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US4058445A
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Method of producing a tantalum thin film capacitor
Assignee: Siemens AG
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Filing: 1976-03-26
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Granted: 1977-11-15
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Expires: 1996-03-26
Abstract
Abstract A method of producing thin film tantalum capacitors having a tantalum thin film electrode mounted on a nonconducting support member is described. The tantalum electrode is doped with nitrogen to produce a nitrogen content in a range from the nitrogen content of β tantalum to that for tantalum nitride. A tantalum pentoxide film with dielectric properties is grown on the tantlum electrode by oxidation. At least, the tantalum electrode and the dielectric are subjected to tempering. The dielectric is then covered with another electrode.
Inventors
- 👤 Wilfried Anders
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 06:46
CPC Classifications
H; H01; H01G; H01G4/00; H01G4/002; H01G4/018; H01G4/06; H10; H10D; H10D84/00; H10D84/01; Y; Y10; Y10T; Y10T29/00; Y10T29/43; Y10T29/435
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
94 words
A method for producing heat-stable, dip-solderable thin film tantalum capacitors comprising the steps of: mounting a thin film alpha tantalum electrode on a non-conducting supporting member, the tantalum being doped with nitrogen so as to have a minimum nitrogen content greater than the nitrogen content of beta tantalum and a maximum nitrogen content less than that of tantalum nitride, forming a tantalum pentoxide film having dielectric properties on said tantalum electrode, tempering at least the tantalum electrode and the dielectric film and covering said dielectric film with another electrode of a film conducting material.
Claim 2
Independent Claim
94 words
A method for producing heat-stable, dip-solderable thin film tantalum capacitors comprising the steps of: mounting a thin film alpha tantalum electrode on a non-conducting supporting member, the tantalum being doped with nitrogen so as to have a minimum nitrogen content greater than the nitrogen content of beta tantalum and a maximum nitrogen content less than that of tantalum nitride, forming a tantalum pentoxide film having dielectric properties on said tantalum electrode, tempering at least the tantalum electrode and the dielectric film and covering said dielectric film with another electrode of a film conducting material.
Claim 3
Dependent Claim
24 words
The method defined in claim 1 wherein said other electrode is of a material selected from a group consisting of nickel, chromium and iron.
Claim 4
Dependent Claim
19 words
The method defined in claim 1 wherein said tempering step is performed subsequent to said forming and covering steps.
Claim 5
Dependent Claim
26 words
The method defined in claim 1 wherein said tempering step is performed for a 2 hour period in atmospheric air at a temperature of 250° C.
References Cited (Backward Citations)
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-11-14 | 1981-05-16 | 1981-11-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-11-14 | 1985-05-16 | 1985-11-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-11-14 | 1989-05-16 | 1989-11-15 | $7700.00 | Window Closed / Lapsed |