← Back to Patent Explorer
US4384398A Expired / Lapsed US ⏱️ 0.0 years remaining

Elimination of silicon pyramids from epitaxial crystals of GaAs and GaAlAs

Assignee: Nokia Bell Labs
•
Filing: 1981-10-26
•
Granted: 1983-05-24
•
Expires: 2001-10-26
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract The occurrence of pyramidal protrusions on the surface of GaAs and GaAlAs p-n junction wafers produced by a multislice liquid phase epitaxy process is avoided by slow cooling to a specified quenching temperature or below. The pyramidal protrusions are constituted of the silicon which is the amphoteric dopant used in these semiconductors. Pyramids are not formed if the epitaxial reactor is cooled at a rate of 1° Celsius to 3° Celsius per minute to a temperature less than about 140° Celsius before the wafers are moved to the cool portion of the reactor and then further cooled to room temperature.

Inventors

  • 👤 Bulusu V. Dutt

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 03:57
CPC Classifications
H; H10; H10H; H10H20/00; H10H20/80; H10H20/81; H10H20/822; H10H20/824; C; C30; C30B; C30B19/00; C30B19/02; C30B19/04; C30B29/00; C30B29/10; C30B29/40; H10H20/01; H10H20/011; H10H20/013; H10P; H10P14/00; H10P14/20; H10P14/26; H10P14/263; H10P14/265; H10P14/29; H10P14/2901; H10P14/2907; H10P14/2911; H10P14/34; H10P14/3402; H10P14/3414; H10P14/3421; H10P14/3438; H10P14/3441; H10P14/3442; H10P14/3444; Y; Y10; Y10S; Y10S438/00; Y10S438/914; Y10S438/915

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 43 words
A method of fabricating silicon-doped layers of GaAlAs or GaAs by liquid phase epitaxial growth characterized by the step of cooling the grown crystal to a temperature below about 140° Celsius at a rate of from 1° Celsius to 3° Celsius per minute.
Claim 2
Independent Claim 43 words
A method of fabricating silicon-doped layers of GaAlAs or GaAs by liquid phase epitaxial growth characterized by the step of cooling the grown crystal to a temperature below about 140° Celsius at a rate of from 1° Celsius to 3° Celsius per minute.
Claim 3
Independent Claim 103 words
A method of fabricating a light emitting device comprising, subjecting a body of single crystal compound semiconductor material selected from the group consisting of GaAs and GaAlAs to an elevated temperature while in contact with a molten mixture of said compound semiconductor which contains silicon as a significant impurity, reducing the temperature of said body and molten mixture to form, successively, an n-type and a p-type epitaxial layer on said body, and cooling said body and molten mixture at a rate not in excess of 3° Celsius per minute to a temperature of 140° Celsius or less, and then further cooling said body.
Claim 4
Independent Claim 103 words
A method of fabricating a light emitting device comprising, subjecting a body of single crystal compound semiconductor material selected from the group consisting of GaAs and GaAlAs to an elevated temperature while in contact with a molten mixture of said compound semiconductor which contains silicon as a significant impurity, reducing the temperature of said body and molten mixture to form, successively, an n-type and a p-type epitaxial layer on said body, and cooling said body and molten mixture at a rate not in excess of 3° Celsius per minute to a temperature of 140° Celsius or less, and then further cooling said body.
Claim 5
Dependent Claim 16 words
The method in accordance with claim 2 in which said elevated temperature is about 920° Celsius.
Claim 6
Dependent Claim 32 words
The method in accordance with claim 3 in which the temperature is reduced in the range from about 920° Celsius to about 750° Celsius to form said epitaxial layers on said body.
Claim 7
Dependent Claim 34 words
The method in accordance with claim 4 in which said body and molten mixture are cooled from about 750° Celsius to 140° Celsius at a rate of from about 1° Celsius to 3° Celsius.

References Cited (Backward Citations)

US3578513A Cited
US3705825A Cited
US3676228A Cited
US3783825A Cited
US3854447A Cited
US4012242A Cited
US4088514A Cited
US4287848A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1986-05-23 1986-11-22 1987-05-24 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1990-05-23 1990-11-22 1991-05-24 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1994-05-23 1994-11-22 1995-05-24 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag