmentation of a two-level-series-gated one-current-source feedback latch circuit employing one current source supplying current, serially connected to a first-level current-switch responisve to a received system clock signal for steering said current either to maintain, as a feedback current, said latch circuit in a set or clear state or else steering said current to one second-level current-switch responsive to a received system data signal for steering current received of said first-level current switch to either a clear Q or else to a set Q signal outputs of said latch circuit in order to respectively set or clear said latch circuit, a circuit apparatus interconnected to said feedback latch circuit for making said feedback latch fircuit functionally responsive to received scan/set data and scan/set clock signals thereby making said feedback latch circuit scan/set testable, said circuit apparatus comprising: a first-level gating-circuit constituting a substitutionary inverting one-half of said first-level current switch while a normal inverting one-half of said first-level current switch is inactive due to absence of said received system clock signal, said first-level gating-circuit connected intermediary said current source and another second-level current switch, said first gating-circuit being interactive with the normal non-inverting one-half of said first-level current-switch, which said normal non-inverting one-half of said first-level current-switch is also connected to said current source and upon said first-level, in order to sufficiently form by said being interactive a complete current-switch upon said first-level, WHEREIN said complete current-switch is responsive to said scan/set clock signal for IF said scan/set clock signal is true THEN steering said current received of said current source to said another second-level current-switch ELSE IF said scan/set clock signal is false THEN steering no current to said another second-level current-switch and doing naught but presenting but a small, non-interfering, impedance to the operation of said normally constituted first-level current-switch; and said another second-level current switch is connected between said first-level gating circuit and said signal outputs of said feedback latch, comprising collector-dotted connections to each said clear Q and set Q signal outputs of said feedback latch circuit, for IF supplied with a current steered from said complete current-switch THEN, responsively to the binary state of a received said scan/set data signal, IF said scan/set data input signal is true THEN steering said current to said clear Q signal output of said feedback latch circuit sufficient to set said feedback latch circuit ELSE IF said scan/set data input signal is false THEN steering said current to said set Q signal output of said feedback latch circuit sufficient to clear said feedback latch circuit, ELSE IF not supplied with a current steered from said complete current-switch THEN doing naught but presenting a small capacitance to said set Q and said clear Q signal outputs of said feedback latch circuit.
Claim 2
Dependent Claim 465 words
In interconnection to and functional augmentation of a two-level-series-gated one-current-source feedback latch circuit employing one current source supplying current, serially connected to a first-level current-switch responisve to a received system clock signal for steering said current either to maintain, as a feedback current, said latch circuit in a set or clear state or else steering said current to one second-level current-switch responsive to a received system data signal for steering current received of said first-level current switch to either a clear Q or else to a set Q signal outputs of said latch circuit in order to respectively set or clear said latch circuit, a circuit apparatus interconnected to said feedback latch circuit for making said feedback latch fircuit functionally responsive to received scan/set data and scan/set clock signals thereby making said feedback latch circuit scan/set testable, said circuit apparatus comprising: a first-level gating-circuit constituting a substitutionary inverting one-half of said first-level current switch while a normal inverting one-half of said first-level current switch is inactive due to absence of said received system clock signal, said first-level gating-circuit connected intermediary said current source and another second-level current switch, said first gating-circuit being interactive with the normal non-inverting one-half of said first-level current-switch, which said normal non-inverting one-half of said first-level current-switch is also connected to said current source and upon said first-level, in order to sufficiently form by said being interactive a complete current-switch upon said first-level, WHEREIN said complete current-switch is responsive to said scan/set clock signal for IF said scan/set clock signal is true THEN steering said current received of said current source to said another second-level current-switch ELSE IF said scan/set clock signal is false THEN steering no current to said another second-level current-switch and doing naught but presenting but a small, non-interfering, impedance to the operation of said normally constituted first-level current-switch; and said another second-level current switch is connected between said first-level gating circuit and said signal outputs of said feedback latch, comprising collector-dotted connections to each said clear Q and set Q signal outputs of said feedback latch circuit, for IF supplied with a current steered from said complete current-switch THEN, responsively to the binary state of a received said scan/set data signal, IF said scan/set data input signal is true THEN steering said current to said clear Q signal output of said feedback latch circuit sufficient to set said feedback latch circuit ELSE IF said scan/set data input signal is false THEN steering said current to said set Q signal output of said feedback latch circuit sufficient to clear said feedback latch circuit, ELSE IF not supplied with a current steered from said complete current-switch THEN doing naught but presenting a small capacitance to said set Q and said clear Q signal outputs of said feedback latch circuit.
Claim 3
Dependent Claim 104 words
The circuit apparatus interconnected to a feedback latch fircuit for making said feedback latch circuit scan/set testable of claim 1 wherein said complete current-switch further comprises: a complete differential current-switch responsive to a received binary said scan/set clock signal for IF said scan/set clock signal is greater than a reference voltage THEN steering said current received of said current source to said another second-level current-switch ELSE IF said scan/set clock signal is less than said reference voltage THEN providing no current to said another second-level current-switch and doing naught but presenting a small impedance to the normal operation of normally constituted said first current-switch.
Claim 4
Dependent Claim 60 words
The circuit appparatus interconnected to a feedback latch circuit for making said feedback latch circuit scan/set testable to claim 1 which further comprises: level shifter means for first receiving and for level shifting the received said scan/set clock signal, and for then transmitting a level-shifted said scan/set clock signal to said complete current-switch as said received binary scan/set clock signal.
Claim 5
Dependent Claim 30 words
The circuit apparatus interconnected to a feedback latch circuit for making said feedback latch circuit scan/set testable of claim 1 implemented in Emitter Coupled Logic, (ECL) in gate array technology.
Claim 6
Dependent Claim 30 words
The circuit apparatus interconnected to a feedback latch circuit for making said feedback latch circuit scan/set testable of claim 1 implemented in Current Mode Logic (CML) in gate array technology.

References Cited (Backward Citations)

US4298980A Cited
US4476431A Cited
US4546272A Cited
US4493077A Cited
US4513283A Cited
US4535467A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1989-12-08 1990-06-09 1990-12-09 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1993-12-08 1994-06-09 1994-12-09 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1997-12-08 1998-06-09 1998-12-09 $7700.00 Window Closed / Lapsed

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