Patent US4395813A successfully refreshed from Google Patents.
US4395813A
Expired / Lapsed
US
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Process for forming improved superconductor/semiconductor junction structures
Assignee: Raytheon Co
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Filing: 1980-10-22
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Granted: 1983-08-02
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Expires: 2000-10-22
Abstract
Abstract The specification discloses a process for forming a superconductor/semiconductor junction structure having optimized low-temperature current transport properties by first providing a substrate of a chosen semiconductor material having an atomically clean surface. A layer of a first chosen superconducting material is deposited on or above the surface of the substrate to a predetermined thickness. Either before or after the formation of this layer of the first superconducting material, a region of a second chosen superconducting material is formed between the surface of the substrate and the layer of the first superconducting material to serve as an interfacial reaction barrier to prevent the reaction between the surface of the substrate and the first chosen superconducting material at the interface thereof which would otherwise result in the formation of an undesired non-superconducting material at the interface. By preventing this undesired interfacial reaction, an optimized low-temperature current transport path is maintained across the interface and certain device performance characteristics can be optimized. Josephson junction superconducting devices and super-Schottky devices may be formed by this disclosed process.
Inventors
- 👤 John A. Roth
- 👤 Lynette B. Roth
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 22:09
CPC Classifications
H; H10; H10N; H10N60/00; H10N60/10; H10N60/12; Y; Y10; Y10S; Y10S505/00; Y10S505/825; Y10S505/917; Y10S505/922; Y10S505/923; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49014
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
171 words
A process for forming a superconductor/semiconductor junction structure having optimized low-temperature current transport properties comprising the steps of: (a) providing a substrate of a chosen semiconductor material having an atomically clean surface; (b) depositing on said clean surface of said substrate to a first predetermined thickness a layer of a chosen reactive material which is capable of undergoing an interfacial reaction with a first selected superconducting material to form a second selected superconducting material; (c) depositing on said layer of said chosen reactive material a layer of said first selected superconducting material to a second predetermined thickness whereby said second superconducting material is formed by the reaction of said chosen reactive material with said first selected superconducting material and serves as an interfacial reaction barrier to prevent reaction between said surface of said substrate and said first selected superconducting material to form an undesired non-superconducting material that would degrade said current transport properties of said structure; and (d) providing contact means connected to said structure for deriving an electrical output therefrom.
Claim 2
Dependent Claim
171 words
A process for forming a superconductor/semiconductor junction structure having optimized low-temperature current transport properties comprising the steps of: (a) providing a substrate of a chosen semiconductor material having an atomically clean surface; (b) depositing on said clean surface of said substrate to a first predetermined thickness a layer of a chosen reactive material which is capable of undergoing an interfacial reaction with a first selected superconducting material to form a second selected superconducting material; (c) depositing on said layer of said chosen reactive material a layer of said first selected superconducting material to a second predetermined thickness whereby said second superconducting material is formed by the reaction of said chosen reactive material with said first selected superconducting material and serves as an interfacial reaction barrier to prevent reaction between said surface of said substrate and said first selected superconducting material to form an undesired non-superconducting material that would degrade said current transport properties of said structure; and (d) providing contact means connected to said structure for deriving an electrical output therefrom.
Claim 3
Dependent Claim
86 words
The process set forth in claim 1 wherein: (a) said substrate is formed of silicon and has a thickness in the range of 100 to 4,000 angstroms; (b) said chosen reactive material is carbon and is deposited to a thickness of approximately 40 angstroms; (c) said first selected superconducting material is niobium and is deposited to a thickness of approximatly 2,000 angstroms; (d) said second superconducting material formed by said reaction of said chosen reactive material with said first selected superconducting material is niobium carbide (NbC).
Claim 4
Dependent Claim
159 words
A process for forming a superconductor/semiconductor junction structure having optimized low-temperature current transport properties comprising the steps of: (a) providing a substrate of a chosen semiconductor material having an atomically clean surface; (b) depositing on said clean surface of said substrate a layer of a first selected superconducting material to a first predetermined thickness; (c) depositing on said layer of said first selected superconducting material to a second predetermined thickness a layer of a second selected superconducting material which is capable of reaction with said semiconductor material of said substrate to form an undesirable non-superconducting material, whereby said layer of said first selected superconducting material serves as an interfacial reaction barrier to prevent said reaction between said surface of said substrate and said second selected superconducting material which would produce said undesirable non-superconducting material that would degrade said current transport properties of said structure; and (d) providing contact means connected to said structure for deriving an electrical output therefrom.
Claim 5
Dependent Claim
159 words
A process for forming a superconductor/semiconductor junction structure having optimized low-temperature current transport properties comprising the steps of: (a) providing a substrate of a chosen semiconductor material having an atomically clean surface; (b) depositing on said clean surface of said substrate a layer of a first selected superconducting material to a first predetermined thickness; (c) depositing on said layer of said first selected superconducting material to a second predetermined thickness a layer of a second selected superconducting material which is capable of reaction with said semiconductor material of said substrate to form an undesirable non-superconducting material, whereby said layer of said first selected superconducting material serves as an interfacial reaction barrier to prevent said reaction between said surface of said substrate and said second selected superconducting material which would produce said undesirable non-superconducting material that would degrade said current transport properties of said structure; and (d) providing contact means connected to said structure for deriving an electrical output therefrom.
Claim 6
Dependent Claim
32 words
The process set forth in claim 3 wherein: (a) said substrate is formed of silicon; (b) said first selected superconducting material is niobium carbide (NbC); said second selected superconducting material is niobium.
Claim 7
Dependent Claim
135 words
A process for forming a superconductor/semiconductor junction structure having optimized low-temperature current transport properties comprising the steps of: (a) providing a substrate of a chosen semiconductor material having an atomically clean surface; (b) depositing on said surface of said substrate a layer of a first chosen superconducting material to a first predetermined thickness, and forming a superconductor/substrate interface; (c) altering said superconductor/substrate interface to cause the formation of a layer of a second chosen superconducting material therein, whereby said layer of said second chosen superconducting material prevents interaction between said substrate and said first chosen superconducting material which would form an undesirable non-superconducting region at said superconductor/substrate interface that would interfere with said optimized current transport properties of said structure; and (d) providing contact means connected to said device for deriving an electrical output therefrom.
Claim 8
Dependent Claim
135 words
A process for forming a superconductor/semiconductor junction structure having optimized low-temperature current transport properties comprising the steps of: (a) providing a substrate of a chosen semiconductor material having an atomically clean surface; (b) depositing on said surface of said substrate a layer of a first chosen superconducting material to a first predetermined thickness, and forming a superconductor/substrate interface; (c) altering said superconductor/substrate interface to cause the formation of a layer of a second chosen superconducting material therein, whereby said layer of said second chosen superconducting material prevents interaction between said substrate and said first chosen superconducting material which would form an undesirable non-superconducting region at said superconductor/substrate interface that would interfere with said optimized current transport properties of said structure; and (d) providing contact means connected to said device for deriving an electrical output therefrom.
Claim 9
Dependent Claim
18 words
The process set forth in claim 5 wherein said altering comprises bombarding said superconductor/substrate interface with selected ions.
Claim 10
Dependent Claim
56 words
The process set forth in claim 6 wherein said selected ions are chosen from the group consisting of ions of an inert gas, ions of said semiconductor material, and ions of a chosen reactive material which is capable of undergoing an interfacial reaction with said first chosen superconducting material to form said second chosen superconducting material.
Claim 11
Dependent Claim
39 words
The process set forth in claim 6 wherein: (a) said substrate is formed of silicon; (b) said first chosen superconducting material is niobium; said selected ions are silicon ions; (d) said second chosen superconducting material is Nb 3 Si.
Claim 12
Dependent Claim
26 words
The process set forth in claim 5 wherein said altering comprises exposing said superconductor/substrate interface to a laser beam to produce transient heating of said interface.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-08-01 | 1987-01-31 | 1987-08-02 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-08-01 | 1991-01-31 | 1991-08-02 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-08-01 | 1995-01-31 | 1995-08-02 | $7700.00 | Window Closed / Lapsed |