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US4370180A
Expired / Lapsed
US
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Method for manufacturing power switching devices
Assignee: Toshiba Corp
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Filing: 1980-12-04
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Granted: 1983-01-25
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Expires: 2000-12-04
Abstract
Abstract A method for manufacturing power switching devices such as thyristors and power transistors comprising the steps of forming impurity diffused layers of one conductivity type and of the opposite conductivity type in a semiconductor substrate of one conductivity type; forming a film containing phosphorus on the substrate; diffusing lifetime killer atoms into the substrate; and forming electrodes on the substrate.
Inventors
- 👤 Makoto Azuma
- 👤 Junko Akagi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 03:46
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/80; H10D62/83; H10D62/834; H10D18/00; H10D18/01; H10D18/60; H10P; H10P32/00; H10P32/10; H10P32/14; H10P32/1408; H10P32/141; H10P32/17; H10P32/171; H10P32/18; Y; Y10; Y10S; Y10S438/00; Y10S438/904
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
169 words
A method for manufacturing power thyristors, comprising the steps of: preparing an N-type semiconductor substrate; forming respective P-type layers on both sides of the semiconductor substrate, one of the layers constituting a P-type base layer, the other layer constituting an anode layer and the N-type substrate located therebetween constituting an N-type base layer; forming a first film containing N-type impurities on the P-type base layer and doping the N-type impurities into the surface region of the semiconductor substrate; removing the first film; heating the semiconductor substrate in order to drive the N-type impurities more deeply into the P-type base layer and making an N-type cathode layer; forming an oxide layer on the N-type cathode layer; forming respective second films containing phosphorus as gettering material on both the oxide layer and the P-type anode layer in order to increase the carrier lifetime of the P-type base layer; removing the second films; and diffusing carrier lifetime killer atoms into the N-type base layer in order to decrease the carrier lifetime thereof.
Claim 2
Independent Claim
169 words
A method for manufacturing power thyristors, comprising the steps of: preparing an N-type semiconductor substrate; forming respective P-type layers on both sides of the semiconductor substrate, one of the layers constituting a P-type base layer, the other layer constituting an anode layer and the N-type substrate located therebetween constituting an N-type base layer; forming a first film containing N-type impurities on the P-type base layer and doping the N-type impurities into the surface region of the semiconductor substrate; removing the first film; heating the semiconductor substrate in order to drive the N-type impurities more deeply into the P-type base layer and making an N-type cathode layer; forming an oxide layer on the N-type cathode layer; forming respective second films containing phosphorus as gettering material on both the oxide layer and the P-type anode layer in order to increase the carrier lifetime of the P-type base layer; removing the second films; and diffusing carrier lifetime killer atoms into the N-type base layer in order to decrease the carrier lifetime thereof.
Claim 3
Dependent Claim
19 words
The method for manufacturing power thyristors according to claim 1, wherein the carrier lifetime killer atoms are gold atoms.
Claim 4
Dependent Claim
19 words
The method for manufacturing power thyristors according to claim 1, wherein the N-type impurities are phosphorus, arsenic or antimony.
Claim 5
Dependent Claim
18 words
The method for manufacturing power thyristors according to claim 1, wherein the second films are phosphorsilicate glass films.
Claim 6
Dependent Claim
30 words
The method for manufacturing power thyristors according to claim 1, wherein the formation of the first film is carried out at a temperature ranging from 700° C. to 1100° C.
Claim 7
Independent Claim
159 words
A method for manufacturing power thyristors, comprising the steps of: preparing an N-type semiconductor substrate; forming respective P-type layers on both sides of the semiconductor substrate, one of the layers constituting a P-type base layer, the other layer constituting an anode layer and the N-type substrate located therebetween constituting an N-type base layer; forming a first film containing N-type impurities on the P-type base layer and doping the N-type impurities into the surface region of the semiconductor substrate; removing the first film; heating the semiconductor substrate in order to drive the N-type impurities more deeply into the P-type base layer and making an N-type cathode layer; forming respective second films containing phosphorus as gettering material on both the oxide layer and the P-type anode layer in order to increase the carrier lifetime of the P-type base layer; removing the second films; and introducing carrier lifetime killer into the N-type base layer in order to decrease the carrier lifetime thereof.
Claim 8
Independent Claim
159 words
A method for manufacturing power thyristors, comprising the steps of: preparing an N-type semiconductor substrate; forming respective P-type layers on both sides of the semiconductor substrate, one of the layers constituting a P-type base layer, the other layer constituting an anode layer and the N-type substrate located therebetween constituting an N-type base layer; forming a first film containing N-type impurities on the P-type base layer and doping the N-type impurities into the surface region of the semiconductor substrate; removing the first film; heating the semiconductor substrate in order to drive the N-type impurities more deeply into the P-type base layer and making an N-type cathode layer; forming respective second films containing phosphorus as gettering material on both the oxide layer and the P-type anode layer in order to increase the carrier lifetime of the P-type base layer; removing the second films; and introducing carrier lifetime killer into the N-type base layer in order to decrease the carrier lifetime thereof.
Claim 9
Dependent Claim
25 words
The method for manufacturing power thyristors according to claim 6, wherein the carrier lifetime killer is introduced by irradiating the semiconductor substrate by electron radiation.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-01-24 | 1986-07-26 | 1987-01-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-01-24 | 1990-07-26 | 1991-01-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-01-24 | 1994-07-26 | 1995-01-25 | $7700.00 | Window Closed / Lapsed |