US3549999A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and apparatus for testing circuits by measuring secondary emission electrons generated by electron beam bombardment of the pulsed circuit
Assignee: General Electric Co
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Filing: 1968-06-05
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Granted: 1970-12-22
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Expires: 1988-06-05
Abstract
No abstract record available.
Inventors
- 👤 James F Norton
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 16:22
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/26; H01J37/266; H01J37/268; G; G01; G01R; G01R31/00; G01R31/28; G01R31/302; G01R31/305; G01R31/307
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1973-12-21 | 1974-06-22 | 1974-12-22 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1977-12-21 | 1978-06-22 | 1978-12-22 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1981-12-21 | 1982-06-22 | 1982-12-22 | $7700.00 | Window Closed / Lapsed |