← Back to Patent Explorer
US4246296A Expired / Lapsed US ⏱️ 0.0 years remaining

Controlling the properties of native films using selective growth chemistry

Assignee: AT&T Inc
•
Filing: 1979-02-14
•
Granted: 1981-01-20
•
Expires: 1999-02-14
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract An improved technique for growing native films on compound semiconductors is disclosed. In this technique, additional preferential chemistry is used in conjunction with prior art growth processes to eliminate what would otherwise be unreacted constituents in the native film. Films grown using this technique display improved electrical properties.

Inventors

  • 👤 Robert P. H. Chang

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 00:51
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/63; H10P14/6302; H10P14/6304; H10P14/6306; H10P14/6312; H10P14/6319; H10P14/6322; H10P95/00; H10P95/90; H10P95/904

Claims Analysis

Total Claims: 20
Claim 1
Independent Claim 98 words
A method of growing a native film on a compound semiconductor comprising exposing a compound semiconductor to at least one first reactant which reacts preferentially with at least one of the compound semiconductor constituents to grow a native film, the invention CHARACTERIZED IN THAT the compound semiconductor is additionally exposed to at least one second reactant, which reacts preferentially with at least one compound semiconductor constituent which does not react preferentially with the first reactant, and in that the reactants are introduced into a plasma which comprises a reaction causing environment, thereby yielding a film with improved stoichiometry.
Claim 2
Independent Claim 98 words
A method of growing a native film on a compound semiconductor comprising exposing a compound semiconductor to at least one first reactant which reacts preferentially with at least one of the compound semiconductor constituents to grow a native film, the invention CHARACTERIZED IN THAT the compound semiconductor is additionally exposed to at least one second reactant, which reacts preferentially with at least one compound semiconductor constituent which does not react preferentially with the first reactant, and in that the reactants are introduced into a plasma which comprises a reaction causing environment, thereby yielding a film with improved stoichiometry.
Claim 3
Dependent Claim 21 words
The method of claim 1 wherein the first reactant comprises oxygen and the native film thereby grown is an oxide film.
Claim 4
Dependent Claim 11 words
The method of claim 2 wherein the plasma is magnetically confined.
Claim 5
Dependent Claim 12 words
The method of claim 3 wherein the plasma comprises an oxygen plasma.
Claim 6
Dependent Claim 12 words
The method of claim 4 wherein the compound semiconductor is gallium arsenide.
Claim 7
Dependent Claim 11 words
The method of claim 5 wherein the second reactant comprises fluorine.
Claim 8
Dependent Claim 18 words
The method of claim 6 wherein the second reactant comprises CF 4 gas added to the oxygen plasma.
Claim 9
Dependent Claim 17 words
The method of claim 7 wherein the CF 4 /O 2 ratio is between 0.1 and 3.
Claim 10
Dependent Claim 24 words
The method of claim 12 wherein subsequent to the native film growth, the film is thermally annealed in an environment comprising hydrogen and nitrogen.
Claim 11
Dependent Claim 26 words
The method of claim 3 wherein the second reactant reacts with at least one of the compound semiconductor constituents and becomes incorporated into the resulting film.
Claim 12
Dependent Claim 29 words
The method of claim 3 wherein the second reactant preferentially reacts with at least one of the compound semiconductor constituents forming a volatile constituent which subsequently leaves the substrate.
Claim 13
Independent Claim 120 words
A method of growing a native film comprising forming an oxygen plasma at a background pressure of less than 9×10 -3 torr using a pair of RF electrodes; driving the electrodes in approximate balance at the same dc potential, at a power of between 1 and 500 watts and at a frequency of between 20 and 30 mHz; confining the plasma using an external magnetic field of between 1 and 500 gauss; directing magnetically the plasma to a semiconductor substrate; orienting the semiconductor substrate approximately normal to the magnetic field lines; biasing the semiconductor substrate positive with respect to the plasma; the invention characterized in that fluorine is added to the oxygen plasma, whereby a native oxide film is grown.
Claim 14
Independent Claim 120 words
A method of growing a native film comprising forming an oxygen plasma at a background pressure of less than 9×10 -3 torr using a pair of RF electrodes; driving the electrodes in approximate balance at the same dc potential, at a power of between 1 and 500 watts and at a frequency of between 20 and 30 mHz; confining the plasma using an external magnetic field of between 1 and 500 gauss; directing magnetically the plasma to a semiconductor substrate; orienting the semiconductor substrate approximately normal to the magnetic field lines; biasing the semiconductor substrate positive with respect to the plasma; the invention characterized in that fluorine is added to the oxygen plasma, whereby a native oxide film is grown.
Claim 15
Dependent Claim 11 words
The method of claim 12 wherein the semiconductor is gallium arsenide.
Claim 16
Dependent Claim 29 words
The method of claim 13 wherein the fluorine is added in the form of CF 4 gas and the CF 4 /O 2 ratio is between 0.1 and 3.
Claim 17
Independent Claim 83 words
A method of growing a native oxide layer comprising placing a semiconductor substrate in an oxygen environment comprising oxygen at a pressure of less than 9×10 -3 torr; directing a beam comprising electrons of density of between 10 8 electrons/cc and 10 12 electrons/cc toward the substrate; and biasing the substrate between 0.2 and 500 voltspositive with respect to the source of the electrons, the invention characterized in that fluorine is added to the oxygen environment, whereby a native oxide layer is grown.
Claim 18
Independent Claim 83 words
A method of growing a native oxide layer comprising placing a semiconductor substrate in an oxygen environment comprising oxygen at a pressure of less than 9×10 -3 torr; directing a beam comprising electrons of density of between 10 8 electrons/cc and 10 12 electrons/cc toward the substrate; and biasing the substrate between 0.2 and 500 voltspositive with respect to the source of the electrons, the invention characterized in that fluorine is added to the oxygen environment, whereby a native oxide layer is grown.
Claim 19
Dependent Claim 11 words
The method of claim 15 wherein the semiconductor is gallium arsenide.
Claim 20
Dependent Claim 29 words
The method of claim 16 wherein the fluorine is added in the form of CF 4 gas and the CF 4 /O 2 ratio is between 0.1 and 3.

References Cited (Backward Citations)

US3297500A Cited
US3287243A Cited
US3692571A Cited
US3914465A Cited
US3907616A Cited
US3890169A Cited
US4062747A Cited
US4170666A Cited
US4172906A Cited
US4144634A Cited
US4183780A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1984-01-20 1984-07-21 1985-01-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1988-01-20 1988-07-21 1989-01-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1992-01-20 1992-07-21 1993-01-20 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag