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US4151543A Expired / Lapsed US ⏱️ 0.0 years remaining

Lead electrode structure for a semiconductor chip carried on a flexible carrier

Assignee: Sharp Corp
•
Filing: 1977-04-12
•
Granted: 1979-04-24
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Expires: 1997-04-12
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Abstract

Abstract A semiconductor device comprises an insulating substrate such as a film carrier having wiring patterns formed thereon, lead electrodes connected to the wiring patterns, and a semiconductor chip bonded to the lead electrodes. The surface of the lead electrodes, to which the semiconductor chip is bonded, is smooth as compared with that of the wiring patterns, thereby ensuring accurate operation of the semiconductor device.

Inventors

  • 👤 Masao Hayakawa
  • 👤 Takamichi Maeda
  • 👤 Masao Kumura

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 12:16
CPC Classifications
H; H10; H10W; H10W70/00; H10W70/60; H10W70/67; H10W70/69; H10W70/695; H10W70/68; H10W70/682; H10W70/685; H10W72/00; H10W72/071; H10W72/072; H10W72/07231; H10W72/07236; H10W72/07251; H10W72/20; H10W72/251; H10W72/252; H10W74/00; H10W74/10; H10W74/111; H10W74/127

Claims Analysis

Total Claims: 10
Claim 1
Independent Claim 73 words
A semiconductor device comprising: an insulating substrate; an aperture formed in the insulating substrate; wiring patterns formed on the insulating substrate; finger lead electrodes extending toward said aperture and electrically connected to said wiring patterns, the surfaces of the finger lead electrodes being smooth as compared to the surfaces of said wiring patterns; and a semiconductor chip secured within said aperture and electrically connected to said smooth surfaces of said finger lead electrodes.
Claim 2
Dependent Claim 73 words
A semiconductor device comprising: an insulating substrate; an aperture formed in the insulating substrate; wiring patterns formed on the insulating substrate; finger lead electrodes extending toward said aperture and electrically connected to said wiring patterns, the surfaces of the finger lead electrodes being smooth as compared to the surfaces of said wiring patterns; and a semiconductor chip secured within said aperture and electrically connected to said smooth surfaces of said finger lead electrodes.
Claim 3
Dependent Claim 88 words
In a semiconductor device including an insulating substrate, a metal film having a roughened surface attached to said insulating substrate, said metal film being shaped to include portions defining wiring patterns formed on the insulating substrate with roughened surfaces of said wiring patterns contiguous thereto and portions defining lead electrodes, and a semiconductor chip bonded to selected surfaces of said lead electrodes, the improvement comprising: said selected surfaces of said lead electrodes being smooth as compared to the roughened surfaces of said wiring patterns contiguous with said substrate.
Claim 4
Dependent Claim 88 words
In a semiconductor device including an insulating substrate, a metal film having a roughened surface attached to said insulating substrate, said metal film being shaped to include portions defining wiring patterns formed on the insulating substrate with roughened surfaces of said wiring patterns contiguous thereto and portions defining lead electrodes, and a semiconductor chip bonded to selected surfaces of said lead electrodes, the improvement comprising: said selected surfaces of said lead electrodes being smooth as compared to the roughened surfaces of said wiring patterns contiguous with said substrate.
Claim 5
Dependent Claim 21 words
The semiconductor device of claim 1, wherein the wiring patterns and the finger lead electrodes are made of a copper film.
Claim 6
Dependent Claim 39 words
The semiconductor device of claim 3, wherein one surface of the wiring patterns confronting the insulating substrate has a roughness of three to fifteen microns (3-15μm) amplitude, and the wiring patterns are attached to the insulating substrate via adhesive.
Claim 7
Dependent Claim 19 words
The semiconductor device of claim 3, wherein said copper film is formed through the use of a plating method.
Claim 8
Dependent Claim 28 words
The semiconductor device of claim 1, wherein the semiconductor chip comprises bumps which are connected to the smoothed surface of the finger lead electrodes via an eutectic alloy.
Claim 9
Dependent Claim 44 words
The semiconductor device of claim 6, wherein the smoothed surface of the finger lead electrodes are coated with tin and the bumps are essentially made of gold, and wherein the bumps are connected to the finger lead electrodes via an eutectic alloy of Au-Sn.
Claim 10
Dependent Claim 16 words
The semiconductor device of claim 1, wherein the insulating substrate is made of a polyimide film.

References Cited (Backward Citations)

US3480836A Cited
US3780352A Cited
US3724068A Cited
US3832769A Cited
US3793714A Cited
US4045863A Cited
US3781596A Cited
US4024570A Cited
US3968563A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1982-04-23 1982-10-23 1983-04-24 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1986-04-23 1986-10-23 1987-04-24 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1990-04-23 1990-10-23 1991-04-24 $7700.00 Window Closed / Lapsed

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