Method for manufacturing metal-oxide silicon devices

Claim 2

A process for fabricating an MOS structure comprising the steps of: (a) forming mesa-like regions of predetermined width for the active regions of a circuit on the surface of a silicon substrate of a first conductivity type by growing thick field oxide regions which extend above and below the top surface of said mesa-like regions; (b) forming a thin oxide layer over the surface of said mesa-like regions; (c) etching said thin oxide layer so as to form openings in said thin oxide layer to expose said silicon substrate; (d) forming a thick polysilicon layer over the entire surface of the structure resulting from step (c); (e) depositing a layer of oxidation-retardant material on said polysilicon layer; (f) etching said oxidation-retardant material and said polysilicon layer to expose preselected areas of said silicon substrate where sources, drains and diffused single crystal silicon interconnections are desired, but leaving said oxidation-retardant material at all such locations where contact holes are desired to the gates, sources, drains, and diffused interconnections; (g) etching away any exposed portions of said thin oxide layer using the oxidation-retardant material protected polysilicon as a mask; (h) etching away said oxidation-retardant material in selective locations exclusive of said contact hole locations; (i) using said oxidation-retardant material as a mask, doping exposed portions of said polysilicon layer and said silicon substrate with impurities of a second conductivity type to form at least one single crystal diffused portion on said silicon substrate; and (j) growing a thick insulating oxide layer which extends above and below portions of the top surfaces of all polysilicon regions and top surfaces of said mesa-like regions where a contact hole is not desired, said thick insulating oxide layer forming a relatively flat top surface.

Claim 3

The process of claim 1, wherein the oxidation-retardant material of step (e) is platinum.

Claim 4

The process of claim 1, wherein the oxidation-retardant material of step (e) is silicon nitride, the process further comprising the steps of: (k) removing said oxidation-retardant material from the locations where a contact hole is desired; and (l) doping the polysilicon exposed by removal of said oxidation-retardant material with phosphorus.

Claim 5

The process of claims 2 or 3, wherein there is further provided the step of depositing metallic material on the portions of the substrate where a metal contact is desired.

Claim 6

The process of claim 1, wherein said polysilicon layer is etched to produce regions of polysilicon of a width equal to or greater than the width of said mesa-like regions where gates are desired, and wherein said polysilicon layer is etched to produce other regions of polysilicon of widths which are less than the width of said mesa-like regions where such other polysilicon regions are desired to engage in electrical contact with preselected ones of the sources and drains.

Claim 7

The process of claim 1 wherein said openings in step (c) define all contact holes to preselected ones of said single crystal diffused portions of said silicon substrate.

Claim 8

The process of claim 1 wherein step (j) comprises thermally oxidizing the wafer structure produced in step (i), said thick insulating oxide layer having a thickness ranging from approximately 5000 A to 12,000 A.

Claim 9

The process of claim 1 wherein said polysilicon layer is doped with impurities of a second conductivity type prior to performing step (e), said polysilicon having a thickness ranging from approximately 5000 A to 12,000 A.

Claim 10

A process for fabricating an MOS structure comprising the steps of: (a) forming mesa-like regions of predetermined width for the active regions of a circuit on the surface of a silicon substrate of a first conductivity type by growing thick field oxide regions which extend above and below the top surface of said mesa-like regions; (b) forming a thin oxide layer over the surface of said mesa-like regions; (c) etching said thin oxide layer to define a plurality of contact holes for direct metal to single crystal diffused silicon contact, and for polysilicon to single crystal diffused silicon contact; (d) forming a thick polysilicon layer over the entire surface of the structure resulting from step (c), said thick polysilicon layer being doped with impurities of a second conductivity type; (e) depositing an oxidation-retardant material on said polysilicon layer; (f) etching said oxidation-retardant material and underlying polysilicon layer to expose preselected areas of said silicon substrate where sources, drains, and diffused single crystal silicon interconnections are desired, but leaving said oxidation-retardant material at all such locations where contact holes are desired to the gates, sources, drains, and diffused interconnections, said etched polysilicon layer having regions of width equal to or greater than the width of said mesa-like regions where a gate electrode is desired and other regions of width which is less than the width of said mesa-like regions where said polysilicon makes electrical contact to preselected ones of the sources and drains; (g) etching away any exposed portions of said thin oxide layer using the oxidation-retardant material protected-polysilicon as a mask; (h) selectively etching away said oxidation-retardant material from all locations exclusive of contact hole locations for a selectable combination of direct metal to polysilicon contact, a direct metal to single crystal diffused silicon contact, and a polysilicon to single crystal diffused silicon contact; (i) using said oxidation-retardant material as a mask, doping exposed portions of said polysilicon layer and said silicon substrate with impurities of a second conductivity type; and (j) growing a thick insulating oxide layer which extends above and below portions of the top surface of the structure formed in step (i) except in the contact hole locations which are protected by said oxidation-retardant material, said thick insulating oxide forming a relatively flat top surface.

Claim 11

A process for fabricating an MOS structure comprising the steps of: (a) forming mesa-like regions of predetermined width for the active regions of a circuit on the surface of a silicon substrate of a first conductivity type by growing thick field oxide regions which extend above and below the top surface of said mesa-like regions; (b) forming a thin oxide layer over the surface of said mesa-like regions; (c) etching said thin oxide layer to define a plurality of contact holes for direct metal to single crystal diffused silicon contact, and for polysilicon to single crystal diffused silicon contact; (d) forming a thick polysilicon layer over the entire surface of the structure resulting from step (c), said thick polysilicon layer being doped with impurities of a second conductivity type; (e) depositing an oxidation-retardant material on said polysilicon layer; (f) etching said oxidation-retardant material and underlying polysilicon layer to expose preselected areas of said silicon substrate where sources, drains, and diffused single crystal silicon interconnections are desired, but leaving said oxidation-retardant material at all such locations where contact holes are desired to the gates, sources, drains, and diffused interconnections, said etched polysilicon layer having regions of width equal to or greater than the width of said mesa-like regions where a gate electrode is desired and other regions of width which is less than the width of said mesa-like regions where said polysilicon makes electrical contact to preselected ones of the sources and drains; (g) etching away any exposed portions of said thin oxide layer using the oxidation-retardant material protected-polysilicon as a mask; (h) selectively etching away said oxidation-retardant material from all locations exclusive of contact hole locations for a selectable combination of direct metal to polysilicon contact, a direct metal to single crystal diffused silicon contact, and a polysilicon to single crystal diffused silicon contact; (i) using said oxidation-retardant material as a mask, doping exposed portions of said polysilicon layer and said silicon substrate with impurities of a second conductivity type; and (j) growing a thick insulating oxide layer which extends above and below portions of the top surface of the structure formed in step (i) except in the contact hole locations which are protected by said oxidation-retardant material, said thick insulating oxide forming a relatively flat top surface.

Claim 12

The process of claim 9 wherein said thick insulating oxide layer is thermally grown and has a thickness ranging from approximately 5,000 A to 12,000 A.

Claim 13

The process of claim 9 further comprising the steps of: (k) removing said oxidation-retardant material from said contact hole locations; and (l) depositing metallic material at said contact hole locations.