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US4488262A Expired / Lapsed US ⏱️ 0.0 years remaining

Electronically programmable read only memory

Assignee: International Business Machines Corp
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Filing: 1982-06-17
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Granted: 1984-12-11
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Expires: 2002-06-17
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Abstract

Abstract An electrically programmable read only memory assembly having cells arranged at the intersections of bit lines (BL1) and word lines (WL1, WL2), wherein each cell is formed of a bipolar transistor provided with a base region (70) and an emitter region (71) covered with a dielectric layer (2) made of an oxide or titanate of a transition metal. The cell in this condition represents a binary 0 information bit. The application of an appropriate voltage of approximately 4 volts to the pads of this cell through its corresponding bit line (BL1) and word line (WL2) causes the dielectric layer to break down and places the bit line in ohmic contact with the emitter, which sets the cell in its second condition representing a binary "1" information bit.

Inventors

  • 👤 Dominique Basire
  • 👤 Arup Bhattacharyya
  • 👤 James K. Howard
  • 👤 Pierre Mollier

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 04:55
CPC Classifications
G; G11; G11C; G11C17/00; G11C17/14; G11C17/16; H; H10; H10W; H10W20/00; H10W20/40; H10W20/49; H10W20/491

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 172 words
In an electrically programmable read only memory including a matrix of first and second type information lines, the matrix having memory cells located at the intesections of at least some of the first and second type information lines and means for storing information in the cell, the improvement comprising: a memory cell having a transistor including collector, base and emitter regions, the base region of the transistor being connected to an information line of the first type and the collector region being adapted to be connected to a variable voltage supply, the memory cell also including a dielectric layer which is an oxide or titanate of a transition metal having a first surface directly overlying at least a portion of the transistor emitter region and a second surface in electrical communication with an information line of the second type; and means for electrically puncturing the dielectric layer at selected cells to establish an ohmic contact between the transistor emitter region and the second type information line when storing information in the cell.
Claim 2
Dependent Claim 172 words
In an electrically programmable read only memory including a matrix of first and second type information lines, the matrix having memory cells located at the intesections of at least some of the first and second type information lines and means for storing information in the cell, the improvement comprising: a memory cell having a transistor including collector, base and emitter regions, the base region of the transistor being connected to an information line of the first type and the collector region being adapted to be connected to a variable voltage supply, the memory cell also including a dielectric layer which is an oxide or titanate of a transition metal having a first surface directly overlying at least a portion of the transistor emitter region and a second surface in electrical communication with an information line of the second type; and means for electrically puncturing the dielectric layer at selected cells to establish an ohmic contact between the transistor emitter region and the second type information line when storing information in the cell.
Claim 3
Dependent Claim 48 words
The memory in accordance with claim 1 wherein the information lines of the first and second type are, respectively, word and bit lines and wherein the cell transistor base region is electrically connected to a word line and the cell dielectric layer is coupled to a bit line.
Claim 4
Dependent Claim 16 words
The memory in accordance with claim 1 or 2 wherein the dielectric layer is tantalum oxide.
Claim 5
Dependent Claim 16 words
The memory in accordance with claim 1 or 2 wherein the dielectric layer is vanadium oxide.
Claim 6
Dependent Claim 16 words
The memory in accordance with claim 1 or 2 wherein the dielectric layer is zirconium oxide.
Claim 7
Dependent Claim 16 words
The memory in accordance with claim 1 or 2 wherein the dielectric layer is niobium oxide.
Claim 8
Dependent Claim 16 words
The memory in accordance with claim 1 or 2 wherein the dielectric layer is barium titanate.
Claim 9
Dependent Claim 16 words
The memory in accordance with claim 1 or 2 wherein the dielectric layer is strontium titanate.
Claim 10
Dependent Claim 24 words
The memory in accordance with claim 1 or 2 wherein the dielectric layer has a thickness of between 20×10 -6 and 100×10 -6 mm.
Claim 11
Dependent Claim 20 words
The memory in accordance with claim 9 wherein the dielectric layer has a breakdown voltage between 1 and 4 volts.

References Cited (Backward Citations)

US3876944A Cited
US3576549A Cited
US3787822A Cited
US3979734A Cited
US4176442A Cited
US4174521A Cited
US4312046A Cited
US4424578A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1987-12-11 1988-06-11 1988-12-11 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1991-12-11 1992-06-11 1992-12-11 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1995-12-11 1996-06-11 1996-12-11 $7700.00 Window Closed / Lapsed

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