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US4510515A Expired / Lapsed US ⏱️ 0.0 years remaining

Epitaxial wafer of compound semiconductor display device

Assignee: Mitsubishi Chemical Corp
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Filing: 1984-02-10
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Granted: 1985-04-09
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Expires: 2004-02-10
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Abstract

Abstract An epitaxial wafer of a compound semiconductor comprising a single crystalline semiconductor substrate consisting of GaP and an active layer consisting of GaAs 1-x P x , having a mixed crystal ratio (x) in the range of from 0.5 to 1 is used for an LED. According to the present invention, between the single crystalline semiconductor substrate and the active layer, a light-absorbing layer consisting of GaAs 1-x P x having the mixed crystal ratio (x) smaller than that of the active layer, is formed to suppress the reflection of light from the surface of the substrate.

Inventors

  • 👤 Masaki Kajita
  • 👤 Tomio Nakaya
  • 👤 Shinichi Hasegawa
  • 👤 Hisanori Fujita

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 19:07
CPC Classifications
H; H10; H10H; H10H20/00; H10H20/80; H10H20/81; H10H20/8215; H10H20/811; H10H20/822; H10H20/824

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 190 words
In an epitaxial GaP wafer green light-emitting display device, comprising (a) a single crystalline semiconductor substrate consisting of GaP, (b) an active layer of N-doped GaP having a PN junction therein, (c) a GaP epitaxial layer formed on said single crystalline semiconductor substrate, and (d) electrode means coupled to said active layer for applying a voltage across said P-N junction, the improvement comprising a light-absorbing layer disposed between the GaP epitaxial layer and the active layer, said light-absorbing layer consisting of GaAs 1-x P x having a mixed crystal ratio (x) of 0.6 or less, a first graded epitaxial layer consisting of GaAs 1-x P x and formed between said light absorbing layer and said active layer, the mixed crystal ratio (x) of said GaAs 1-x P x first graded epitaxial layer continuously increasing in a growth direction extending from said substrate to said active layer, and a second graded epitaxial layer consisting of GaAs 1-x P x and formed between said light-absorbing layer and said GaP epitaxial layer, the mixed crystal ratio (x) of said second graded GaAs 1-x P x epitaxial layer continuously decreasing in said growth direction.
Claim 2
Dependent Claim 190 words
In an epitaxial GaP wafer green light-emitting display device, comprising (a) a single crystalline semiconductor substrate consisting of GaP, (b) an active layer of N-doped GaP having a PN junction therein, (c) a GaP epitaxial layer formed on said single crystalline semiconductor substrate, and (d) electrode means coupled to said active layer for applying a voltage across said P-N junction, the improvement comprising a light-absorbing layer disposed between the GaP epitaxial layer and the active layer, said light-absorbing layer consisting of GaAs 1-x P x having a mixed crystal ratio (x) of 0.6 or less, a first graded epitaxial layer consisting of GaAs 1-x P x and formed between said light absorbing layer and said active layer, the mixed crystal ratio (x) of said GaAs 1-x P x first graded epitaxial layer continuously increasing in a growth direction extending from said substrate to said active layer, and a second graded epitaxial layer consisting of GaAs 1-x P x and formed between said light-absorbing layer and said GaP epitaxial layer, the mixed crystal ratio (x) of said second graded GaAs 1-x P x epitaxial layer continuously decreasing in said growth direction.
Claim 3
Dependent Claim 210 words
An epitaxial GaAsP/GaP wafer yellow or orange light-emitting display device, comprising a single crystalline semiconductor substrate consisting of GaP, an active layer of nitrogen doped GaAs 1-x P x having a PN junction therein, said active layer having a mixed crystal ratio (x) in the range from 0.5 to 1, a GaP epitaxial layer formed on said single crystalline semiconductor substrate, electrode means coupled to said active layer for applying a voltage across said PN junction, a light-absorbing layer disposed between the GaP epitaxial layer and the active layer, said light-absorbing layer consisting of GaAs 1-x P x having a mixed crystal ratio (x) smaller than that of the active layer and not more than 0.5, a first graded epitaxial layer consisting of GaAs 1-x P x and formed between said light-absorbing layer and said active layer, the mixed crystal ratio (x) of said GaAs 1-x P x first graded epitaxial layer continuously increasing in a growth direction extending from said substrate to said active layer, and a second graded epitaxial layer consisting of GaAs 1-x P x and formed between said light-absorbing layer and said GaP epitaxial layer, the mixed crystal ratio (x) of said second graded GaAS 1-x P x epitaxial layer continuously decreasing in said growth direction.
Claim 4
Dependent Claim 210 words
An epitaxial GaAsP/GaP wafer yellow or orange light-emitting display device, comprising a single crystalline semiconductor substrate consisting of GaP, an active layer of nitrogen doped GaAs 1-x P x having a PN junction therein, said active layer having a mixed crystal ratio (x) in the range from 0.5 to 1, a GaP epitaxial layer formed on said single crystalline semiconductor substrate, electrode means coupled to said active layer for applying a voltage across said PN junction, a light-absorbing layer disposed between the GaP epitaxial layer and the active layer, said light-absorbing layer consisting of GaAs 1-x P x having a mixed crystal ratio (x) smaller than that of the active layer and not more than 0.5, a first graded epitaxial layer consisting of GaAs 1-x P x and formed between said light-absorbing layer and said active layer, the mixed crystal ratio (x) of said GaAs 1-x P x first graded epitaxial layer continuously increasing in a growth direction extending from said substrate to said active layer, and a second graded epitaxial layer consisting of GaAs 1-x P x and formed between said light-absorbing layer and said GaP epitaxial layer, the mixed crystal ratio (x) of said second graded GaAS 1-x P x epitaxial layer continuously decreasing in said growth direction.

References Cited (Backward Citations)

US3873382A Cited
US3813587A Cited
JPS54125989A Cited
JPS54146984A Cited
US4378259A Cited
US4359774A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-04-08 1988-10-08 1989-04-09 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-04-08 1992-10-08 1993-04-09 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-04-08 1996-10-08 1997-04-09 $7700.00 Window Closed / Lapsed

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