Patent US4577147A successfully refreshed from Google Patents.
US4577147A
Expired / Lapsed
US
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Arrangement and method for voltage measurement at a buried test subject
Assignee: Siemens AG
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Filing: 1983-06-06
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Granted: 1986-03-18
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Expires: 2003-06-06
Abstract
Abstract In order to permit good test results in the voltage measurement of buried test subjects, an arrangement is provided having a particle beam probe for voltage measurement at a test subject which is spatially separated from a surface by a solid state substance. The solid state substance provides mobile charges disposed in insulated fashion between said test subject and the particle beam probe. A charge separation due to the influence of the test subject potential is produced in the solid state substance so that a potential on the surface of the solid state substance immediately adjacent to the particle beam probe becomes proportional to the potential on the test subject.
Inventors
- 👤 Jurgen Frosien
- 👤 Michael Pomper
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 13:00
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/265; G01R31/2653; G01R31/28; G01R31/302; G01R31/305
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
223 words
A quantitive voltage potential measurement arrangement for use with a particle beam probe employed to measure a voltage potential on a test subject lying beneath and in direct contact with a layer and where the particle beam probe lies above a surface of the layer, comprising: a test spot means comprising a solid state substance which has mobile charges, said test spot means being disposed in insulated fashion by said layer at said layer surface from and over said test subject and between said test subject and the particle beam probe such that the mobile charges in the test spot means are influenced by the potential on the test subject and a charge separation occurs of such mobile charges creating a potential at a surface of the test spot means facing the particle beam probe which is proportional to the voltage on the test subject, said proportional potential at the test spot means being achieved in that an area of the test spot means and the test subject are both large in comparison to a thickness of the layer beneath the test spot means so that a homogeneous electric field is present between the test spot means and the test subject when said proportional potential is present on the test spot means, and said surface potential being measured by the particle beam probe.
Claim 2
Dependent Claim
223 words
A quantitive voltage potential measurement arrangement for use with a particle beam probe employed to measure a voltage potential on a test subject lying beneath and in direct contact with a layer and where the particle beam probe lies above a surface of the layer, comprising: a test spot means comprising a solid state substance which has mobile charges, said test spot means being disposed in insulated fashion by said layer at said layer surface from and over said test subject and between said test subject and the particle beam probe such that the mobile charges in the test spot means are influenced by the potential on the test subject and a charge separation occurs of such mobile charges creating a potential at a surface of the test spot means facing the particle beam probe which is proportional to the voltage on the test subject, said proportional potential at the test spot means being achieved in that an area of the test spot means and the test subject are both large in comparison to a thickness of the layer beneath the test spot means so that a homogeneous electric field is present between the test spot means and the test subject when said proportional potential is present on the test spot means, and said surface potential being measured by the particle beam probe.
Claim 3
Dependent Claim
36 words
An arrangement according to claim 1 wherein the layer is an insulator and the test spot means is metallic and is disposed over the test subject and between the test subject and the particle beam probe.
Claim 4
Dependent Claim
19 words
An arrangement according to claim 1 wherein the test spot means having mobile charges lies on said layer surface.
Claim 5
Dependent Claim
45 words
An arrangement according to claim 1 wherein the test spot means having mobile charges is immediately next to the particle beam probe and is sufficiently large in order to avoid a disruptive, additional voltage building up thereon from the particle beam probe during the measurement.
Claim 6
Independent Claim
182 words
A method for quantitative voltage measurement of a voltage potential on a test subject which is positioned beneath and in direct contact with a layer and where the particle beam probe is above the layer, comprising the steps of: providing a test spot of a solid state substance which has mobile charges and which is positioned over the test subject at said layer surface and between the test subject and the particle beam probe; selecting an area of the test spot and an area of the test subject sufficiently large in comparison to a thickness of the layer between the test spot and the test subject so that a homogeneous electric field is present beneath the test spot, and such that the surface potential resulting at the test spot is substantially proportional to the potential on the test subject; and with the particle beam probe, quantitatively measuring a potential on a surface of the test spot, the surface potential being created by an alignment of the mobile charges in the test spot which are influenced by the potential on the test subject.
Claim 7
Independent Claim
182 words
A method for quantitative voltage measurement of a voltage potential on a test subject which is positioned beneath and in direct contact with a layer and where the particle beam probe is above the layer, comprising the steps of: providing a test spot of a solid state substance which has mobile charges and which is positioned over the test subject at said layer surface and between the test subject and the particle beam probe; selecting an area of the test spot and an area of the test subject sufficiently large in comparison to a thickness of the layer between the test spot and the test subject so that a homogeneous electric field is present beneath the test spot, and such that the surface potential resulting at the test spot is substantially proportional to the potential on the test subject; and with the particle beam probe, quantitatively measuring a potential on a surface of the test spot, the surface potential being created by an alignment of the mobile charges in the test spot which are influenced by the potential on the test subject.
Claim 8
Dependent Claim
35 words
A method according to claim 5 wherein a sum of charges from the particle beam striking the test spot and vicinity is approximately equal to a sum of charges leaving the test spot and vicinity.
Claim 9
Dependent Claim
40 words
A method according to claim 5 including the step of switching the potential at the test subject back and forth between the potential to be measured and a reference voltage, whereby disruptive influences can be eliminated from the test result.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-03-17 | 1989-09-16 | 1990-03-18 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-03-17 | 1993-09-16 | 1994-03-18 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-03-17 | 1997-09-16 | 1998-03-18 | $7700.00 | Window Closed / Lapsed |