US3873382A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Process for the preparation of semiconductor materials and devices
Assignee: Monsanto Co
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Filing: 1972-12-08
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Granted: 1975-03-25
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Expires: 1992-12-08
Abstract
Abstract The disclosure herein pertains to the preparation of semiconductor materials and solid-state devices fabricated therefrom. More particularly, the disclosure pertains to a vapor phase process for the preparation of electroluminescent materials, particularly GaAs1 xPx, doped with isoelectronic impurities, particularly nitrogen, and to electroluminescent devices fabricated therefrom.
Inventors
- 👤 Warren Olley Groves
- 👤 Arno Henry Herzog
- 👤 Magnus George Craford
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 21:15
CPC Classifications
H; H10; H10H; H10H20/00; H10H20/80; H10H20/81; H10H20/822; H10H20/824; H10H20/8242; H10D; H10D62/00; H10D62/80; H10D62/85; H10D62/854; H10P; H10P32/00; H10P32/10; H10P32/12; H10P32/17; H10P32/174; Y; Y10; Y10S; Y10S148/00; Y10S148/065; Y10S148/067; Y10S148/072; Y10S252/00; Y10S252/95; Y10S252/951; Y10S438/00; Y10S438/914; Y10S438/925; Y10S438/936
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
218 words
A PROCESS FOR THE PREPARATION OF ELECTROLUMINESCENT MATERIALS FOR LIGHT-EMITTING DIODES, SAID PROCESS COMPRISING: A. PROVIDING IN A REACTION CHAMBER ASUBSTRATE OF A SINGLE CRYSTAL COMPOUND FORMED FROM GA AND ONE OF THE ELEMENTS SELECTED FROM THE GROUP CONSISTING OF AS AND P; B.COMBINING IN A VAPOR PHASE REACTANT STREAM REACTANT MATERIAL INCLUDING IMPURITY ATOMS, SAID MATERIALSBEING ADAPTED FOR THE FORMTION OF GAAS1-XPX, WHEREIN X HASAN INITIAL VALUE WITHIN THE RANGE OF GREATER THAN 0.2 TO LESS THAN FINAL VALUE WITHIN THE RANGE OF GREATER THAN 0.2 TO LESS THAN 1.0; C. INTRODUCING SAID REACTANT STREAM INTO SAID REACTANT CHAMBER; D. EPITAXIALLY DEPOSITING ON SAID SUBSTRATE FROM SAID STREAM SAID REACTANT MATERIALS TO FORM AFIRST EPITAXIALLY LAYER OF A FIRST ELECTRICAL CONDUCTIVITY TYPE ON SAID SUBSTRATE, SAID LAYER CONSTITUTING A BULK REGION SUBSTANTIALLY FREE OF ISOELECTRONIC IMPURITES; E. INTRODUCING INTO SAID STREAM AN ISOELECTRONIC IMPURITY IN VAPOR FORM; F. EPITAXIALLY DEPOSITING ON SAID SUBSTRATE FROM SAID STREAM SAID REACTANT MATERIALS TO FORM A SECOND EPITAXIAL LAYER OF SAID FIRST CONDUCTIVITY TYPE ON SAID FIRST EPITAXIALLY LAYER, SAID SECOND EPITAXIAL LAYER PROVIDING A SURFACE REGION CONTAINING SAID ISOELECTRONIC IMPURITY ATOMS; AND G. FORMING A P-N JUNCTION IN SAID SURFACE REGION BY INTRODUCING ING ELECTRONIC IMPURITY ATOMS OF AN ELECTRONIC CONDUCTIVING TYPE OPPOSITE TO THAT OF SAID FIRST CONDUCTIVITY TYPE.
Claim 2
Dependent Claim
218 words
A PROCESS FOR THE PREPARATION OF ELECTROLUMINESCENT MATERIALS FOR LIGHT-EMITTING DIODES, SAID PROCESS COMPRISING: A. PROVIDING IN A REACTION CHAMBER ASUBSTRATE OF A SINGLE CRYSTAL COMPOUND FORMED FROM GA AND ONE OF THE ELEMENTS SELECTED FROM THE GROUP CONSISTING OF AS AND P; B.COMBINING IN A VAPOR PHASE REACTANT STREAM REACTANT MATERIAL INCLUDING IMPURITY ATOMS, SAID MATERIALSBEING ADAPTED FOR THE FORMTION OF GAAS1-XPX, WHEREIN X HASAN INITIAL VALUE WITHIN THE RANGE OF GREATER THAN 0.2 TO LESS THAN FINAL VALUE WITHIN THE RANGE OF GREATER THAN 0.2 TO LESS THAN 1.0; C. INTRODUCING SAID REACTANT STREAM INTO SAID REACTANT CHAMBER; D. EPITAXIALLY DEPOSITING ON SAID SUBSTRATE FROM SAID STREAM SAID REACTANT MATERIALS TO FORM AFIRST EPITAXIALLY LAYER OF A FIRST ELECTRICAL CONDUCTIVITY TYPE ON SAID SUBSTRATE, SAID LAYER CONSTITUTING A BULK REGION SUBSTANTIALLY FREE OF ISOELECTRONIC IMPURITES; E. INTRODUCING INTO SAID STREAM AN ISOELECTRONIC IMPURITY IN VAPOR FORM; F. EPITAXIALLY DEPOSITING ON SAID SUBSTRATE FROM SAID STREAM SAID REACTANT MATERIALS TO FORM A SECOND EPITAXIAL LAYER OF SAID FIRST CONDUCTIVITY TYPE ON SAID FIRST EPITAXIALLY LAYER, SAID SECOND EPITAXIAL LAYER PROVIDING A SURFACE REGION CONTAINING SAID ISOELECTRONIC IMPURITY ATOMS; AND G. FORMING A P-N JUNCTION IN SAID SURFACE REGION BY INTRODUCING ING ELECTRONIC IMPURITY ATOMS OF AN ELECTRONIC CONDUCTIVING TYPE OPPOSITE TO THAT OF SAID FIRST CONDUCTIVITY TYPE.
Claim 3
Dependent Claim
12 words
The process according to claim 1 wherein said isoelectronic impurity is nitrogen.
Claim 4
Dependent Claim
40 words
The process according to claim 2 wherein the concentration of said reactant materials in said reactant stream is adjusted to provide said first epitaxial layer with a graded composition extending from said substrate to the upper surface of said layer.
Claim 5
Dependent Claim
38 words
The process according to claim 2 wherein the concentration of reactant materials in Said reactant stream is adjusted to provide said first epitaxial layer with an initial region of graded composition and a final region of constant composition.
Claim 6
Dependent Claim
46 words
The process according to claim 2 wherein said P-N junction in step (g) is formed by depositing on said second layer from said stream reactant materials, including isoelectronic impurity atoms, to form an additional layer containing impurity atoms of conductivity type opposite to that previously used.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1978-03-24 | 1978-09-23 | 1979-03-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1982-03-24 | 1982-09-23 | 1983-03-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1986-03-24 | 1986-09-23 | 1987-03-25 | $7700.00 | Window Closed / Lapsed |