US3671743A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Electron microscopy
Assignee: Individual
•
Filing: 1969-04-03
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Granted: 1972-06-20
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Expires: 1989-04-03
Abstract
Abstract Mirror electron microscope techniques are used indirectly to examine the electric or magnetic field in a specimen, such as a biological cell, situated outside the evacuated microscope chamber by examining the field on a layer or surface immediately inside a wall of the chamber adjacent the outside of which the specimen is placed.
Inventors
- 👤 William Charles Nixon
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 22:21
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/26; H01J37/266; H01J37/29
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
203 words
An electron microscope for examining the electrical field pattern at the surface of a specimen comprising an enclosure defining an evacuated chamber, a wall of said enclosure having inner and outer faces, said wall being of thin, gas impermeable electrically insulating dielectric material, means for generating a beam of electrons within said chamber and directing it towards said wall, a coating of electrically conducting material on the inner face of said wall at a negative potential selected to subject the electrons of said beam to a strong retarding action in the final part of their approach to the coating and to return them before they reach said coating in the general direction from which they came, means for locating a specimen against the outer face of said wall and within the area defined by the coating on the inner face of said wall, said specimen, wall and coating defining a capacitor wherein any non-uniform static electrical charge distribution present on said specimen surface is imaged by capacitor effect as an electrical charge distribution on said coating, and collecting and image-forming means for revealing the field distribution on said coating by the effect of said field distribution on the paths of the returning electrons.
Claim 2
Dependent Claim
203 words
An electron microscope for examining the electrical field pattern at the surface of a specimen comprising an enclosure defining an evacuated chamber, a wall of said enclosure having inner and outer faces, said wall being of thin, gas impermeable electrically insulating dielectric material, means for generating a beam of electrons within said chamber and directing it towards said wall, a coating of electrically conducting material on the inner face of said wall at a negative potential selected to subject the electrons of said beam to a strong retarding action in the final part of their approach to the coating and to return them before they reach said coating in the general direction from which they came, means for locating a specimen against the outer face of said wall and within the area defined by the coating on the inner face of said wall, said specimen, wall and coating defining a capacitor wherein any non-uniform static electrical charge distribution present on said specimen surface is imaged by capacitor effect as an electrical charge distribution on said coating, and collecting and image-forming means for revealing the field distribution on said coating by the effect of said field distribution on the paths of the returning electrons.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1975-06-20 | 1975-12-20 | 1976-06-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1979-06-20 | 1979-12-20 | 1980-06-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1983-06-20 | 1983-12-20 | 1984-06-20 | $7700.00 | Window Closed / Lapsed |